Jorge Eduardo Franke - Orefield PA, US John Sargent French - Palm PA, US Sheldon Louis Sun - Allentown PA, US William Joseph Thompson - Kempton PA, US
International Classification:
G01N 21/00
US Classification:
356 731
Abstract:
An error analysis tester for an optical component includes an optical transmitter, an optical attenuator, a port, a receiver, a processor and a graphical display. The optical transmitter and optical attenuator produce a test signal at a plurality of selected optical power levels. The port is configured to output the test signal to the optical component and to receive a version of the test signal from the optical component. The receiver determines errors in the received version of the test signal. The processor determines data points of a function associated with an error rate at each of the selected power levels and a line corresponding to the data points. The graphical display produces a visual plot of the data points and the corresponding line.
Unitary Testing Apparatus For Performing Bit Error Rate Measurements On Optical Components
Jorge Eduardo Franke - Orefield PA, US John Sargent French - Palm PA, US Sheldon Louis Sun - Breinigsville PA, US William Joseph Thompson - Kempton PA, US
Assignee:
Circadiant Systems, Inc. - Allentown PA
International Classification:
G06F 11/00 G01N 21/00
US Classification:
714704, 356 731
Abstract:
A testing apparatus for testing optical components includes an optical transmitter, an optical attenuator, an optical power meter and an optical receiver which are substantially rigidly coupled in a fixed relation to each other within a single housing. The system permits the common control of all the optical components such that calibration, testing and troubleshooting may be performed using a common user interface. The testing apparatus is unitary, compact and portable, and is a much more robust testing apparatus than conventional schemes.
Method Of Determining Jitter And Apparatus For Determining Jitter
Ernest Eisenhardt Bergmann - Borough of Fountain Hill PA, US Jorge Eduardo Franke - Orefield PA, US John Sargent French - Palm PA, US William Joseph Thompson - Kempton PA, US
Assignee:
Circadiant Systems, Inc. - Allentown PA
International Classification:
H04B 17/00 H04L 7/00
US Classification:
375224
Abstract:
In accordance with illustrative embodiments, methods and apparati, which determine jitter are described. In one example embodiment, a method includes receiving a signal, wherein the signal comprises a first data pattern which was generated at a first bit rate. The method also includes sampling the signal at a second bit rate to generate a second data pattern. The period of the second bit rate is different from the period of the first bit rate. The method also includes comparing the first data pattern and the second data pattern to determine differences between the first data pattern and the second data pattern. Furthermore, the method includes determining jitter in the signal according to the differences between the first data pattern and the data second data pattern. In other embodiments, by using two different bit rates to determine jitter, jitter can be determined in communication systems in a convenient and cost effective manner.
Jorge Franke - Orefield PA, US John French - Palm PA, US Sheldon Sun - Allentown PA, US William Thompson - Kempton PA, US
International Classification:
G01N021/00
US Classification:
356/073100
Abstract:
A device and method that performs error analysis of an optical component. An optical transmitter transmits a test signal at a plurality of selected optical power levels. A port outputs the test signal to the optical component, and then receives a version of the test signal from the optical component. A receiver determines errors in the received version of the test signal. A processor determines an error rate at each of the selected optical power levels based on the determined errors, and also determines an uncertainty range for each determined error rate. An interface provides indication of the determined error rates in relation to the determined uncertainty ranges.
Method And Apparatus For Jitter Creation And Testing
John French - Palm PA, US Jorge Franke - Orefield PA, US William Thompson - Kempton PA, US
International Classification:
H04Q001/20
US Classification:
375/226000
Abstract:
A testing apparatus and method useful in measuring the performance of a receiver when receiving a relatively high frequency jittered signal. A relatively high frequency oscillator is locked to a relatively low frequency reference with intentional jitter induced by adding jitter to the relatively low frequency reference. A divide by N circuit and a phase/frequency detector are used to detect discrepancies between the relatively low frequency reference output of the oscillator and to generate a signal used to keep the oscillator locked to the relatively low frequency reference. The addition of the jitter to the relatively low frequency reference may be controlled through digital or analog means.