Kyle A Owen

US Patent:

20220317029, Oct 6, 2022

Filed:

Apr 2, 2021

Appl. No.:

17/221759

Inventors:

- Baden, CH
Kyle Owen - East Palo Alto CA, US
John Savee - San Francisco CA, US
Dmitry Skvortsov - Sunnyvale CA, US
Paul Hansen - Palo Alto CA, US
Raphael Desbiens - Quebec City, CA

International Classification:

G01N 21/31

Abstract:

Systems and methods for skewed basis set fitting may include obtaining measured absorption data indicative of an amount of absorption of light by a sample gas at each of multiple frequencies, determining an absorption dependent cavity time constant indicative of a skew to the measured absorption data caused by light reflections within a cavity in which the sample gas is contained, obtaining reference absorption data including basis sets indicative of reference amounts of light absorbed by each of multiple gases at each of the multiple frequencies, skewing the reference absorption data based on the absorption dependent cavity time constant to generate skewed reference absorption data, and fitting the measured absorption data to the skewed reference absorption data to identify an amount of at least one constituent gas within the sample gas.