Joseph J Baker

US Patent:

53550790, Oct 11, 1994

Filed:

Jan 7, 1993

Appl. No.:

8/001759

Inventors:

Arthur Evans - Brookfield Center CT
Joseph R. Baker - New Milford CT
Jack Lander - Danbury CT

Assignee:

Wentworth Laboratories, Inc. - Brookfield CT

International Classification:

G01R 106

US Classification:

324754

Abstract:

A probe assembly adapted to test an integrated circuit (IC) device whose contact pads are deployed in a predetermined pattern in a common plane. The assembly includes a film membrane having a planar dielectric contactor zone and an array of suspension wings radiating from this zone. The wings are clamped at their ends by a mounting ring surrounding a port in a printed circuit board which exposes the contactor zone suspended below the board to the IC device to be tested, the ring being secured to the board. Deployed in a matching pattern on the exposed face of the contactor zone and cantilevered therefrom to assume an angle with respect thereto are spring contact fingers that are extensions of traces running along the wings of the membrane to leads on the printed circuit board. These leads extend to respective test terminals on the board which are connectable to electronic instrumentation for conducting tests on the IC device. When the IC device is raised to bring its contact pads into engagement with the spring fingers, this action causes the fingers to flex inwardly, and in doing so to scrub the contact pads and thereby ensure effective electrical contact therewith.

US Patent:

45012970, Feb 26, 1985

Filed:

Apr 8, 1982

Appl. No.:

6/366728

Inventors:

Joseph Baker - Somerville NJ

Assignee:

Automatic Switch Company - Florham Park NJ

International Classification:

F16K 1102
F16K 3102
F16K 3700

US Classification:

13762546

Abstract:

A rotary valve includes a rotor having at least one internal flow passageway therein extending between ports for providing communication between various pairs of flow passageways in the body of the valve. The rotor includes an annular surface for sealing engagement with the body, at least one of the rotor ports being disposed on the annular surface. A continuous resilient seal is disposed between the sealing surfaces of the rotor and the body to provide static and dynamic sealing. A spherical surface disposed between the rotary drive and the rotor applies axial pressure to the rotor, the surface accommodating rocking of the rotor to insure uniform loading thereof. Further, loading of the seal between the rotor and body is adjustable externally of the valve.

US Patent:

49756389, Dec 4, 1990

Filed:

Dec 18, 1989

Appl. No.:

7/452050

Inventors:

Arthur Evans - Brookfield Center CT
Joseph R. Baker - New Milford CT
Robert P. Rising - Trumbull CT

Assignee:

Wentworth Laboratories - Brookfield CT

International Classification:

G01R 106
G01R 3102

US Classification:

324158P

Abstract:

A test probe assembly for testing an integrated circuit (IC) device having contact pads deployed in a predetermined pattern in a common plane. The assembly includes a contactor formed by a flexible film of dielectric material having a rectangular planar central zone from whose corners extend radial slots to define suspension quadrants. Probe contacts formed on the undersurface of the central zone in a matching pattern are connected to probe terminals on the margins of the quadrants. The quadrants are marginally supported on corresponding branches of a mounting frame whereby the central zone sags below the frame which surrounds a central port in a printed circuit board, the port exposing the central zone to the IC device to be tested.