Kyung Bum Min

Address:

911 S Webster Ave, Anaheim, CA 92804

Phone:

(714)2202124

VIN:

1HGCM56487A211994

Make:

HONDA

Model:

ACCORD

Year:

2007

US Patent:

6547887, Apr 15, 2003

Filed:

Dec 15, 1999

Appl. No.:

09/464657

Inventors:

Chan U. Ko - Arcadia CA
Luigi Sartor - Pasadena CA
Carol A. Koch - San Gabriel CA
Paul Keller - Gottlieben, CH
Ian Brown - Leiderdorp, NL
Kyung W. Min - Mentor OH
Li Xie - Painesville OH
Prakash Mallya - Sierra Madre CA
Kai Li - Diamond Bar CA

Assignee:

Avery Dennison Corporation - Pasadena CA

International Classification:

B08B 700

US Classification:

134 6, 134 15, 134 16, 134 26, 428343, 428354, 428355, 428356, 524270, 524272, 524395

Abstract:

Multilayer PSA label constructions that achieve a good balance of properties, namely, adhesive performance, convertibility, and laser printer performance, and, optionally, good wet-out on plastic substrates and low haze. The multilayer PSA construction comprising a facestock, a multilayer adhesive coating, and a release liner. The adhesive coating is made of a face side adhesive (FSA) layer comprising a first emulsion acrylic PSA, which is in contact with the inner surface of the facestock, and a liner side adhesive (LSA) layer, comprising a second emulsion acrylic PSA different from the first acrylic PSA, which is in contact with the FSA. The adhesive coating has a coat weight of less than about 26 g/m and a flow of less than about 50 m at room temperature. The construction exhibits a loop tack value of at least about 3. 5 N/25 mm at 5Â C.

US Patent:

20130002273, Jan 3, 2013

Filed:

May 2, 2012

Appl. No.:

13/462782

Inventors:

Kyung Jin Min - Campbell CA, US
David J. Pommerenke - Rolla MO, US
Giorgi Muchaidze - Sunnyvale CA, US
Besarion Chikhradze - Tbilisi, GE
Iuri Kalandarishvili - Tbilisi, GE

International Classification:

G01R 31/28

US Classification:

32475001, 901 2

Abstract:

A system and method for electrostatic discharge (ESD) testing devices under test (DUTs) uses an ESD gun attached to a robotic arm to execute ESD tests. The system and method also uses cameras positioned around a DUT placed on a testing table to define at least one test point on a surface of the DUT. Using the defined test point, as well as settings on the ESD gun and a testing process scenario that includes actions to be executed by the system, the testing process is performed by the system.

US Patent:

20130002275, Jan 3, 2013

Filed:

Jul 2, 2012

Appl. No.:

13/540604

Inventors:

Kyung Jin Min - Campbell CA, US
Giorgi Muchaidze - Sunnyvale CA, US
Besarion Chikhradze - Tbilisi, GE

International Classification:

G01R 35/00
G01R 31/00

US Classification:

32475002

Abstract:

A system and method for measuring near field information of a device under test (DUT) uses a reference probe and a measurement probe that are configured to sense a field. A probe calibration factor is used to determine corresponding field values for signals from the measurement probe at sampling locations about the DUT. The probe calibration factor is derived from measured signals about a conductive trace using a probe and simulated field information for the conductive trace when subjected to a simulated reference signal.

US Patent:

20180006088, Jan 4, 2018

Filed:

Jan 26, 2015

Appl. No.:

15/539929

Inventors:

- Houston TX, US
Kyung Min - Palo Alto CA, US
Gary Gibson - Palo Alto CA, US

International Classification:

H01L 27/24
H01L 45/00

Abstract:

One example includes a resistive random access memory (ReRAM) device. The device includes a set of electrodes to receive a voltage. The device also includes a memristor element to at least one of store and readout a memory state in response to a current that flows through the ReRAM device in response to the voltage. The device further includes a selector element having a dynamic current-density area with respect to the voltage.