Jung Pill Kim - Cary NC, US Jonghee Han - Cary NC, US Stephen Camacho - Durham NC, US
Assignee:
Infineon Technologies AG - Munich
International Classification:
G11C 700
US Classification:
36518905, 365195
Abstract:
Methods and circuits for reducing unnecessary changes to outputs of latch circuits are provided. Unnecessary changes to outputs of latch circuits may be reduced by preventing the outputs of the latch circuits from changing when an invalid command is detected. For some embodiments, an invalid command detector is provided that generates an invalid command signal used to inhibit latch circuits, in response to detecting an invalid command.
Method And Circuit Configuration For Multiple Charge Recycling During Refresh Operations In A Dram Device
Jonghee Han - Cary NC, US Jung Pill Kim - Cary NC, US
Assignee:
Infineon Technologies AG - Munich
International Classification:
G11C 700
US Classification:
365203, 365222, 365205
Abstract:
Methods and circuit configurations for multiple recycling of charge during a refresh operation in a memory device, such as a dynamic random access memory (DRAM) device, are provided. Charge from one or more power lines of a first array of bit line sense amplifiers involved in a first refresh operation may be transferred to one or more power lines of at least second and third arrays of bit line sense amplifiers involved in subsequent refresh operations.
Sensing operations involving a first array of bit line sense amplifiers (BLSAs) may be powered by an upper reference voltage and a first intermediate voltage and the first array may be precharged to a voltage level therebetween. Sensing operations involving a second array of BLSAs may be powered by a second intermediate voltage (greater than the first intermediate voltage) and a lower reference voltage and the second array may be precharged to a voltage level therebetween. After precharge, charge may be transferred from a second power line of the first array to a first power line of the second array. Subsequently, the second power line of the first array may be coupled to a power supply node at the first intermediate voltage level and the first power line of the second array may be coupled to a power supply node at the second intermediate voltage level.
Embodiments of the present invention are illustrated in a random access memory. In one embodiment, a random access memory comprises an array of memory cells, a write circuit, and an input buffer configured to receive data and pass the received data to the write circuit that writes the received data into the array of memory cells. The input buffer comprises a differential amplifier configured to receive the data and in response to the received data supply a first signal and a second signal that is the compliment of the first signal. The input buffer also comprises a first transistor configured to be controlled by the first signal and a second transistor configured to be controlled by the second signal. The first transistor and the second transistor are turned on to provide a current path through the first transistor and the second transistor to change the first signal in response to a transition in the received data.
Method And Circuit Configuration For Digitizing A Signal In An Input Buffer Of A Dram Device
A method and circuit configuration for digitizing data and control signals using an input buffer in a dynamic random access memory (DRAM) device. In one embodiment, the input buffer includes buffer modules having a differential amplifier with a first input responsive to an input signal and a second input responsive to a reference voltage, a common source stage, and an output stage and a source of a bias voltage controlling impedance of the common source stage, wherein the reference voltage defines the amplitude of the bias voltage.
Random Access Memory With Post-Amble Data Strobe Signal Noise Rejection
Jonghee Han - Cary NC, US Alexander George - Durham NC, US Torsten Partsch - Raleigh NC, US
Assignee:
Infineon Technologies North America Corp. - San Jose CA
International Classification:
G11C 7/00
US Classification:
365193, 365233, 3652335, 36518905
Abstract:
A random access memory includes a first circuit configured to receive a strobe signal and provide pulses in response to transitions in the strobe signal, and a second circuit configured to receive the strobe signal to latch data into the second circuit in response to the strobe signal, and to receive the pulses to re-latch the latched data into the second circuit after the transitions in the strobe signal. The first circuit includes an enable circuit configured to provide an enable signal and a buffer circuit configured to receive the strobe signal and the enable signal and provide the pulses in response to the enable signal and the strobe signal. The enable circuit is configured to receive the pulses from the buffer circuit and stop providing the enable signal to the buffer circuit in response to receiving the pulses.
Input Buffer Circuit Including Reference Voltage Monitoring Circuit
Jung Pill Kim - Cary NC, US Jonghee Han - Cary NC, US
Assignee:
Infineon Technologies, AG - Munich
International Classification:
H03K 5/153 H03K 5/22
US Classification:
327 77, 327 89
Abstract:
A buffer circuit includes a differential amplifier, a buffering inverter, and a reference voltage monitoring circuit. The differential amplifier has a reference voltage and a current source as inputs. The buffering inverter has an output of the differential amplifier as an input. The reference voltage monitoring circuit includes two transistors and a second current source. An output of the reference voltage monitoring circuit is connected to the buffering inverter so as to minimize an effect of a variation in the value of the reference voltage on signal propagation delay times. The buffer circuit can further include a driver circuit with a comparator. A method of managing signal propagation delays includes providing a differential amplifier, providing at least one buffering inverter, and providing a reference voltage monitoring circuit. The reference voltage monitoring circuit can maintain signal propagation delays as a reference voltage varies.
Memory With Data Latching Circuit Including A Selector
A circuit for latching data into a memory includes a receiver, a delay, and a selector. The receiver is configured for receiving a data signal, and the delay is configured to delay the data signal to provide a delayed data signal. The selector is configured to receive the delayed data signal, a data strobe signal, and an inverted data strobe signal and provide a first strobe signal and a second strobe signal in response to the delayed data signal, the data strobe signal, and the inverted data strobe signal. Rising edge data is latched into the memory in response to the first strobe signal and falling edge data is latched into the memory in response to the second strobe signal.
8K TVs were launched in South Korea during November last year, and since then, over half of large-sized TVs sold have been 8K models, according to President of Samsung's Visual Display unit Jonghee Han.
Date: Feb 11, 2019
Category: Headlines
Source: Google
Samsung Unveils Future of Displays with Groundbreaking Modular Micro LED Technology at CES
For decades, Samsung has led the way in next-generation display innovation, said Jonghee Han, President of Visual Display Business at Samsung Electronics. Our Micro LED technology is at the forefront of the next screen revolution with intelligent, customizable displays that excel in every perform
Date: Jan 06, 2019
Category: Headlines
Source: Google
How Samsung fell behind Sony and LG in the premium TV market
production and sales, Samsung said that it will lead the premium market by focusing on QLED and micro-LED technology, which uses miniature light emitting diodes to improve picture quality. "There's no change (in our strategy)," Jonghee Han, President of Samsung's TV business told reporters last month.