Mark A Hanning-Lee

age ~61

from Irvine, CA

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Also known as:

Mark Adrian Hanning-Lee
Mark Hanning Lee
Mark Adrian Hanninglee
Mark A Hanninglee
Mark A Hanning
Mark A Lee
Lee Mark Hanning

Phone and address:: 4171 Belvedere St, Irvine, CA 92604
(818)7965692

Connected to:

Mark Hanning-Lee Phones & Addresses

4171 Belvedere St, Irvine, CA 92604 • (818)7965692
Tustin, CA
Pasadena, CA
Los Angeles, CA
5140 Valdez Cir #214, Dugway, UT 84022 • (435)8314348

Work

Company:

Jacobs engineering
Jun 2006
Position:

Project scientist

Education

School / High School:

University of Oxford
1985 to 1991

Skills

Chemistry • Science • R&D • Systems Engineering • Mass Spectrometry • Testing • Instrumentation • Analytical Chemistry • Spectroscopy • Data Analysis • Materials Science • Technical Writing • Physics • Characterization • Analysis • Chemical Engineering • Organic Chemistry • Simulations • Matlab • Sensors • Laboratory • Uv/Vis • Chromatography • Modeling • Life Sciences • Physical Chemistry • Research and Development • Experimentation • Engineering Management • Lifesciences • Technology Transfer • Design of Experiments • Validation • Environmental Awareness • Uv/Vis Spectroscopy • Quality Assurance • Iso 17025 • Labview • Continuous Improvement • Report Writing • Laboratory Skills • Sop Development • Active Dod Secret Clearance • Cbr • Technical Leadership • Software Development

Languages

French • German

Industries

Defense & Space

Resumes

Senior Program Systems Analyst

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Location:

Salt Lake City, UT

Industry:

Defense & Space

Work:

Jacobs Engineering since Jun 2006
Project Scientist
Hamilton Sundstrand Mar 2004 - Aug 2005
Analytical Instrumentation Scientist
Syagen Technology Jan 1997 - Jun 2003
Staff Scientist
Aerospace Corporation Dec 1994 - Dec 1996
Postdoctoral Associate
Jet Propulsion Laboratory Feb 1992 - Feb 1994
Postdoctoral associate

Education:

University of Oxford 1985 - 1991
University of Cambridge 1982 - 1985

Skills:

Chemistry
Science
R&D
Systems Engineering
Mass Spectrometry
Testing
Instrumentation
Analytical Chemistry
Spectroscopy
Data Analysis
Materials Science
Technical Writing
Physics
Characterization
Analysis
Chemical Engineering
Organic Chemistry
Simulations
Matlab
Sensors
Laboratory
Uv/Vis
Chromatography
Modeling
Life Sciences
Physical Chemistry
Research and Development
Experimentation
Engineering Management
Lifesciences
Technology Transfer
Design of Experiments
Validation
Environmental Awareness
Uv/Vis Spectroscopy
Quality Assurance
Iso 17025
Labview
Continuous Improvement
Report Writing
Laboratory Skills
Sop Development
Active Dod Secret Clearance
Cbr
Technical Leadership
Software Development

Languages:

French
German

Us Patents

High Dynamic Range Analog-To-Digital Converter
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US Patent:

6737642, May 18, 2004
Filed:

Mar 18, 2002
Appl. No.:

10/101670
Inventors:

Jack A. Syage - Huntington Beach CA
Mark A. Hanning-Lee - Tustin CA
Assignee:

Syagen Technology - Tustin CA
International Classification:

H01J 4940
US Classification:

250287, 250281, 250283, 250286, 250397
Abstract:

A high speed analog to digital converter (âADCâ) that can be used in a detector system. The ADC is coupled to a detector and a processor. The detector generates an analog signal in response to the detection of a trace sample, such as an ionized molecule or a beam of light. The processor determines a baseline value and threshold value. Portions of the analog signal at or below the threshold are assigned the baseline value. The threshold typically corresponds to a value above the noise level in the system. The detector thus removes undesirable noise from the readout value. The process can compensate for factors such as DC drift while providing accurate data regarding detection of the trace sample.

Photoionization Mass Spectrometer
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US Patent:

20030075679, Apr 24, 2003
Filed:

Oct 16, 2001
Appl. No.:

09/981499
Inventors:

Jack Syage - Huntington Beach CA, US
Karl Hanold - Irvine CA, US
Mark Hanning-Lee - Tustin CA, US
International Classification:

H01J049/10
US Classification:

250/288000
Abstract:

A monitor that can detect at least one trace molecule in a gas sample. The monitor may include a photoionizer that is coupled to an electron-ionization mass spectrometer. The photoionizer may ionize the gas sample at a wavelength(es) which ionizes the trace molecules without creating fragmentation. The inclusion of the electron-ionizer may allow alternate or additional ionization to detect trace molecules not ionized by the photoionizer. The gas sample may be ionized at atmospheric pressure which increases the yield of the ionized trace molecules and the sensitivity of the mass spectrometer.

Photoionization Mass Spectrometer
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US Patent:

63296535, Dec 11, 2001
Filed:

Sep 1, 2000
Appl. No.:

9/653038
Inventors:

Jack A. Syage - Huntington Beach CA
Karl A. Hanold - Irvine CA
Mark A. Hanning-Lee - Tustin CA
Assignee:

Syagen Technology - Tustin CA
International Classification:

H01J 4904
US Classification:

250282
Abstract:

A monitor that can detect at least one trace molecule in a gas sample. The monitor may include a photoionizer that is coupled to an electron-ionization mass spectrometer. The photoionizer may ionize the gas sample at a wavelength(es) which ionizes the trace molecules without creating fragmentation. The inclusion of the electron-ionizer may allow alternate or additional ionization to detect trace molecules not ionized by the photoionizer. The gas sample may be ionized at atmospheric pressure which increases the yield of the ionized trace molecules and the sensitivity of the mass spectrometer.

Photoionization Mass Spectrometer
view source
US Patent:

62115162, Apr 3, 2001
Filed:

Feb 9, 1999
Appl. No.:

9/247646
Inventors:

Jack A. Syage - Huntington Beach CA
Karl A. Hanold - Irvine CA
Mark A. Hanning-Lee - Tustin CA
Assignee:

Syagen Technology - Tustin CA
International Classification:

H01J 4910
US Classification:

250288
Abstract:

A monitor that can detect at least one trace molecule in a gas sample. The monitor may include a photoionizer that is coupled to an electron-ionization mass spectrometer. The photoionizer may ionize the gas sample at a wavelength(es) which ionizes the trace molecules without creating fragmentation. The inclusion of the electron-ionizer may allow alternate or additional ionization to detect trace molecules not ionized by the photoionizer. The gas sample may be ionized at atmospheric pressure which increases the yield of the ionized trace molecules and the sensitivity of the mass spectrometer.