Michael S Heutmaker

US Patent:

6434204, Aug 13, 2002

Filed:

Mar 4, 1999

Appl. No.:

09/262260

Inventors:

Israel Amir - Princeton NJ
Michael S. Heutmaker - Trenton NJ
John Rolland Welch - Mt. Laurel NJ

Assignee:

Lucent Technologies Inc. - Murray Hill NJ

International Classification:

H03D 104

US Classification:

375346, 375226

Abstract:

The DC offset error of a quadrature modulated RF signal is corrected by introducing a specific trial offset correction value, D, into the DC offset correction circuits 3, 4 or 5 times, by measuring the carrier power resulting from each trial introduction, and by using the information to determine the DC offset correction components, I and Q. According to an ideal case first embodiment, specific offset D is employed in three different measurement combinations to determine the correction factors I and Q. According to an alternative embodiment, a fourth offset correction measurement, needed to estimate a single offset control scale factor, is used to account for an unknown power scale factor A. According to a second alternative embodiment, five offset correction measurements are used to account for separate offset control scale factors for the I and Q channels.

US Patent:

6512800, Jan 28, 2003

Filed:

Mar 12, 1999

Appl. No.:

09/267280

Inventors:

Israel Amir - Princeton NJ
Michael S. Heutmaker - Trenton NJ
John Rolland Welch - Mt. Laurel NJ

Assignee:

Lucent Technologies Inc. - Murray Hill NJ

International Classification:

H04K 102

US Classification:

375296, 375298, 375235, 332103

Abstract:

A method for correcting the phase and amplitude imbalance of a quadrature modulated RF signal requires that errors be induced in both amplitude, , and in phase in at least three different combinations in order to determine the appropriate correction value for amplitude and phase offsets and. According to a first embodiment the same and offsets applied in three different combinations to determine the necessary and corrections. According to a second embodiment, a fourth measurement is made in order to determine an unknown control scale factor for balance adjustments.

US Patent:

8280314, Oct 2, 2012

Filed:

Jun 30, 2009

Appl. No.:

12/494862

Inventors:

Michael Steven Heutmaker - Ewing NJ, US
Walter Honcharenko - Monmouth Junction NJ, US

Assignee:

Alcatel Lucent - Paris

International Classification:

H04L 27/00
H04L 27/04

US Classification:

455 73, 455 62, 455 631, 455 75, 455 78, 455 84, 4555501, 4551141, 4551142, 4551151, 4551152, 455119, 455120, 455126, 455130, 4552261, 455227, 455230, 4552781, 455283, 455284, 455296, 455304, 455305, 455310, 455311, 455312, 455317

Abstract:

A method for compensating a transceiver for impairments includes transmitting a plurality of partial bandwidth training signals using a transmitter. A plurality of response signals of a receiver having a bandwidth and exhibiting receiver impairments is captured. Each response signal is associated with one of the partial bandwidth training signals. Each of the partial bandwidth training signals is associated with a portion of the receiver bandwidth. A plurality of partial compensation filters is generated based on the plurality of response signals. Each partial compensation filter is associated with one of the response signals. The partial compensation filters are combined to configure a receiver compensation filter operable to compensate for the receiver impairments.

US Patent:

55811906, Dec 3, 1996

Filed:

Apr 29, 1995

Appl. No.:

8/434875

Inventors:

Chauncey Herring - Trenton NJ
Michael S. Heutmaker - Trenton NJ
Eleanor Wu - Princeton NJ

Assignee:

Lucent Technologies Inc. - Murray Hill NJ

International Classification:

G01R 2700

US Classification:

324605

Abstract:

An RF device (12), such as an amplifier, is tested by applying a digitally-modulated RF stimulus signal, having a known magnitude and phase angle, to the device to cause it to generate a response signal. The response signal of the device is down-converted and digitized prior to establishing its magnitude and phase angle. The magnitude and phase angle of the digitized, down-converted response signal are compared to the magnitude and phase angle, respectively, of the digitally-modulated stimulus signal to yield transfer functions indicative of the operation of the device.

US Patent:

54811864, Jan 2, 1996

Filed:

Oct 3, 1994

Appl. No.:

8/317070

Inventors:

Michael S. Heutmaker - Trenton NJ
Madhuri Jarwala - Lawrenceville NJ
Duy K. Le - Levittown PA

Assignee:

AT&T Corp. - Murray Hill NJ

International Classification:

G01R 3500

US Classification:

3241581

Abstract:

A method is provided for accomplishing unified testing of a digital/RF system (10'), comprised of a digital controller (14), a base-band processor (20), an RF transmitter (24) and an RF receiver (34). The digital portion of the digital/RF system (10'), including the digital controller (14) and the base-band processor (20), is tested by a digital test technique such as Boundary-Scan testing. Test patterns for the RF elements are down-loaded from the digital controller (14) to the base-band processor via a Boundary-Scan Test Access Port (TAP). Thereafter, the RF transmitter (24) and the RF receiver (34) are tested by applying the test patterns from the base-band processor to the RF transmitter for transmission thereby. The signal produced by the RF transmitter (24) in response to the applied test pattern is converted to a first digital signal stream for processing by the base-band processor (20) to determine the operability of the transmitter. The signal produced by the RF transmitter (24) is also received by the RF receiver (34) for demodulation thereby.

US Patent:

51266610, Jun 30, 1992

Filed:

Oct 18, 1990

Appl. No.:

7/599579

Inventors:

George T. Harvey - Princeton NJ
Michael S. Heutmaker - Trenton NJ

Assignee:

AT&T Bell Laboratories - Murray Hill NJ

International Classification:

G01R 2300
G01R 2316

US Classification:

324158R

Abstract:

An integrated circuit (11) is tested at a high microwave frequency through the use of a laser beam (19) having a repetition rate much lower than the test frequency. Electric fields of the test signal extend into an electro-optic material (12) that modulates part of the laser beam. Another part of the laser beam is converted to an electrical pulsed signal that is applied to a microwave mixer (33) along with part of the test frequency signal. A harmonic of the pulsed signal mixes with the test frequency to yield a difference frequency that can be used as a phase reference for analyzing the phase of the test signal. The component pulses (30) of the laser beam have a pulse width which is much shorter than the separation of the pulses, which make it inherently rich in higher harmonics of the fundamental pulse repetition rate.

US Patent:

51266601, Jun 30, 1992

Filed:

Jan 2, 1991

Appl. No.:

7/636782

Inventors:

George T. Harvey - Princeton NJ
Michael S. Heutmaker - Trenton NJ
Mark G. Kuzyk - Pullman WA
Kenneth D. Singer - Pepper Pike OH

Assignee:

AT&T Bell Laboratories - Murray Hill NJ

International Classification:

G01R 3128
G02F 101

US Classification:

324158R

Abstract:

An integrated circuit device (11) is tested by directing a laser beam (19) onto an electrochromic member (17) in close proximity to a conductor (13) of the integrated circuit. Reflected laser light is directed to a detector (21) which converts it to an electrical signal for display by a lock-in amplifier (25). The display characterizes the voltage on the conductor (17) and thereby permits diagnosis of the operation of the integrated circuit (11).

US Patent:

50420402, Aug 20, 1991

Filed:

Mar 30, 1990

Appl. No.:

7/502096

Inventors:

George T. Harvey - Princeton NJ
Michael S. Heutmaker - Trenton NJ
Martin C. Nuss - Fair Haven NJ
Peter R. Smith - Westfield NJ

Assignee:

AT&T Bell Laboratories - Murray Hill NJ

International Classification:

H01S 3098

US Classification:

372 18

Abstract:

Amplitude noise is dramatically reduced in an optically pumped modelocked laser arrangement by incorporating an intra-cavity or external cavity mode selection element with a continuous-wave pump laser coupled optically to a modelocked laser. The mode selection element causes a light beam generated from the pump laser to operate nominally at a single frequency, that is, substantially a single longitudinal mode. Mode selection may be realized with an air-spaced or solid material Fabry-Perot etalon.