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2002 to 2000 Principal Environmental ScientistETIC Engineering Pleasant Hill, CA 2012 to 2013 Senior Project ManagerAlternate
2011 to 2011 Board MemberIndia Basin Neighborhood Association
2011 to 2011 Technical AdvisorMaristics, Berkeley San Francisco, CA 2007 to 2011 Senior ScientistMaristics, Berkeley
2009 to 2010 Member of SFPUC Digester Task ForceRestoration Advisory Board
2007 to 2009 Hunters Point Shipyard, memberNASA Mountain View, CA 2001 to 2003 EcologistSan Francisco State University San Francisco, CA 1994 to 2002 Adjunct Professor and Senior Research Scientist
Education:
Cooperative Institute for Marine and Atmospheric Studies, NOAA/Univ. of Miami Miami, FL 1986 to 1997 Post Doctoral Associate in Oceanography, marine biology, fisheriesUniversity of Miami Rosenstiel School of Marine Ph.D. in Biological OceanographySan Francisco State University M.A. in Marine BiologySan Francisco State University B.A. in Biology
Lally & Associates Phoenix, AZ Aug 2008 to Apr 2013 SalesPiccolo International University Scottsdale, AZ Aug 2005 to Jul 2008 Enrollment ManagerPiccolo International University
May 2006 to Jul 2006 Recognized as "Top Sales RepresentativeUniversal Technical Institute
Feb 2003 to Aug 2005 Enrollment RepresentativeTop Enrollment Representative Jan 2003 to Jun 2004High Tech Institute Phoenix, AZ Aug 2001 to Jan 2003 Assistant Director of AdmissionsArizona Automotive Institute Phoenix, AZ Apr 1998 to Jul 2001 Enrollment Representative
Education:
University of Northern Iowa Dec 1990 Bachelor of Arts in Business-Public Relations
Sioux Falls Foot Surgeons 1320 S Minnesota Ave STE 102, Sioux Falls, SD 57105 (605)3322661 (phone), (605)3327458 (fax)
Procedures:
Hallux Valgus Repair Arthrocentesis
Conditions:
Hallux Valgus Plantar Fascitis Tinea Pedis
Languages:
English
Description:
Dr. McGowan works in Sioux Falls, SD and specializes in Podiatric Medicine. Dr. McGowan is affiliated with Avera Mckennan Hospital & University Health Center and Sioux Falls Specialty Hospital.
Wenchang Ji - Doylestown PA Arthur I. Shirley - Piscataway NJ Michael Joseph McGowan - Valley Cottage NY Daniel Arthur Morgan - Westfield NJ
Assignee:
The BOC Group, Inc. - Murray Hill NJ
International Classification:
B01D 4624
US Classification:
95 12, 95 45, 95 96, 95279, 95283, 427345, 427377
Abstract:
The present invention provides an improved cold gas-dynamic spraying process utilizing a carrier gas and small-diameter particulates whereby the particulate-laden carrier gas is directed to a ceramic filter unit where the particulates are separated out and the particulate-free carrier gas is analyzed and returned to the spraying process or to other gas purification systems.
System And Apparatus For Reducing Offset Voltages In Folding Amplifiers
A system and apparatus for reducing offset voltages in folding amplifiers is disclosed. In one form, a folding amplifier for use in an analog-to-digital converter is provided. The folding amplifier includes a first current source operable to be coupled to a first differential pair and a second differential pair. The folding amplifier further includes a switching network coupled between the first current source and the first and second differential pairs and operable to enable coupling the first current source to at least one of the first differential pair and the second differential pair.
System And Apparatus For Reducing The Effects Of Circuit Mismatch In Analog-To-Digital Converters
A system and apparatus for reducing the effects of circuit mismatch in analog-to-digital converters is disclosed. In one form, an analog-to-digital converter (ADC) includes a switching network operable to couple an analog input received by a sample and hold module to a folding amplifier operable to process the analog input. The ADC further includes an averaging resistive network coupled to the folding amplifier and operable to provide an output representative of a portion of the analog input received by the folding amplifier to produce a digital representation of the analog input.
James F. McClellan - Gilbert AZ, US Patrick G. Drennan - Gilbert AZ, US Douglas A. Garrity - Gilbert AZ, US David R. LoCascio - Chandler AZ, US Michael J. McGowan - Mesa AZ, US
Assignee:
Freescale Semiconductor, Inc. - Austin TX
International Classification:
G06F 17/50 G06F 19/00
US Classification:
716 10, 716 5, 700 97, 700121
Abstract:
The present invention provides a method for tiling an integrated circuit having a critically matched device such as a transistor. The method obtains an advantage of automatically improving metallic density over critically matched devices thus yielding improved CMP. The method may include the steps of: identifying critically matched devices in the integrated circuit; placing metal tiles over the critically matched device; performing a density test around each critically matched device; and if a density test is not satisfied around a critically matched device, placing at least one metal strip over a critically matched device.
Method Of Tiling Analog Circuits That Include Resistors And Capacitors
James F. McClellan - Gilbert AZ, US Patrick G. Drennan - Gilbert AZ, US Douglas A. Garrity - Gilbert AZ, US David R. LoCascio - Chandler AZ, US Michael J. McGowan - Mesa AZ, US
Assignee:
Freescale Semiconductor, Inc. - Austin TX
International Classification:
G06F 9/45 G06F 17/50
US Classification:
716 10, 716 9, 716 11
Abstract:
A method for placing tiles in an integrated circuit has matched devices that includes the steps of (1) calculating a metal spacing for tiles to be placed adjacent to the matched device in the integrated circuit; (2) calculating a lateral spacing for tiles to be placed adjacent to the matched device in the integrated circuit; (3) placing tiles about the matched device based on the metal spacing and the lateral spacing; (4) performing a density test in an area around the matched device; and (5) if a density test is not satisfied in the area around the matched device, dividing the matched device into at least two subdevices and repeating, with respect to each subdevice, the steps of calculating a metal spacing, calculating a lateral spacing, and placing tiles about each subdevice. The method is further adaptable to various kinds of matched devices including poly resistors, diffused resistors, double-poly capacitors, metal-insulator-metal capacitors, and fringe capacitors.
Yevgeniy Vinshtok - Allentown PA, US Michael J. Mcgowan - Downingtown PA, US Peter Breh - West Chester PA, US
Assignee:
IFM Electronic GmbH - Tettnang
International Classification:
G01D 11/24 G01L 19/14
US Classification:
73431
Abstract:
A sensor has a corpus comprising an insert opening through which a sensor element can be inserted in the corpus, and a cable opening for passing through a supply and/or signal line of the sensor element and a cover closing the insert opening. The cover comprises an interlock opening aligned with the cable opening. The supply and/or signal line comprises a bushing element which penetrates the cable opening of the corpus and the interlock opening of the cover.
Compensated Current Cell To Scale Switching Glitches In Digital To Analog Convertors
Compensated current cell to scale switching glitches in digital to analog convertors. A compensated current cell is disclosed that includes first and second switching transistors configured to switch an input current between first and second outputs based on first and second input signals, respectively, a first compensation transistor connected to the first input signal to provide a first compensation current that is connected to the second output, and a second compensation transistor connected to the second input signal to provide a second compensation current that is connected to the first output, the first and second compensation transistors having source terminals that are connected together. In another aspect, switching glitches are scaled based on a size difference between the switching transistors and the compensation transistors.
Yevgeniy Vinshtok - Allentown PA, US Michael J. McGowan - Downingtown PA, US Peter Breh - West Chester PA, US Ralf Siegler - Schlier, DE Michael Becker - Tettnang, DE
International Classification:
G01D 11/24
US Classification:
73431
Abstract:
A sensor has a corpus () comprising an insert opening () through which a sensor element () can be inserted in the corpus (), and a cable opening for passing through a supply and/or signal line () of the sensor element (), and a cover () closing the insert opening (), The cover () comprises an interlock opening () aligned with the cable opening. The supply and/or signal line () comprises a bushing element () which penetrates the cable opening of the corpus () and the interlock opening () of the cover ().
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Googleplus
Michael Mcgowan
Work:
Edison State College - Professor of Philosophy (2013) Burlington Community College - Lecturer in Philosophy (2010) Valley College - Lecturer in Philosophy and Religion (2009-2012) Gloucester Community College - Lecturer in Philosophy and Religion (2010-2011)
Education:
Claremont Graduate University - Philosophy of Religion, Theology, Yale University - Philosophy of Religion, Malone College - Religion, Taylor University - Ultimate Frisbee, Pranks
Rosewood Elementary School Columbia SC 1976-1979, South Kilbourne Elementary School Columbia SC 1979-1981, Hand Middle School Columbia SC 1981-1983, Camden Military Academy Camden SC 1983-1985, Opportunity School Columbia SC 1987-1988