Michael D Kress

US Patent:

20190283445, Sep 19, 2019

Filed:

Jun 3, 2019

Appl. No.:

16/429778

Inventors:

- Cuyahoga Falls OH, US
Michael Leo Kress - Uniontown OH, US
Amir Novini - Akron OH, US

International Classification:

B41J 2/21
G06T 7/00
G06T 7/90
H04N 5/225

Abstract:

Described herein are various technologies pertaining to an automated light field illumination container inspection and manufacture system. The system includes a plurality of cameras that capture images of a container when the container is illuminated by way of light field illumination. Bands in images that include reflections in the exterior surface of the sidewall are identified, and a determination is made as to whether the container is defective based upon the identified bands.

US Patent:

20180156740, Jun 7, 2018

Filed:

Dec 7, 2016

Appl. No.:

15/372047

Inventors:

- Cuyahoga Falls OH, US
Michael Leo Kress - Uniontown OH, US
Kris Brumbaugh - Marshallville OH, US
Kellen Reusser - Wooster OH, US

International Classification:

G01N 21/958
G01N 21/90

Abstract:

Described herein are various technologies related to inspecting transparent containers for both opaque and transparent defects. An emitter is configured to direct a color gradient through a sidewall of a transparent container, such that color of light that passes through the sidewall varies across the sidewall. A camera is configured to capture an image of the sidewall of the transparent container while the color gradient passes through the sidewall of the container. A computing system receives the image and determines whether the sidewall of the container includes either an opaque or a transparent defect based upon the image.

US Patent:

20160033332, Feb 4, 2016

Filed:

Aug 4, 2014

Appl. No.:

14/450627

Inventors:

- Cuyahoga Falls OH, US
MICHAEL L. KRESS - UNIONTOWN OH, US
BRIAN M. ENSINGER - KENT OH, US

Assignee:

APPLIED VISION CORPORATION - CUYAHOGA FALLS OH

International Classification:

G01J 3/50
G01J 3/10
G01J 3/02

Abstract:

Systems and methods for extracting topographic information from inspected objects to identify defects in the inspected objects. A part to be inspected is illuminated with at least two different colors emitted from an illuminator providing a gradient of light consisting of the at least two different colors. A single color image of the illuminated part to be inspected is acquired, providing a color-coded topographic mapping of the part to be inspected due, at least in part, to the gradient of light. Topographic monochrome views of the part to be inspected may be generated from the single color image. Each view of the topographic monochrome views may enhance a different type of feature or defect present in the part to be inspected which can be analyzed and detected.