Kenneth L Farmer

US Patent:

20050194979, Sep 8, 2005

Filed:

Mar 5, 2004

Appl. No.:

10/794177

Inventors:

Harry Roman - East Orange NJ, US
Kenneth Farmer - Lake Elmo MN, US
Xiaodong Wang - East Newark NJ, US
Baoqing Li - Harrison NJ, US

International Classification:

G01R031/08
G01R031/12
H01H009/50

US Classification:

324536000

Abstract:

An approved method and apparatus for detecting partial discharge events within a transformer comprises asserting a MEMS acoustical probe through the wall of the transformer to optically measure partial discharge events. In an enhanced embodiment, temperature compensation is also possible, and detection may be confirmed via an independent electromagnetic or other sensor.

US Patent:

58438327, Dec 1, 1998

Filed:

Mar 1, 1995

Appl. No.:

8/396237

Inventors:

Kenneth R. Farmer - Newark NJ
Thomas G. Digges - Fredericksburg VA
N. Perry Cook - Fredericksburg VA

Assignee:

Virginia Semiconductor, Inc. - Fredericksburg VA

International Classification:

H01L 2176

US Classification:

438406

Abstract:

A technique of bonding a thin wafer layer to a substrate. The wafer is blown dry using an inert gas to prevent it from being damaged, while still ensuring that it dries completely. The initial bonding is done by orienting crystallographic axes, and then allowing the wafers to adhere to one another slowly. The contact wave is prevented from spreading, by a divider between the two wafers. The wafers are allowed to adhere to one another slowly to form a bond. The bond is strengthened by annealing.