Michael B Angelo

US Patent:

6492981, Dec 10, 2002

Filed:

Nov 21, 2000

Appl. No.:

09/721045

Inventors:

David G. Stork - Portola Valley CA
Michael Angelo - Redwood City CA
Gregory J. Wolff - Mountain View CA

Assignee:

Ricoh Company, Ltd. - Tokyo

International Classification:

G09G 500

US Classification:

345179, 178 1901, 702150

Abstract:

One embodiment of the writing instrument described herein comprises a pen-like device containing three accelerometers and three gyroscopes. Data from these sensors are processed via an Euler transform. Prior to using the writing instrument, the user holds the writing instrument in multiple predefined positions and sensor readings are taken. The sensor readings are mapped to the corresponding predefined positions. In addition, the sensor readings are compared to expected sensor readings to compensate for environmental variations such as altitude or temperature as well as for the possible tilt of a writing surface. The sensor readings are interpolated to map sensor readings other than those at the predefined positions to other writing instrument positions. When the user writes with the writing instrument, sensor outputs are used to track the writing instrument to define strokes made by the user. The data describing the strokes may be stored or processed to accomplish a variety of tasks including faxing a message, recording information, etc.

US Patent:

6181329, Jan 30, 2001

Filed:

Dec 23, 1997

Appl. No.:

8/999010

Inventors:

David G. Stork - Portola Valley CA
Michael Angelo - San Jose CA
Gregory J. Wolff - Mountain View CA

Assignee:

Ricoh Company, Ltd. - Tokyo

International Classification:

G09G 500
G06K 1118

US Classification:

345179

Abstract:

One embodiment of the writing instrument described herein comprises a pen-like device containing three accelerometers and three gyroscopes. Data from these sensors are processed via an Euler transform. Prior to using the writing instrument, the user holds the writing instrument in multiple predefined positions and sensor readings are taken. The sensor readings are mapped to the corresponding predefined positions. In addition, the sensor readings are compared to expected sensor readings to compensate for environmental variations such as altitude or temperature as well as for the possible tilt of a writing surface. The sensor readings are interpolated to map sensor readings other than those at the predefined positions to other writing instrument positions. When the user writes with the writing instrument, sensor outputs are used to track the writing instrument to define strokes made by the user. The data describing the strokes may be stored or processed to accomplish a variety of tasks including faxing a message, recording information, etc.

US Patent:

62019031, Mar 13, 2001

Filed:

Sep 30, 1997

Appl. No.:

8/940832

Inventors:

Gregory J. Wolff - Mountain View CA
David G. Stork - Portola Valley CA
Michael Angelo - Redwood City CA

Assignee:

Ricoh Company, Ltd. - Tokyo
Ricoh Corporation - Menlo Park CA

International Classification:

G06K 920
G06K 922

US Classification:

382317

Abstract:

A method and apparatus for sending a facsimile of a message is disclosed. The present invention provides for recording pen strokes that set forth a message and sending the recorded pen strokes as part of a facsimile.

US Patent:

62122967, Apr 3, 2001

Filed:

Dec 23, 1997

Appl. No.:

8/996537

Inventors:

David G. Stork - Portola Valley CA
Michael Angelo - Redwood City CA
Gregory J. Wolff - Mountain View CA

Assignee:

Ricoh Company, Ltd. - Tokyo

International Classification:

G06K 900
G09G 500

US Classification:

382188

Abstract:

A method and apparatus to precisely track the position of the writing instrument, specifically the writing end, such as the tip, of a pen. One embodiment of the invention described herein includes a writing instrument containing acceleration sensors and angular velocity sensors. Data from these sensors are processed via an Euler transform to determine the strokes made with the writing instrument. Corrections may be made to improve upon the output of the Euler transform. The data describing the strokes may include graphical representations of the strokes actually made with the writing instrument. Data describing the strokes may be stored or processed to accomplish a variety of tasks such as recording information, faxing a message, recording an appointment, or other such tasks.

US Patent:

20220181137, Jun 9, 2022

Filed:

Jul 2, 2021

Appl. No.:

17/366280

Inventors:

- Menlo Park CA, US
Sean Bendall - San Mateo CA, US
Michael Angelo - Menlo Park CA, US
Stephen Thompson - Gringley on the Hill, GB
Harris Fienberg - Redwood City CA, US

International Classification:

H01J 49/40
H01J 49/02
H01J 49/00
G01N 33/68
H01J 49/14

Abstract:

The disclosure features methods and systems that include directing an ion beam to a region of a sample to liberate charged particles from the region of the sample, where the directed ion beam is pulsed at a first repetition rate, deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam, and detecting the first subset of the liberated charged particles in a time-of-flight (TOF) mass spectrometer to determine information about the sample, where the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam.

US Patent:

20210407781, Dec 30, 2021

Filed:

Feb 8, 2021

Appl. No.:

17/170012

Inventors:

- Menlo Park CA, US
David Stumbo - Pleasanton CA, US
Michael Angelo - Menlo Park CA, US
Rachel Finck - Menlo Park CA, US

International Classification:

H01J 49/00
G01N 33/68
H01J 49/06
G01N 33/58

Abstract:

The disclosure features systems and methods that include: exposing a biological sample to an ion beam that is incident on the sample at a first angle to a plane of the sample by translating a position of the ion beam on the sample in a first direction relative to a projection of a direction of incidence of the ion beam on the sample; after each translation of the ion beam in the first direction, adjusting a focal length of an ion source that generates the ion beam; and measuring and analyzing secondary ions generated from the sample by the ion beam after adjustment of the focal length to determine mass spectral information for the sample, where the sample is labeled with one or more mass tags and the mass spectral information includes populations of the mass tags at locations of the sample.

US Patent:

20190267227, Aug 29, 2019

Filed:

Feb 28, 2019

Appl. No.:

16/288575

Inventors:

- Menlo Park CA, US
Sean Bendall - San Mateo CA, US
Michael Angelo - Menlo Park CA, US
Stephen Thompson - Gringley on the Hill, GB
Harris Fienberg - Redwood City CA, US

International Classification:

H01J 49/40
H01J 49/00
H01J 49/02

Abstract:

The disclosure features methods and systems that include directing an ion beam to a region of a sample to liberate charged particles from the region of the sample, where the directed ion beam is pulsed at a first repetition rate, deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam, and detecting the first subset of the liberated charged particles in a time-of-flight (TOF) mass spectrometer to determine information about the sample, where the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam.

US Patent:

20190228958, Jul 25, 2019

Filed:

Jan 25, 2019

Appl. No.:

16/257135

Inventors:

- Menlo Park CA, US
David Stumbo - Pleasanton CA, US
Michael Angelo - Menlo Park CA, US
Rachel Finck - Menlo Park CA, US

International Classification:

H01J 49/00
G01N 33/68
G01N 33/58
H01J 49/06

Abstract:

The disclosure features systems and methods that include: exposing a biological sample to an ion beam that is incident on the sample at a first angle to a plane of the sample by translating a position of the ion beam on the sample in a first direction relative to a projection of a direction of incidence of the ion beam on the sample; after each translation of the ion beam in the first direction, adjusting a focal length of an ion source that generates the ion beam; and measuring and analyzing secondary ions generated from the sample by the ion beam after adjustment of the focal length to determine mass spectral information for the sample, where the sample is labeled with one or more mass tags and the mass spectral information includes populations of the mass tags at locations of the sample.