Pacific Biosciences
Senior Manufacturing Engineer
Pacific Biosciences
Staff Manufacturing Engineer
Vertical Circuits 2007 - 2009
Senior Process Development Engineer and Tpm
Stats Chippac Aug 2005 - Sep 2007
Technical Program Manager
Corwil Technologies Ltd. 2003 - 2005
Process Development Engineer
Education:
University of Cebu 1986 - 1991
Bachelor of Science In Mechanical Engineering, Bachelors, Engineering
State College of Science and Technology 1979 - 1981
University of Cebu 1979 - 1981
Skills:
Design of Experiments Failure Analysis Spc Manufacturing Jmp Semiconductors Engineering Cross Functional Team Leadership Process Simulation Fmea Mems Metrology Ic Yield Semiconductor Industry Product Engineering Silicon Characterization Pcb Design Product Development Autocad Powerpoint Harvard Graphics Quality Assurance Microsoft Excel Excel Failure Mode and Effects Analysis
Simon J. S. McElrea - Scotts Valley CA, US Scott McGrath - Scotts Valley CA, US Terrence Caskey - Santa Cruz CA, US Scott Jay Crane - Aromas CA, US Marc E. Robinson - San Jose CA, US Loreto Cantillep - San Jose CA, US
Assignee:
Invensas Corporation - San Jose CA
International Classification:
H01L 23/02
US Classification:
257686
Abstract:
In die stack assembly configurations successive die in the stack are offset at a die edge at which die pads are situated, and the die are interconnected by electrically conductive traces. In some embodiments the electrically conductive traces are formed of an electrically conductive polymer. An electrically insulative conformal coating is provided having openings at die pads that are electrically connected.
Electrically Interconnected Stacked Die Assemblies
Simon J.S. McElrea - Scotts Valley CA, US Scott McGrath - Scotts Valley CA, US Terrence Caskey - Santa Cruz CA, US Scott Jay Crane - Aromas CA, US Marc E. Robinson - San Jose CA, US Loreto Cantillep - San Jose CA, US
Assignee:
Vertical Circuits, Inc. - Scotts Valley CA
International Classification:
H01L 23/02
US Classification:
257686, 257E23001
Abstract:
In die stack assembly configurations successive die in the stack are offset at a die edge at which die pads are situated, and the die are interconnected by electrically conductive traces. In some embodiments the electrically conductive traces are formed of an electrically conductive polymer. An electrically insulative conformal coating is provided having openings at die pads that are electrically connected.
Stacked Die Assembly Having Reduced Stress Electrical Interconnects
Scott McGrath - Scotts Valley CA, US Jeffrey S. Leal - Scotts Valley CA, US Ravi Shenoy - Dublin CA, US Loreto Cantillep - San Jose CA, US Simon J. S. McElrea - Scotts Valley CA, US Suzette K. Pangrle - Cupertino CA, US
Assignee:
Vertical Circuits, Inc. - Scotts Valley CA
International Classification:
H01L 23/522 H01L 21/56
US Classification:
257777, 438124, 257E23142, 257E21503
Abstract:
Methods are disclosed for improving electrical interconnection in stacked die assemblies, and stacked die assemblies are disclosed having structural features formed by the methods. The resulting stacked die assemblies are characterized by having reduced electrical interconnect failure.