Michael D Fields

US Patent:

6608478, Aug 19, 2003

Filed:

Dec 7, 2001

Appl. No.:

10/011190

Inventors:

Michael Leonard Dziech - Cincinnati OH
Joseph Anthony Traxler - Hamilton OH
Michael Wayne Fields - Loveland OH

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01N 2790

US Classification:

324262, 324219, 324238, 738665

Abstract:

A rotor disk is inspected using an inspection apparatus including an inspection fixture which has a base, and at least one guide extending from the base. Each guide is slidably engagable to one of the rotor slots of the rotor disk and has a guide side shaped to slidably conform to the rotor slot side, and a guide bottom having a guide bottom surface which, in combination with a slot bottom surface, defines an elongated inspection cavity extending parallel to the axis of revolution of the rotor disk. The inspection fixture is mated to the rotor disk such that each guide slides into one of the rotor slots. A sensor apparatus includes a sensor, such as an eddy current sensor, sized to slide into the inspection cavity with a close facing relation thereto, and a sensor drive that moves the sensor parallel to a direction of elongation of the inspection cavity. Inspection is performed by inserting the sensor into the inspection cavity, and sensing the rotor slot bottom using the sensor.

US Patent:

6972561, Dec 6, 2005

Filed:

Feb 28, 2003

Appl. No.:

10/376517

Inventors:

Michael Wayne Fields - Loveland OH, US
Michael Leonard Dziech - Cincinnati OH, US
Jon Russel Dierdorf - Okeana OH, US
Anthony William Mellors - West Chester OH, US
James Michael Johnson - Kennewick WA, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01N027/72

US Classification:

324219, 324228, 324261

Abstract:

An eddy current inspection apparatus includes a holder for a specimen, a holder for an eddy current probe, and an eddy current instrument operatively joined thereto. The probe holder includes carriages for translating the probe along first and second axes. The probe holder is selectively moved to align the probe with an internal channel of the specimen for sliding movement therealong to conduct eddy current inspection thereof.

US Patent:

20060242756, Nov 2, 2006

Filed:

Apr 27, 2006

Appl. No.:

11/411960

Inventors:

Michael Fields - Amelia OH, US

International Classification:

E03D 11/02
E03D 11/18

US Classification:

004427000

Abstract:

A toilet overflow check system having a toilet bowl rim engagement member, a pivot adjustment upright member extending downward from the rim engagement member, an elongate pivot member having a proximate end portion and a distal end portion, a pivot member float mounted on the distal end portion of the elongate pivot member, and having a centrally located pivot point, and a pivot axle supported by the pivot adjustment upright member. The pivot axle pivotally supports the elongate pivot member at the pivot point, and there is a connecting cord secured to the proximate end portion of the elongate pivot member, the connecting cord being connected to the flap member of a flap valve of the toilet. In operation, upon the float rising upward with water approaching an overflow condition, the elongate pivot pulls the connecting cord, closing the toilet flap valve.