Kenneth P Butler

US Patent:

20070288797, Dec 13, 2007

Filed:

Apr 9, 2007

Appl. No.:

11/697961

Inventors:

Srinivasa Chakravarthy - Bangalore, IN
Rubin Parekhji - Bangalore, IN
Julio Hernandez - Orlando FL, US
Kenneth Butler - Richardson TX, US

Assignee:

TEXAS INSTRUMENTS INCORPORATED - Dallas TX

International Classification:

G06F 11/00

US Classification:

714030000

Abstract:

A method generates test vectors for a customer designed integrated circuit having an embedded vendor circuit. The embedded vendor circuit has a proprietary circuit and a nonproprietary circuit. At least one pseudo input is defined to represent a portion of the nonproprietary circuit to emulate the nonproprietary circuit output. An output node of the embedded vendor circuit to which an input of the customer designed circuit is connectable is identified. A test netlist is created which represents circuitry that produces output states at the output node which would be generated by the embedded vendor circuit thereat. The test netlist includes at least one pseudo input and the output node, without including a full netlist of either the proprietary or nonproprietary circuits, and can be used to generate scan test vectors for the customer designed integrated circuit by the automatic test vector generating software program.