Luis F Arce

US Patent:

40456234, Aug 30, 1977

Filed:

May 3, 1976

Appl. No.:

5/682398

Inventors:

Luis Albert Arce - Long Beach CA

International Classification:

H04M 322

US Classification:

1791752R

Abstract:

A matrix of electrical termination points arranged in pairs is provided with a detection circuit for detecting short circuits between termination points. A transistor circuit is associated with each pair of termination points. A connection is provided from one of the points in each terminal pair to the transistor base which is forward biased in the absence of short circuits. A collector-emitter connection is provided through the transistor to the other terminal point in the terminal pair. A current indicator responsive to the collector-emitter current is provided for each transistor circuit. When the transistor base is forward biased, a collector-emitter current actuates thecurrent indicator associated therewith. Short circuits between terminal points within a terminal pair greatly reduces collector-emitter current and short circuits between terminal points of different terminal pairs causes the base current of the transistor of at least one transistor circuit to be bypassed, thereby removing the forward bias current of that transistor. In both instances, the current indicator is deactuated.

US Patent:

41421426, Feb 27, 1979

Filed:

Feb 9, 1977

Appl. No.:

5/767207

Inventors:

Luis A. Arce - Lakewood CA

Assignee:

G. L. Collins Corporation - Long Beach CA

International Classification:

G01R 3102
G01R 3112
G01R 2700

US Classification:

324 54

Abstract:

High voltage testing apparatus producing A. C. test voltages across test probes produces electrical indications truly representative of only resistance in-phase currents flowing through a device being tested even though such device may be capacitive in addition to resistive in nature. Eliminated from such indications are effects otherwise due to quadrature capacitive currents. A transistor is connected between the test probes and is rendered alternatively conductive and nonconductive during succeeding half cycles of the A. C. voltage and such transistor is connected in conjunction with a meter which "samples" the voltage appearing between the test probes only during a first half cycle of the A. C wave during which the positive and negative portions of the quadrature capacitive current average out to a zero flow and thus have no effect on the meter. During the second half cycle of the A. C.