Laurence H Warden

US Patent:

6714299, Mar 30, 2004

Filed:

Jul 13, 2001

Appl. No.:

09/906580

Inventors:

Todd Peterson - Coronado CA
Laurence Warden - Poway CA
Juan Yguerabide - La Jolla CA
Evangelina Yguerabide - La Jolla CA

Assignee:

Genicon Sciences Corporation - San Diego CA

International Classification:

G01N 2100

US Classification:

356338

Abstract:

The use of light scattering particles in the design, manufacturing, and quality control of microscale devices and process, and the analysis of solid substrate and porous substrate characteristics is described.

US Patent:

7188950, Mar 13, 2007

Filed:

Sep 7, 2004

Appl. No.:

10/936131

Inventors:

Andreas W. Dreher - Escondido CA, US
Jagdish M. Jethmalani - San Diego CA, US
Laurence Warden - Poway CA, US
Shui T. Lai - Encinitas CA, US

Assignee:

Ophthonix, Inc. - San Diego CA

International Classification:

G02C 7/02

US Classification:

351177, 351159, 351166

Abstract:

A method of making corrective eyeglasses is disclosed. One embodiment is a method of making corrective eyeglasses. The method includes obtaining vision parameters of a patient's eyes, obtaining an eyeglass frame comprising at least one mounted optical element, and programming the optical element to define a pattern of refraction that is associated with the vision parameters.

US Patent:

7234810, Jun 26, 2007

Filed:

Sep 7, 2004

Appl. No.:

10/936132

Inventors:

Laurence Warden - Poway CA, US
Andreas W. Dreher - Escondido CA, US
John Ferro - Santa Rosa CA, US
Jagdish M. Jethmalani - San Diego CA, US
Shui T. Lai - Encinitas CA, US

Assignee:

Ophthonix, Inc. - San Diego CA

International Classification:

G02C 7/02

US Classification:

351177

Abstract:

A system for manufacturing an optical lens that is configured to correct optical aberrations, including, e. g. , high order aberrations such as described by Zernike polynomials. The system can include a measurement system configured to measure optical aberrations in a patient's eye and to create measured optical aberration data. A calculation system is configured to receive the measured optical aberration data and to determine a lens definition based on the measured optical aberration data. A fabrication system is configured to produce a correcting lens based on the lens definition.

US Patent:

7425067, Sep 16, 2008

Filed:

Oct 22, 2004

Appl. No.:

10/971769

Inventors:

Laurence Warden - Poway CA, US
Andreas W. Dreher - Escondido CA, US
Gary D. Mills - Escondido CA, US
Shui T. Lai - Encinitas CA, US
William G. Foote - Poway CA, US
David G. Sandler - San Diego CA, US

Assignee:

Ophthonix, Inc. - Vista CA

International Classification:

A61B 3/10

US Classification:

351205, 351210

Abstract:

Diagnostic instruments, systems and methods for performing measurements on eyes are disclosed. In one embodiment of the instrument, a left ocular is disposed in a portion of a left visual path for the left eye, the left ocular positioned to permit the left eye to view a target, a right ocular is disposed in a portion of a right visual path for the right eye, the right ocular positioned to permit the right eye to view a target. The instrument can also include a wavefront sensor disposed on a translation stage, the wavefront sensor having an optical path to an imaging sensor, the translation stage being movable to position the optical path of the wavefront sensor in alignment with the portion of the left visual path in a first state and in alignment with the portion of the right visual path in a second state. One or more light sources are optionally provided for propagating light along a least part of the left and right visual paths to illuminate the left and right eyes.

US Patent:

7434931, Oct 14, 2008

Filed:

Jan 13, 2004

Appl. No.:

10/756243

Inventors:

Laurence Warden - Poway CA, US
Andreas W. Dreher - Escondido CA, US
Tro Murphey - San Diego CA, US

Assignee:

Ophthonix - Vista CA

International Classification:

A61B 3/10

US Classification:

351204

Abstract:

Two or more images captured from digital cameras record an image of spectacle frames on a subject. The image is analyzed using automated image-processing techniques to identify the relation of specific points of interest on the frame to the location of each of the subject's eyes allowing the optical center of the lens to be placed in the correct location in the frames.

US Patent:

7497573, Mar 3, 2009

Filed:

Dec 6, 2006

Appl. No.:

11/634637

Inventors:

Laurence Warden - Poway CA, US
Andreas W. Dreher - Escondido CA, US
John Ferro - Santa Rosa CA, US
Jagdish M. Jethmalani - San Diego CA, US
Shui T. Lai - Encinitas CA, US

Assignee:

Ophthonix, Inc. - Vista CA

International Classification:

A61B 3/00
G02C 7/02

US Classification:

351200, 351177

Abstract:

A system for manufacturing an optical lens that is configured to correct optical aberrations, including, e. g. , high order aberrations such as described by Zemike polynomials. The system can include a measurement system configured to measure optical aberrations in a patient's eye and to create measured optical aberration data. A calculation system is configured to receive the measured optical aberration data and to determine a lens definition based on the measured optical aberration data. A fabrication system is configured to produce a correcting lens based on the lens definition.

US Patent:

7568799, Aug 4, 2009

Filed:

Feb 6, 2007

Appl. No.:

11/703888

Inventors:

Andreas W. Dreher - Escondido CA, US
Jagdish M. Jethmalani - San Diego CA, US
Laurence Warden - Poway CA, US
Shui T. Lai - Encinitas CA, US

Assignee:

Ophthonix, Inc. - Vista CA

International Classification:

G02C 7/02

US Classification:

351177, 351159, 351166

Abstract:

A method of making corrective eyeglasses is disclosed. One embodiment is a method of making corrective eyeglasses. The method includes obtaining vision parameters of a patient's eyes, obtaining an eyeglass frame comprising at least one mounted optical element, and programming the optical element to define a pattern of refraction that is associated with the vision parameters.

US Patent:

7659971, Feb 9, 2010

Filed:

Jan 24, 2008

Appl. No.:

12/019614

Inventors:

Laurence Warden - Poway CA, US
John Ferro - Santa Rosa CA, US
Andreas W. Dreher - Escondido CA, US
William G. Foote - Poway CA, US

Assignee:

Ophthonix, Inc. - Vista CA

International Classification:

G01B 9/00

US Classification:

356124

Abstract:

Wavefront measuring systems and methods are disclosed which may be employed, for example, in detecting phase aberrations in a spectacle lens and in an eye. Various embodiments include disposing a modulation pattern in the path of a return beam from the spectacle lens or the eye, and imaging a diffraction pattern at a self-imaging plane relative to the modulation pattern with a detector. The diffraction pattern is analyzed and the results are used to produce a representation of the wavefront phase characteristics that describe aberrations in the lens or eye being measured. Illumination and processing techniques for improving the measurement results are disclosed. Various embodiments comprise systems adaptable to both measure aberrations in lenses in spectacles as well as in a patient's eyes.