Julie Sheridan Eng

US Patent:

7354203, Apr 8, 2008

Filed:

Jul 11, 2005

Appl. No.:

11/178624

Inventors:

Stefan Pfnuer - Los Gatos CA, US
Tengda Du - Fremont CA, US
Kevin Zhang - San Jose CA, US
Julie S. Eng - Los Altos CA, US
Axel Mehnert - Sunnyvale CA, US

Assignee:

Finisar Corporation - Sunnyvale CA

International Classification:

G02B 6/36

US Classification:

385 92

Abstract:

A package for maintaining alignment of components includes a frame and a beam with the beam attached to the frame and one end of the beam. One or more components are mounted to the beam. The frame and a portion of the beam are separated from each other by a channel which allows portions of the beam to flex substantially independently of the frame when a force is applied to the frame. Thus, the effects resulting from forces applied to the frame are not experienced by the beam, or are at least attenuated, so that the alignment of the components mounted on the beam is substantially preserved.

US Patent:

7970283, Jun 28, 2011

Filed:

Mar 7, 2005

Appl. No.:

11/074609

Inventors:

Giorgio Giaretta - Mountain View CA, US
Julie Sheridan Eng - Los Altos CA, US
Thomas Gordon Beck Mason - San Jose CA, US

Assignee:

Finisar Corporation - Sunnyvale CA

International Classification:

H04B 10/00

US Classification:

398135, 398138, 398140, 398164

Abstract:

This disclosure concerns optoelectronic transceivers. In one example, a transceiver is implemented as an uncompensated architecture that is substantially compliant with the SFP MSA and is capable of effective operation at a data rate of about 8. 5 Gb/s. The transceiver includes a TOSA, ROSA, a printed circuit board, an LDPA disposed on the printed circuit board and configured for communication with the TOSA and the ROSA. Finally, the transceiver includes SFP compliant optical and electrical connections.

US Patent:

62486047, Jun 19, 2001

Filed:

Sep 14, 1999

Appl. No.:

9/395934

Inventors:

Julie S. Eng - Fogelsville PA
Joseph Michael Freund - Fogelsville PA
George John Przybylek - Douglasville PA
Dennis Mark Romero - Bethlehem PA
Arthur Mike Sergent - New Providence NJ

Assignee:

Lucent Technologies, Inc. - Murray Hill NJ

International Classification:

G02R 3126

US Classification:

438 21

Abstract:

A method for testing semiconductor laser devices is described. The method includes testing a monolithically integrated semiconductor laser device via electrical contact testing and/or far field testing. These tests will provide the total performance of the entire device. Further, the method includes accurate cleaving off of a portion of the laser device and re-testing to determine the relative performance of the remainder of the device. Through comparison of the test and re-test results, it is possible to reduce the design cycle for monolithically integrated semiconductor laser devices by detecting design flaws and imperfections or by ascertaining a more advantageous design.