Kenneth Richard Harvey

US Patent:

6548999, Apr 15, 2003

Filed:

Aug 17, 2001

Appl. No.:

09/933477

Inventors:

Vincent W. C. Wong - Morgan Hill CA
William W. Oldfield - Redwood City CA
Kenneth C. Harvey - Los Gatos CA

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R 1508

US Classification:

324132, 324 95, 324115, 324119

Abstract:

A power meter includes components to measure RMS power over an 84 dB range or greater using the I-V square-law relation of a diode for measurements. The power meter includes multiple diodes along with a power distribution manifold which includes power dividers to distribute an input signal to the diodes. In one embodiment, a first power divider ( ) distributes power to a first one of the diodes ( ), and to the second power divider ( ) which distributes power to the second ( ) and third ( ) diodes. The first power divider ( ) is connected without attenuation to the first diode ( ). The second power divider ( ) is connected to the second diode ( ) through a 11 dB attenuator ( ), and to the third diode ( ) through a 28 dB attenuator ( ). With such attenuation, the first diode can operate in its square law range for measurements of signals with power from -64 dBm to -14 dBm, while the second diode can operate in its square law range for signals with power from -14 dBm to +3 dBm, and the third diode can operate within its square law range for signals with power from +3 dBm to +20 dBm. By measuring the current from the appropriate diode depending on the power level of the input signal, RMS power can be determined accurately over an 84 dB operating range.

US Patent:

7339682, Mar 4, 2008

Filed:

Feb 25, 2005

Appl. No.:

11/066933

Inventors:

Arun Ananth Aiyer - Fremont CA, US
Mark A. Meloni - Flower Mound TX, US
Kenneth C. Harvey - Dallas TX, US
Andrew Weeks Kueny - Dallas TX, US

Assignee:

Verity Instruments, Inc. - Carrollton TX

International Classification:

G01B 9/02

US Classification:

356504, 356485, 356492

Abstract:

The present invention is directed to a heterodyne reflectometer system and method for obtaining highly accurate phase shift information from heterodyned optical signals, from which extremely accurate film depths can be calculated. A linearly polarized light comprised of two linearly polarized components that are orthogonal to each other, with split optical frequencies, is directed toward a film causing one of the optical polarization components to lag behind the other due to an increase in the optical path in the film for that component. A pair of detectors receives the beam reflected from the film layer and produces a measurement signal, and the beam prior to incidence on the film layer and generates a reference signal, respectively. The measurement signal and reference signal are analyzed by a phase detector for phase shift. The detected phase shift is then fed into a thickness calculator for film thickness results.

US Patent:

63317699, Dec 18, 2001

Filed:

Jun 18, 1999

Appl. No.:

9/336607

Inventors:

Vincent W. C. Wong - Morgan Hill CA
William W. Oldfield - Redwood City CA
Kenneth C. Harvey - Los Gatos CA

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R 1508
G01R 1510

US Classification:

324132

Abstract:

A power meter includes components to measure RMS power over an 84 dB range or greater using the I-V square-law relation of a diode for measurements. The power meter includes multiple diodes along with a power distribution manifold which includes power dividers to distribute an input signal to the diodes. In one embodiment, a first power divider (202) distributes power to a first one of the diodes (203), and to the second power divider (204) which distributes power to the second (210) and third (212) diodes. The first power divider (202) is connected without attenuation to the first diode (203). The second power divider (204) is connected to the second diode (210) through a 11 dB attenuator (206), and to the third diode (212) through a 28 dB attenuator (208). With such attenuation, the first diode can operate in its square law range for measurements of signals with power from -64 dBm to -14 dBm, while the second diode can operate in its square law range for signals with power from -14 dBm to +3 dBm, and the third diode can operate within its square law range for signals with power from +3 dBm to +20 dBm. By measuring the current from the appropriate diode depending on the power level of the input signal, RMS power can be determined accurately over an 84 dB operating range.

US Patent:

62919849, Sep 18, 2001

Filed:

Dec 22, 1999

Appl. No.:

9/470149

Inventors:

Vincent W. C. Wong - Morgan Hill CA
Chris Turl - Letchworth Herts, GB
William W. Oldfield - Redwood City CA
Kenneth C. Harvey - Los Gatos CA

Assignee:

Anritsu Company - Morgan Hill CA

International Classification:

G01R 1500

US Classification:

324132

Abstract:

A dual mode power meter provides a first operation mode in the square law operating range of the diode, and a second mode in the square law region as well as the transition and linear operating ranges of the diode. The power meter includes multiple diodes. A manifold made up of power dividers distributes a signal input to the power meter to the diodes. A different attenuation is provided to each diode so that the square law operating range for each diode covers a different power range. By selecting the appropriate diode output for power measurements in the first mode, the overall square law operating range for the power meter will be greater than a power meter using a single diode. The power meter further includes a memory map of voltage vs. power in the square law, transition and linear regions of a diode measured for an unmodulated CW input for the second operation mode.