Mark A Michniewicz from 3577 Catherine Anne, Holly, MI 48442, age 57, Phone: (248)8870911

Resumes

Senior Application Engineer

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Location:

Auburn Hills, MI

Industry:

Mechanical Or Industrial Engineering

Work:

Playdata since 2008
Chief Engineer
Michigan Aerospace Corporation - Ann Arbor MI Sep 2007 - Nov 2008
Program Manager
Integral Vision Inc - Wixom, MI Jan 1994 - Oct 2007
Vice President of Engineering

Education:

University of Rochester 1990 - 1991
Master of Science (MS)-Optics, Optical Engineering Kettering University 1985 - 1990
Bachelor of Science (BS), Mechanical Engineering

Skills:

Engineering
Sensors
Optics
Automation
Engineering Management
Product Development
Electronics
Simulations
Design For Manufacturing
Electrical Engineering
Program Management
Systems Engineering
Entrepreneurship
Solidworks
Machine Vision
Robotics
System Design
Embedded Systems
Manufacturing
Labview
System Architecture
R&D
Integration

Interests:

First Robotics Team 68 Mentor

Us Patents

Method And System For Automatically Inspecting A Display Including A Layer Of Liquid Crystal Material
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US Patent:

20070075279, Apr 5, 2007
Filed:

Sep 30, 2005
Appl. No.:

11/241528
Inventors:

Mark Michniewicz - Holly MI, US
Andrew Blowers - Sebewaing MI, US
Assignee:

Intergral Vision, Inc. - Farmington Hills MI
International Classification:

G01N 21/86
US Classification:

250559270
Abstract:

A system and method are provided to rapidly inspect Liquid Crystal On Silicon (i.e., LCOS) displays to identify non-uniform cell gaps. The system includes a light source, a single polarized optical filter, and a color camera. The image acquired by the camera is analyzed to find variations in color. Excessive variations in color are used to identify excessive variations in the cell gap of the LCOS display. The arrangement of the components of the system does not require great precision and the analysis can be done very quickly.

Simulator With Enhanced Depth Perception
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US Patent:

20100311512, Dec 9, 2010
Filed:

May 12, 2010
Appl. No.:

12/778437
Inventors:

Timothy James Lock - Ann Arbor MI, US
Wallace Maass - Perrysburg OH, US
Kristy Smith - Ann Arbor MI, US
Derek Smith - Ann Arbor MI, US
Mark Michniewicz - Holly MI, US
International Classification:

A63B 69/36
US Classification:

473199, 473266
Abstract:

A simulator system includes a user tracking device for detecting a position of a user and generating a sensor signal representing the position of the user, a processor for receiving the sensor signal, analyzing the sensor signal, and generating an image signal in response to the analysis of the sensor signal, wherein the analyzing of the sensor signal includes determining a position of a virtual camera corresponding to the position of the user, the virtual camera being directed toward a reference look-at-point; and a image generating device for receiving the image signal and generating an image in response to the image signal, wherein the image is modified in response to the position and an orientation of the virtual camera relative to the reference look-at-point.

Optical Method And System For Measuring Three-Dimensional Surface Topography Of An Object Having A Surface Contour
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US Patent:

62689231, Jul 31, 2001
Filed:

Oct 7, 1999
Appl. No.:

9/414352
Inventors:

Mark A. Michniewicz - Highland MI
Matthew P. Frazer - Plymouth MI
Assignee:

Integral Vision, Inc. - Farmington Hills MI
International Classification:

G01B 902
US Classification:

356512
Abstract:

An optical method and system for measuring three-dimensional surface topography by providing high resolution contour measurements of an object using interferometric methods. The invention utilizes co-sight detector technology to provide at least three independent images of exactly the same object location, with a known fringe pattern optically introduced to each of the images. Each of the fringe patterns have a known phase difference relative to the phase appearing on each of the other images. Furthermore, the images have the same perspective relative to the object and may be collected simultaneously. This simultaneous collection of multiple phase images allows very high speed 3D data generation. Previous limitations of phase shift technology such as sample motion and vibration can be eliminated. The method may use continuous or strobed illumination.

System For Optically Measuring The Surface Contour Of A Part Using More Fringe Techniques
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US Patent:

56360258, Jun 3, 1997
Filed:

Jun 17, 1994
Appl. No.:

8/262130
Inventors:

Leonard H. Bieman - Farmington Hills MI
Mark A. Michniewicz - Milford MI
Assignee:

MEDAR, Inc. - Farmington Hills MI
International Classification:

G01B 1124
G01B 1100
US Classification:

356374
Abstract:

An optical measuring system comprises an illumination arrangement including a light source, grating, and lens, and an image acquisition arrangement, including a lens, grating, and camera. A mechanical translation device moves the grating in a plane parallel to a reference surface to effect a phase shift of a projected image of the grating on the contoured surface to be measured. A second mechanical translation device moves the lens to effect a change in the contour interval. A first phase of the points on the contoured surface is taken, via a four-bucket algorithm, at a first contour interval. A second phase of the points is taken at a second contour interval. A controller, including a computer, determines a coarse measurement using the difference between the first and second phases. The controller further determines a fine measurement using either the first or second phase. The displacement or distance, relative to the reference plane, of each point is determined, via the controller, using the fine and coarse measurements.