Michael J Field

US Patent:

6410487, Jun 25, 2002

Filed:

Jul 20, 2000

Appl. No.:

09/619934

Inventors:

Dean J. Miller - Darien IL
Michael B. Field - Jersey City NJ

Assignee:

The University of Chicago - Chicago IL

International Classification:

H01B 1202

US Classification:

505239, 505471, 505450

Abstract:

A bulk superconductor having a thickness of not less than about 100 microns is carried by a polycrystalline textured substrate having misorientation angles at the surface thereof not greater than about 15Â; the bulk superconductor may have a thickness of not less than about 100 microns and a surface area of not less than about 50 cm. The textured substrate may have a thickness not less than about 10 microns and misorientation angles at the surface thereof not greater than about 15Â. Also disclosed is a process of manufacturing the bulk superconductor and the polycrystalline biaxially textured substrate material.

US Patent:

20210327696, Oct 21, 2021

Filed:

Apr 13, 2021

Appl. No.:

17/229107

Inventors:

- Omaha NE, US
Kyle W. Uhimeyer - Omaha NE, US
Michael P. Field - Papillion NE, US
Jae Seok Lee - Omaha NE, US

International Classification:

H01J 49/00
G01J 3/443
H01J 49/10
G01N 21/27
G01N 33/18

Abstract:

Systems and methods are described for calibrating an analytical instrument analyzing a plurality of sample matrices in series. A system embodiment can include, but is not limited to, a sample analysis device configured to receive a plurality of samples from a plurality of remote sampling systems and to determine an intensity of one or more species of interest contained in each of the plurality of samples; and a controller configured to generate a primary calibration curve based on analysis of a first standard solution having a first sample matrix by the sample analysis device and generate at least one secondary calibration curve based on analysis of a second standard solution having a second sample matrix by the sample analysis device, the controller configured to associate the at least one secondary calibration curve with the primary calibration curve according to a matrix correction factor.

US Patent:

20190214242, Jul 11, 2019

Filed:

Jan 6, 2019

Appl. No.:

16/240766

Inventors:

- Omaha NE, US
Michael R. Field - Papillion NE, US
Daniel R. Wiederin - Omaha NE, US
Tyler Yost - Omaha NE, US

International Classification:

H01J 49/04
H01J 49/10
H01J 49/36

Abstract:

Systems and methods for automatic sampling, digestion, and joining a plurality of sample introduction systems of a sample for subsequent analysis by ICP-MS are described. A system embodiment may include: a digestion vessel configured to receive a sample from a pressurized sample source; a shutoff valve configured to control a flow of the sample to the digestion vessel; a first syringe pump configured to introduce a reagent to the sample in the digestion vessel; a thermally-controlled block surrounding the digestion vessel and configured to control the temperature of the digestion vessel, wherein the thermally-controlled block increases the temperature of the digestion vessel to a first set temperature before digestion and wherein the thermally-controlled block decreases the temperature of the digestion vessel to a second set temperature after digestion; a level sensor configured to measure a level of the sample within the digestion vessel; a second syringe pump configured to introduce deionized water to the digestion vessel after digestion, based at least in part on the level measured by the level sensor; and a connector valve configured to receive digested sample from the digestion vessel and transfer the digested sample to an analysis system.

US Patent:

20190206663, Jul 4, 2019

Filed:

Dec 28, 2018

Appl. No.:

16/234935

Inventors:

- Omaha NE, US
Kyle W. Uhlmeyer - Omaha NE, US
Michael P. Field - Papillion NE, US
Jae Seok Lee - Omaha NE, US

International Classification:

H01J 49/00
G01J 3/443
H01J 49/10

Abstract:

Systems and methods are described for calibrating an analytical instrument analyzing a plurality of sample matrices in series. A system embodiment can include, but is not limited to, a sample analysis device configured to receive a plurality of samples from a plurality of remote sampling systems and to determine an intensity of one or more species of interest contained in each of the plurality of samples; and a controller configured to generate a primary calibration curve based on analysis of a first standard solution having a first sample matrix by the sample analysis device and generate at least one secondary calibration curve based on analysis of a second standard solution having a second sample matrix by the sample analysis device, the controller configured to associate the at least one secondary calibration curve with the primary calibration curve according to a matrix correction factor.

US Patent:

20190072464, Mar 7, 2019

Filed:

Aug 31, 2018

Appl. No.:

16/119253

Inventors:

- Omaha NE, US
Austin Schultz - Omaha NE, US
Michael Paul Field - Papillion NE, US
Nathan Saetveit - Omaha NE, US

International Classification:

G01N 1/40
H01J 49/10
B01D 15/36
B01D 15/18
B01D 15/22
B01D 15/38

Abstract:

Systems and methods are described to concentrate a remote sample for analysis. A sample concentration system embodiment includes, but is not limited to, a plurality of valves including at least a first valve, a second valve, and a third valve; a plurality of columns including at least a first column and a second column, the first column fluidically coupled to the first valve, the second column fluidically coupled to the second valve; and a flow meter coupled with the third valve, the flow meter fluidically coupled with each of the first column and the second column when the plurality of valves is in a first flow path configuration to measure an amount of the liquid sample passed through the first column and the second column, wherein the plurality of valves includes a second flow path configuration and a third flow path configuration.