Mark J Delaney

US Patent:

7106300, Sep 12, 2006

Filed:

Jul 12, 2002

Appl. No.:

10/195689

Inventors:

Barry E. Saylor - Kent WA, US
Rodney B. Doe - Seattle WA, US
Mark Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki

International Classification:

G09G 5/08
G05B 1/06

US Classification:

345161, 318640

Abstract:

A method is provided for converting joystick deflection into a speed of relative motion between a image system and a workpiece stage in a computer vision system. The conversion of joystick deflection into speed may be described in terms of a speed/deflection profile that corresponds a present lens characteristics of the system. In one embodiment, the speed/deflection response of the system depends relatively strongly on the present lens characteristic at relatively lower deflections and depends on relatively weakly on the present lens characteristic as the deflection approaches a maximum deflection. The system is advantageous in that, for any lens used, it maintains consistent ergonomic and visual feel at small joystick deflections which typically occur during ostensible precision maneuvers, but is also able to provide fast long-range traverses for large joystick deflections.

US Patent:

7499584, Mar 3, 2009

Filed:

Oct 21, 2004

Appl. No.:

10/971504

Inventors:

Mark L. Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

G06K 9/00

US Classification:

382152, 382159

Abstract:

A machine vision inspection system and method for generating a workpiece image acquisition/inspection program, which can be shared by different machine vision systems having different hardware capabilities. Each system includes a movable stage for scanning and measuring selected workpiece features, and preferably includes strobe lighting to control the effective exposure time of the workpiece image. The program provides for the determination of various image acquisition parameters, such as the stage velocity, strobe light power, strobe exposure time, etc. , based on a functional limit related to image smear. Thus, the program automatically adapts to any specific system, by allowing determination of optimal image acquisition parameters for that system based on the functional limit. Accordingly, the same program is usable on different systems to consistently provide a desired level of accuracy as well as optimum or near-optimum throughput, regardless of which vision system is used.

US Patent:

7590276, Sep 15, 2009

Filed:

Dec 20, 2004

Appl. No.:

11/018155

Inventors:

Mark L. Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

G06K 9/00
H04N 9/47
G06F 19/00

US Classification:

382141, 382148, 382151, 382152, 382153, 348 86, 348 92, 348 95, 348142, 700173, 700181

Abstract:

Methods and systems of part programming for machine vision inspection systems are provided, which permit a user to readily define multiple image acquisition operations interspersed with associated image analysis and/or inspection operations during learn mode operations and in the resulting part program image acquisition operations for at least some of the images are arranged into a continuous motion image acquisition sequence that acquires images and stores images in a “non-interspersed” manner in order to increase the throughput of the machine vision inspection system. Image analysis/inspection operations associated with the stored images are performed subsequently by recalling the store images. The programming systems and methods disclosed herein may operate automatically to facilitate rapid programming for a variety of workpieces by relatively unskilled users, wherein the resulting programs include continuous motion image acquisition sequences.

US Patent:

8269830, Sep 18, 2012

Filed:

Apr 14, 2011

Appl. No.:

13/086912

Inventors:

Mark Lawrence Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

H04N 7/18

US Classification:

348 87, 348126

Abstract:

A robust video tool is provided for use in a machine vision inspection system. The robust video tool comprises a region of interest, a user interface, edge detection operations, and excluded region operations that determine a set of current-feature edge points which includes edge points detected in the region of interest and excludes edge points in an excluded region. The excluded region is determined by an excluded region generator, based on at least one previously characterized feature which is a feature characterized by using a video tool that detects the edge points of, and characterizes dimensional parameters of, the previously characterized feature. Importantly, the robust video tool features and operations are configured to allow learn mode programming on a workpiece that is either properly fabricated or improperly fabricated, and the resulting program will operate reliably on a run mode workpiece that is either properly fabricated or improperly fabricated.

US Patent:

8280172, Oct 2, 2012

Filed:

Mar 22, 2011

Appl. No.:

13/053880

Inventors:

Shannon Roy Campbell - Woodinville WA, US
Mark Lawrence Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

G06K 9/48

US Classification:

382199, 382152, 382100, 348 86

Abstract:

A method for correcting coaxial light image edge location errors in a precision machine vision inspection system is disclosed. The method comprises comparing an edge position measurement of a workpiece edge feature using coaxial light and stage light. Edge position measurements using stage light have a lower uncertainty than that of coaxial light. Position correction factors may be determined from the difference between the two edge position measurements. The position correction factors may be stored for correcting subsequent edge position measurements that are based on images acquired using coaxial light. In some embodiments, position correction factors may be determined based on comparing edge position measurements for a plurality of edges.

US Patent:

8311311, Nov 13, 2012

Filed:

Nov 4, 2008

Appl. No.:

12/264850

Inventors:

Robert K. Bryll - Bothell WA, US
Mark L. Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

G06K 9/00

US Classification:

382141

Abstract:

A system and method for correcting surface height measurements for optical aberration is provided. Heights determined by an autofocus tool, which may depend on surface feature angles in a focus region of interest (ROI) and on the ROI location in the field of view, are corrected based on a novel error calibration. Error calibration data includes height corrections for different feature angles in images, and for multiple locations in a field of view. Height corrections are determined by weighting and combining the angle dependent error calibration data, e. g. , based on a gradient (edge) angle distribution determined in the ROIs. When Z-heights are determined for multiple ROIs in a field of view, storage of image data from particular images of a global image stack may be efficiently controlled based on determining early in processing whether a particular image is a sufficiently focused “near-peak” focused image or not.

US Patent:

8534113, Sep 17, 2013

Filed:

Nov 12, 2012

Appl. No.:

13/674917

Inventors:

- Kawasaki, JP
Mark L. Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

G01B 21/02

US Classification:

73 181

Abstract:

A system and method for correcting surface height measurements for optical aberration is provided. Heights determined by an autofocus tool, which may depend on surface feature angles in a focus region of interest (ROI) and on the ROI location in the field of view, are corrected based on a novel error calibration. Error calibration data includes height corrections for different feature angles in images, and for multiple locations in a field of view. Height corrections are determined by weighting and combining the angle dependent error calibration data, e. g. , based on a gradient (edge) angle distribution determined in the ROIs. When Z-heights are determined for multiple ROIs in a field of view, storage of image data from particular images of a global image stack may be efficiently controlled based on determining early in processing whether a particular image is a sufficiently focused “near-peak” focused image or not.

US Patent:

8648906, Feb 11, 2014

Filed:

Oct 13, 2010

Appl. No.:

12/904013

Inventors:

Mark Lawrence Delaney - Shoreline WA, US

Assignee:

Mitutoyo Corporation - Kawasaki-shi

International Classification:

H04N 7/18

US Classification:

348128, 356123, 356 405

Abstract:

A method is disclosed for operating a machine vision inspection system to determine a fluorescent imaging height for acquiring a fluorescent image for repeatably determining the location of a feature within the fluorescent material. The height of an exposed workpiece portion exposed outside of the fluorescent material is determined (e. g. , using a height sensor or autofocus operations). The determined height is repeatable. The exposed portion has a characteristic height relative to the fluorescent material and/or features located therein. The fluorescent imaging height, which may be inside the fluorescent material, is determined relative to the determined height of the exposed portion. The fluorescent imaging height is determined such that it enhances the detection of the desired feature located within the fluorescent material in the resulting fluorescent image. For a variety of workpieces, the method provides automatic acquisition of appropriately focused fluorescent image more reliably than previously known methods.