Kevin G Harding

US Patent:

6466843, Oct 15, 2002

Filed:

Oct 16, 2001

Appl. No.:

09/682763

Inventors:

Pierino Gianni Bonanni - Clifton Park NY
Kevin George Harding - Niskayuna NY
Appasaheb Ningappa Madiwale - Schenectady NY
Juan Manuel De Bedout - Clifort Park NY

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G06F 1900

US Classification:

700245, 700165, 700206, 700247, 700260, 700251, 700252, 700259, 31856811, 901 8, 72 162, 72 163, 701301

Abstract:

In one embodiment of the present invention, a system for lifting objects comprises a Cartesian manipulator, a machine vision system for acquiring video images of the objects, and a control processor for processing the video images and providing position command signals to the Cartesian manipulator.

US Patent:

6678057, Jan 13, 2004

Filed:

Dec 19, 2001

Appl. No.:

09/683365

Inventors:

Kevin George Harding - Niskayuna NY
Thomas Watkins Lloyd - Shrewsbury VT
Joseph Benjamin Ross - Cincinnati OH

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01B 1124

US Classification:

356603, 356369

Abstract:

A method for filtering undesired light reflections in a structured light measurement system during the inspection of shiny metal prismatic objects having uncoated prismatic surfaces, such as turbine blades, using polarized light.

US Patent:

6700668, Mar 2, 2004

Filed:

Jun 25, 2002

Appl. No.:

10/064246

Inventors:

Joseph LeGrand Mundy - Niskayuna NY
Kevin George Harding - Niskayuna NY
Joseph Benjamin Ross - Cincinnati OH
Thomas Watkins Lloyd - Shrewsbury VT

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01B 1124

US Classification:

356601, 356394, 382321

Abstract:

A method for optical part shape measurement of a bare metal part to determine acceptability of the manufactured part. A variable level light source illuminates the part which is mounted on positioning equipment that allows the part to be moved from one position to another. Localized variations in light level are first determined and are compared with a reflectivity model of the part to determine optimization of the setup. Light level and viewing orientation of the part are adjusted to optimize the quality of test data obtained. Data quality is reviewed to ascertain a confidence factor for each location on the parts surface. Using both the reflectivity model and quality test results, data acquired for specified areas of the part is either accepted or rejected. Light level and part orientation are changed based upon how a reflectivity map of the part changes with each adjustment. New and acceptable data are now acquired for those areas of the part where data was previously discarded.

US Patent:

6701615, Mar 9, 2004

Filed:

Mar 8, 2002

Appl. No.:

09/683981

Inventors:

Kevin George Harding - Niskayuna NY
John William Devitt - Clifton Park NY
Kristina Helena Valborg Hedengren - Schenectady NY

Assignee:

General Electric Company - Niskayuna NY

International Classification:

B23P 600

US Classification:

298891, 2940207, 2940218, 2940219, 2940704, 29702

Abstract:

An inspection and sorting system for part repair includes at least one sensor for inspecting a part. The sensor is configured to obtain inspection data for the part. A comparison module is configured to receive the inspection data, to generate a repair profile for the part using the inspection data, and to compare the repair profile with a baseline to arrive at a repair recommendation for the part. A method includes inspecting a part with at least one sensor to obtain preliminary inspection data for the part. The method further includes generating a preliminary repair profile from the preliminary inspection data, comparing the preliminary repair profile with a baseline, and arriving at a repair recommendation for the part based on the comparison.

US Patent:

6795201, Sep 21, 2004

Filed:

Mar 21, 2003

Appl. No.:

10/394673

Inventors:

Pratima Rangarajan - Clifton Park NY
Vicki Herzl Watkins - Alplaus NY
Kevin George Harding - Niskayuna NY
John William Devitt - Mainville OH

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01B 1122

US Classification:

356626, 73 82

Abstract:

A method of objectively evaluating a surface mark provides an objective test methodology for the optical quantification of surface marks. The method may include the steps of reproducibly producing a surface mark on an object and optically evaluating the surface mark. The surface mark may be reproducibly produced by loading a stylus, contacting a surface on the object with the loaded stylus and moving the object and the surface thereon relative to the loaded stylus so as to thereby produce a mark on the surface. Any surface mark is optically evaluated by optically producing images of the surface mark, electronically capturing the optically produced images and measuring selected parameters of the captured optically produced images.

US Patent:

6874932, Apr 5, 2005

Filed:

Jun 30, 2003

Appl. No.:

10/609812

Inventors:

John William Devitt - Maineville OH, US
Anthony S. Bauco - Horseheads NY, US
Craig Alan Cantello - Schenectady NY, US
Kevin G. Harding - Niskayuna NY, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01N025/72

US Classification:

374 5, 374121, 2503416

Abstract:

A method facilitates inspection of a component surface. The method comprises positioning a surface of the component to be inspected in an optical path of at least one infrared radiation detector, heating the component surface using electromagnetic radiation to cause an increase in radiance from a defect present at the component surface, and detecting temperature variations within the component surface using the at least one infrared radiation detector, such that the surface irradiance is measured at predetermined locations across the component surface. The method further comprises detecting cracks in the component by analyzing radiation transient response data received by the infrared radiation detector, and correlating the temperature variations to the radiation transient response data to determine a depth of the detected cracks.

US Patent:

6930763, Aug 16, 2005

Filed:

Dec 18, 2001

Appl. No.:

09/683355

Inventors:

Kevin George Harding - Niskayuna NY, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01C003/00

US Classification:

356 31

Abstract:

A method for improving the accuracy of measurements made in non-contact gauging an object utilizing a detector to observe a laser line projected onto a surface of the object. A combination of detector lens f-number adjustments, surface scatter statistics, and laser coherence control are utilized to reduce speckle noise in the structured light gauge measurement system without the use of moving mechanical parts. This eliminates added mechanical motion errors and maximizes detectable laser light.

US Patent:

6970590, Nov 29, 2005

Filed:

Mar 28, 2002

Appl. No.:

10/063189

Inventors:

Kevin George Harding - Niskayuna NY, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G06K009/00

US Classification:

382152, 382199, 382154, 356603, 73104, 348125

Abstract:

Apparatus and a method for locating edges of a part for acceptance testing of the part. A white light source () illuminates the part which is mounted on a support () and rotated relative to the light source. Light reflected by the part creates an outline of the part along the edge thereof. The part is viewed by a camera () to obtain an image of the part including its edge. A processor () analyzes the image to locate the edge of the part in three dimensional space. Analysis of the image includes determining the number of pixels comprising the viewed image, at the edge thereof, as the part is rotated relative to the light source. The part has more than one edge, and each edge is located using the method. The locations of the edges of the part are now used in a co-ordinate system to locate other surface features of the part.