Li Hsu Fan

US Patent:

7782072, Aug 24, 2010

Filed:

Sep 27, 2006

Appl. No.:

11/535859

Inventors:

Li Fan - San Ramon CA, US
John K. Gritters - Livermore CA, US

Assignee:

FormFactor, Inc. - Livermore CA

International Classification:

G01R 31/02

US Classification:

324762

Abstract:

A probe group can include multiple probes for testing devices having contact pads. The probes can comprise beams, contact tip structures, and mounting portions. The beams can provide for controlled deflection of the probes. The contact tip structures can be connected to the beams and can include contact portions for contacting with the devices. The mounting portions of the beams can be attached to support structures, which can be arranged in a staggered pattern. The beams located in a first row of the staggered pattern can include narrowing regions that lie substantially in line with the mounting portions of a second row of the beams.

US Patent:

8148646, Apr 3, 2012

Filed:

Sep 29, 2008

Appl. No.:

12/240505

Inventors:

Li Fan - San Ramon CA, US
Michael J. Armstrong - Danville CA, US
John K. Gritters - Livermore CA, US

Assignee:

FormFactor, Inc. - Livermore CA

International Classification:

H05K 1/11

US Classification:

174261, 361760, 439 66, 32475403

Abstract:

A contact apparatus can be made by providing a first substrate with electrically conductive terminals and second substrates each of which can have contact structures. Each of the contact structures can have a contact tip. The second substrates can be aligned such that contact tips of the contact structures are aligned substantially in a plane. An optical system can be used to monitor an actual position of the second substrates, and a mechanical system can be used to move the second substrates to aligned positions. The contact structures can be attached to ones of the terminals on the first substrate while the second substrates are in the aligned positions.

US Patent:

8203352, Jun 19, 2012

Filed:

Aug 24, 2010

Appl. No.:

12/861984

Inventors:

Li Fan - San Ramon CA, US
John K. Gritters - Livermore CA, US

Assignee:

FormFactor, Inc. - Livermore CA

International Classification:

G01R 31/00
G01R 1/067

US Classification:

32475401, 32475507

Abstract:

A probe group can include multiple probes for testing devices having contact pads. The probes can comprise beams, contact tip structures, and mounting portions. The beams can provide for controlled deflection of the probes. The contact tip structures can be connected to the beams and can include contact portions for contacting with the devices. The mounting portions of the beams can be attached to support structures, which can be arranged in a staggered pattern. The beams located in a first row of the staggered pattern can include narrowing regions that lie substantially in line with the mounting portions of a second row of the beams.

US Patent:

8394811, Mar 12, 2013

Filed:

Apr 18, 2008

Appl. No.:

12/450922

Inventors:

Herbert H. Samuels - New Rochelle NY, US
Ruben Abagyan - La Jolla CA, US
Matthieu Schapira - Toronto, CA
Maxim Totrov - San Diego CA, US
Bruce M. Raaka - Rockville MD, US
Stephen R. Wilson - Danville VA, US
Li Fan - Cambridge MA, US
Zhiguo Zhou - Winston Salem NC, US

Assignee:

Molsoft LLC - La Jolla CA
New York University School of Medicine - New York NY

International Classification:

A61K 31/438
A61K 31/4418
A61P 5/16
C07D 211/70
C07D 471/10

US Classification:

514278, 514357, 546 20, 546332

Abstract:

A method of identification of compounds that modulate thyroid hormone activity, and the use of such compounds and compositions thereof for such purposes are disclosed. The compounds may be selected from the group consisting of:.

US Patent:

20100140793, Jun 10, 2010

Filed:

May 22, 2009

Appl. No.:

12/470971

Inventors:

Li Fan - San Ramon CA, US
John K. Gritters - Livermore CA, US

Assignee:

FORMFACTOR, INC. - Livermore CA

International Classification:

H01L 23/48
C23F 1/00

US Classification:

257734, 216 18, 216 11, 257E2301

Abstract:

A process for making contact elements for a probe card assembly includes steps of forming a first continuous trench in a substrate along a first direction, and forming simultaneously a plurality of tip structures adjacent one to another in the first continuous trench in a second direction substantially normal to the first direction, each of the tip structures being part of, or adapted to be part of at least one corresponding contact element capable of forming an electrical contact with a terminal of an electronic device.

US Patent:

20230052819, Feb 16, 2023

Filed:

Oct 25, 2022

Appl. No.:

17/973166

Inventors:

- San Francisco CA, US
Li Fan - Belmont CA, US
Trunal Bhanse - Sunnyvale CA, US
Andrew Chen - San Francisco CA, US

International Classification:

G06Q 10/02
G06Q 30/02
H04W 4/02
G06Q 30/06
G06N 20/00

Abstract:

Systems and methods are provided for receiving a request for services in a given location from a client device operated by a user and generating a set of features based on information included in the request for services in the given location. The systems and methods further provide for analyzing the set of features using a machine learning model to predict whether only services that can be instantly booked should be provided in response to the request for services in the given location, analyzing a prediction output by the machine learning model to determine that only services that can be instantly booked should be provided in response to the request for services in the given location, and generating a list with only services that can be instantly booked.