Michael A Fields

US Patent:

20080278151, Nov 13, 2008

Filed:

May 7, 2007

Appl. No.:

11/745122

Inventors:

Changting Wang - Niskayuna NY, US
Shridhar Champaknath Nath - Niskayuna NY, US
Weston Blaine Griffin - Niskayuna NY, US
Michael Wayne Fields - Loveland OH, US
Darren Lee Hallman - Clifton Park NY, US
Abdul Rahman Abdallah Al-Khalidy - Cohoes NY, US

Assignee:

GENERAL ELECTRIC COMPANY - Schenectady NY

International Classification:

G01N 27/90
G01R 33/14

US Classification:

324219, 702189

Abstract:

A method for inspecting an internal cavity in a part is provided. The method includes inserting a probe into the internal cavity. The method also includes controlling movement of the probe using a defined scan path to scan the probe over a region of interest in the internal cavity. The method also includes applying multiple multifrequency excitation signals to the probe to generate a number of multifrequency response signals. The multifrequency excitation signals are applied at multiple positions within the internal cavity. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect the internal cavity.