Mahendra Prabhu Ramachandran

age ~56

from Palo Alto, CA

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Also known as:

Mahendra P Ramachandran
Mahendra M Ramachand
Mahendra Prabhu

Phone and address:: 2450 W Bayshore Rd APT 2, Palo Alto, CA 94303
(650)2076036

Connected to:

Mahendra Ramachandran Phones & Addresses

2450 W Bayshore Rd APT 2, Palo Alto, CA 94303 • (650)2076036
Mountain View, CA
2450 W Bayshore Rd APT 2, Palo Alto, CA 94303

Work

Company:

Kla-tencor corp - Milpitas, CA
Sep 2010
Position:

Senior optical engineer

Education

School / High School:

University of Electro-Communications- Tokyo, JP
Apr 1997
Specialities:

Doctorate of Philosophy in Electronics Engineering

Resumes

Mahendra Prabhu Ramachandran

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Location:

Palo Alto, CA

Industry:

Research

Work:

Kla-Tencor Sep 1, 2010 - Oct 2008
Senior Optical Engineer
Applied Materials Oct 2008 - Sep 2010
Member of Technical Staff
Spectra-Physics Mar 2001 - Mar 2004
Senior Fiber Laser Engineer
Sameer (R&D of Dit, Govt of India) 1993 - 1997
Scientific Officer
Kla-Tencor 1993 - 1997
Senior Optical Design Engineer Corp

Education:

The University of Electro - Communications 1997 - 2000
Doctorates, Doctor of Philosophy Indian Institute of Science (Iisc) 1990 - 1993
Master of Science, Masters The American College of Financial Services 1988 - 1990
Master of Science, Masters

Skills:

Fiber Optics
Optics
Engineering Management
Algorithms
Matlab
Laser
Sensors
Troubleshooting
Optical Fiber
Mems
Image Processing
Characterization
Design For Manufacturing
Labview
Manufacturing
Design of Experiments
Monte Carlo
Nonlinear Optics
Semiconductors
Simulations
Zemax
Project Management
Tolerance Analysis
Design
Metrology

Interests:

Science and Technology
Social Services
Children

Languages:

English
Japanese
Hindi

Mahendra Prabhu Ramachandran

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Location:

Palo Alto, CA

Skills:

Design
Osa

Mahendra Ramachandran Palo Alto, CA

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Work:

KLA-Tencor Corp
Milpitas, CA
Sep 2010 to Sep 2010
Senior Optical Engineer Applied Materials
Santa Clara, CA
Oct 2008 to Aug 2010
Member of Technical Staff KLA-Tencor Corp
Milpitas, CA
Oct 2004 to Sep 2008
Senior Optical Engineer Spectra Physics
Mountain View, CA
Apr 2001 to Feb 2004
Senior Fiber Laser Engineer Society for Applied Microwave Electronics Engineering and Research
Mumbai, Maharashtra
Mar 1993 to Mar 1997
Scientific Officer

Education:

University of Electro-Communications
Tokyo, JP
Apr 1997 to Feb 2001
Doctorate of Philosophy in Electronics Engineering Indian Institute of Science
Bangalore, Karnataka
Aug 1990 to Jul 1993
Master of Science in Electrical Communication Engineering The American College
Madurai, Tamil Nadu
Aug 1988 to Jul 1990
Master of Science in Physics

Us Patents

Substrate Edge Inspection
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US Patent:

8325334, Dec 4, 2012
Filed:

Aug 18, 2010
Appl. No.:

12/858669
Inventors:

Mahendra P. Ramachandran - Palo Alto CA, US
Steven W. Meeks - Palo Alto CA, US
Alireza S. Moghadam - San Jose CA, US
Hung P. Nguyen - Santa Clara CA, US
Assignee:

KLA-Tencor Corporation - Milpitas CA
International Classification:

G01N 21/00
G01N 21/55
US Classification:

3562371, 356445, 3562372, 3562374, 3562375
Abstract:

An apparatus for inspecting an edge of a substrate. A light source produces a light beam, and a two-dimensional beam deflector receives the light beam and creates a semi-annular scanning beam. A first flared parabolic surface receives the semi-annular scanning beam and directs the semi-annular scanning beam onto the edge of the substrate, thereby creating specularly reflected light from the edge of the substrate. A second flared parabolic surface receives and directs the specularly reflected light to a detector. The detector receives the directed specularly reflected light and produces signals. An analyzer analyzes the signals and detects defects at the edge of the substrate.

Wide Spatial Frequency Topography And Roughness Measurement
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US Patent:

7362425, Apr 22, 2008
Filed:

Mar 23, 2006
Appl. No.:

11/387952
Inventors:

Steven W. Meeks - Fremont CA, US
Mahendra Prabhu Ramachandran - Palo Alto CA, US
Alireza Shahdoost Moghadam - San Jose CA, US
International Classification:

G01N 21/00
US Classification:

356 73
Abstract:

In one embodiment, a system to inspect a surface comprises an assembly to direct a first radiation beam onto a surface in a first plane of incidence, a first detector to generate a first signal from a portion of the radiation reflected from the first radiation beam, a first spatial filter interposed between the surface and the first detector, a first ellipsoidal mirror to collect scattered light, a second detector to generate a second signal from the scattered portion of the beam, and a processor to generate, from the first and second signals, a data set representing one or more characteristics of the surface using the first and second signals.

Substrate Inspection
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US Patent:

20130308124, Nov 21, 2013
Filed:

May 15, 2012
Appl. No.:

13/472421
Inventors:

Mahendra Prabhu Ramachandran - Palo Alto CA, US
Steven W. Meeks - Palo Alto CA, US
Romain Sappey - San Jose CA, US
Assignee:

KLA-TENCOR CORPORATION - Milpitas CA
International Classification:

G01N 21/00
US Classification:

3562372
Abstract:

Various embodiments for substrate inspection are provided.