Michael H Hamblin

US Patent:

20080260650, Oct 23, 2008

Filed:

Oct 27, 2005

Appl. No.:

11/666573

Inventors:

Ahmed Tawakol - Wayland MA, US
Michael R. Hamblin - Revere MA, US
Raymond Q. Migrino - Wauwatosa WI, US
Jeffrey Gelfand - Cambridge MA, US

Assignee:

THE GENERAL HOSPITAL Corporation - Boston MA

International Classification:

A61K 49/06
A61K 38/04
A61P 29/00

US Classification:

424 937, 424 91, 514 12

Abstract:

The present invention relates to methods for the detection and therapy of inflamed tissue, whereby immune modulators are used to increase the uptake of diagnostic or therapeutic compositions by inflammatory cells.

US Patent:

57368627, Apr 7, 1998

Filed:

Jun 22, 1995

Appl. No.:

8/493399

Inventors:

Michael W. Hamblin - Stow MA

Assignee:

Genrad, Inc. - Westford MA

International Classification:

G01R 3104

US Classification:

324527

Abstract:

A system for detecting open circuits in connections between pins of an integrated circuit (IC) and traces on a circuit board on which the IC is mounted makes use of a-c paths inherent in the IC. An input signal is applied to a trace to which a pin of the IC is nominally connected. An internal a-c path in the IC carries the signal to another pin. Failure to detect an output signal derived from the input signal, above predetermined thresholds, at the trace to which the latter pin is nominally connected indicates failure of a pin-to-trace connection.

US Patent:

54147158, May 9, 1995

Filed:

Feb 5, 1993

Appl. No.:

8/014154

Inventors:

Michael W. Hamblin - Stow MA
Gordon D. Robinson - Acton MA

Assignee:

GenRad, Inc. - Concord MA

International Classification:

G06F 1100

US Classification:

371 23

Abstract:

When an automatic circuit tester (10) detects that a fault has occurred in a circuit board (14), it applies to the circuit board (14) a sequence of vectors that differs from the test sequence (T. sub. n, T. sub. n+1) by which the fault detection occurs only in that each vector's component that corresponds to an input pin in question on the board device under test maintains a level that simulates an open circuit at that input pin. If the resultant response differs from the response to the original test sequence, the input pin can often be ruled out as one at which a fault has occurred. In this way, many open-circuit faults at input pins can be diagnosed without special probing, even when several such faults occur simultaneously.