Joseph A Peters

US Patent:

20190064216, Feb 28, 2019

Filed:

Aug 25, 2017

Appl. No.:

15/687351

Inventors:

- Solon OH, US
Alexander N. Pronin - Twinsburg OH, US
Joseph A. Peters - Cuyahoga Falls OH, US

Assignee:

Keithley Instruments, LLC - Solon OH

International Classification:

G01R 1/067
B05C 5/02
G01R 31/28

Abstract:

A system for testing an integrated-circuit wafer includes a probe card and a dispenser assembly. The probe card includes a circuit board and a probe needle coupled to the circuit board. The dispenser assembly is coupled to the probe card and is configured to deliver a metered amount of dielectric fluid to the tip of the probe needle. Methods are also disclosed.

US Patent:

20190033343, Jan 31, 2019

Filed:

Aug 18, 2017

Appl. No.:

15/681308

Inventors:

- Solon OH, US
Alexander N. Pronin - Twinsburg OH, US
Joseph A. Peters - Cuyahoga Falls OH, US

Assignee:

Keithley Instruments, LLC - Solon OH

International Classification:

G01R 1/067
G01R 1/073
G01R 31/26

Abstract:

A system for testing an integrated-circuit wafer, the system including a probe card having a probe needle and a probe body enclosing a pressure chamber. The probe body includes a unitary sidewall, a first end cap substantially closing a first end of the probe body, except for an outlet passage in the first end cap, and an inlet passage configured to introduce compressed gas into the pressure chamber. The probe needle is within the pressure chamber and is supported by the probe body. A free end of the probe needle extends through the outlet passage. The ends of the probe needle are separated by a first bend in the probe needle, which has a center of curvature that is located between the probe needle and a longitudinal centerline of the unitary sidewall. Methods of using a probe card are also disclosed.

Address:

225 Parkview St NE, Massillon, OH 44646

Phone:

(330)8325187

VIN:

2G1WB58K379259422

Make:

CHEVROLET

Model:

IMPALA

Year:

2007