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Michael J Passow

age ~76

from Englewood, NJ

Also known as:
  • Michael Nancy Passow
  • Mike J Passow
  • Nancy Passow
Phone and address:
296 Central Ave, Englewood, NJ 07631
(201)8710846

Michael Passow Phones & Addresses

  • 296 Central Ave, Englewood Cliffs, NJ 07631 • (201)8710846
  • Englewood, NJ
  • 296 Central Ave, Englewood, NJ 07631 • (201)8597367

Work

  • Position:
    Executive, Administrative, and Managerial Occupations

Education

  • Degree:
    Associate degree or higher
Name / Title
Company / Classification
Phones & Addresses
Michael Passow
President
Science Teachers Assoc of New York State
Labor Organization
491 Oakdale Rd, Hempstead, NY 11554
PO Box 2121, Liverpool, NY 13089
(516)7835432

Resumes

Michael Passow Photo 1

Senior Tech. Staff Member, Engineering Manager At Ibm

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Position:
Senior Technical Staff Member, Manager at IBM, Senior Engineer, Manager at IBM
Location:
Greater New York City Area
Industry:
Semiconductors
Work:
IBM since Jun 2005
Senior Technical Staff Member, Manager

IBM since Jun 1991
Senior Engineer, Manager
Education:
University of Michigan 1986 - 1991
PhD, Nuclear Engineering
University of Oklahoma 1980 - 1986
BS, MS, Nuclear Engineering
University of California, Los Angeles - The Anderson School of Management
Skills:
Data Analysis
Michael Passow Photo 2

Science Educator And Consultant

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Location:
Englewood, NJ
Industry:
Education Management
Work:
Dwight Morrow High School 2007 - 2014
Science Teacher

Ams Education 1996 - 2013
Local Implementation Team Mentor

While Plains City Schools 1985 - 2007
Science Teacher

Lamont-Doherty Earth Observatory 1985 - 2007
Science Educator and Consultant
Education:
Teachers College, Columbia University 1985 - 1987
Master of Education, Masters, Teaching
Teachers College, Columbia University 1970 - 1974
Doctorates, Doctor of Education, Masters, Master of Arts In Teaching, Earth Science, Teacher Education
Columbia University In the City of New York 1966 - 1970
Bachelors, Bachelor of Arts, Geology
Skills:
Curriculum Development
Teaching
Curriculum Design
Educational Technology
Teacher Training
Higher Education
Educational Leadership
Research
Classroom
Instructional Design
Science
Staff Development
Lesson Planning
Public Speaking
Tutoring
Grant Writing
E Learning
Editing
Community Outreach
Adult Education
Non Profits
Program Evaluation
Lecturing
Science Education
Education Policy
Nonprofits
Spanish
Grants
K 12
Student Affairs
Instructional Technology
Statistics
Elementary Education
Student Development
Volunteer Management
Secondary Education
Fundraising
Academic Advising
Proofreading
Literature
Data Analysis
International Education
Esl
Differentiated Instruction
Program Development
History
Classroom Management
Qualitative Research
Admissions
Leadership Development

Us Patents

  • Fluid Delivery Apparatus And Method Having An Infrared Feedline Sensor

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  • US Patent:
    54927188, Feb 20, 1996
  • Filed:
    Dec 5, 1994
  • Appl. No.:
    8/349230
  • Inventors:
    James A. O'Neill - New City NY
    Michael L. Passow - Pleasant Valley NY
    Tina J. Cotler - Newburgh NY
    Jonathan D. Chapple-Sokol - Poughkeepsie NY
    Richard A. Conti - Mount Kisco NY
    Jyothi Singh - Hopewell Junction NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    B05D 306
    C23C 800
  • US Classification:
    427 8
  • Abstract:
    An apparatus for processing a layer on a workpiece includes a source of reactant fluid, a reaction chamber having a support for the workpiece and a fluid delivery apparatus for feeding an input fluid into the reaction chamber with the input fluid being utilized to process the material. An infrared sensor is adapted to cooperate with the fluid delivery apparatus for sensing the concentration of a component of the input fluid. The infrared sensor includes an infrared light source positioned to direct a beam of infrared light at an infrared light detector through the input fluid. The infrared light detector produces an electrical output signal indicative of the amount of light received by the detector and therefore not absorbed by the input fluid.
  • Fluid Delivery Apparatus Having An Infrared Feedline Sensor

    view source
  • US Patent:
    55340660, Jul 9, 1996
  • Filed:
    Oct 29, 1993
  • Appl. No.:
    8/143228
  • Inventors:
    James A. O'Neill - New City NY
    Michael L. Passow - Pleasant Valley NY
    Tina J. Cotler - Newburgh NY
    Jonathan D. Chapple-Sokol - Poughkeepsie NY
    Richard A. Conti - Mount Kisco NY
    Jyothi Singh - Hopewell Junction NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    B05C 500
  • US Classification:
    118663
  • Abstract:
    An apparatus for processing a layer on a workpiece includes a source of reactant fluid, a reaction chamber having a support for the workpiece and a fluid delivery apparatus for feeding an input fluid into the reaction chamber with the input fluid being utilized to process the material. An infrared sensor is adapted to cooperate with the fluid delivery apparatus for sensing the concentration of a component of the input fluid. The infrared sensor includes an infrared light source positioned to direct a beam of infrared light at an infrared light detector through the input fluid. The infrared light detector produces an electrical output signal indicative of the amount of light received by the detector and therefore not absorbed by the input fluid.
  • Method And Apparatus For Optical Emission End Point Detection In Plasma Etching Processes

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  • US Patent:
    53084144, May 3, 1994
  • Filed:
    Dec 23, 1992
  • Appl. No.:
    7/995727
  • Inventors:
    James A. O'Neill - New City NY
    Michael L. Passow - Pleasant Valley NY
    Jyothi Singh - Hopewell Junction NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G01N 2100
  • US Classification:
    156626
  • Abstract:
    An apparatus and method for determining the time at which a plasma etching process should be terminated. The process generates at least one etch product species and a continuum plasma emission. The apparatus monitors the optical emission intensity of the plasma in a narrow band centered about a predetermined spectral line and generates a first signal indicative of the spectral intensity of the etch product species. The apparatus further monitors the optical emission intensity of the plasma in a wide band and generates a second signal indicative of the spectral intensity of the continuum plasma emission. The apparatus further monitors the magnitudes of the first and second signals and generates a termination signal when the magnitudes diverge.

Flickr

Youtube

Passow 12-11-09

Ying Yang Forever tour

  • Category:
    Music
  • Uploaded:
    19 Nov, 2009
  • Duration:
    29s

AGUniverse - 2015, 10 September, Volume 6, Is...

What makes someone part of the AGUniverse? In a new feature, hear dire...

  • Duration:
    44s

You Should Probably Change Your Password! | M...

Watch Michael's stand up comedy special Showman, streaming now on Netf...

  • Duration:
    7m 27s

Introduction Mike Passow Feb 20 2021

Earth 2 Class workshop with Dr. Paul Olsen - Dinosaurs Introduction Dr...

  • Duration:
    14m 44s

Teacher and researchers in the classroom (Ear...

Douglas Sathler (UFVJM/CeGEO) interviews Michael Passow (Columbia Univ...

  • Duration:
    7m 43s

HRCKC January 5, 2021 Meeting Presentation - ...

Dr. Michael Passow taught more than 40 years in middle school, high sc...

  • Duration:
    38m 30s

Michael Patrick Kelly Home Passow Ucker...

Michael Patrick Kelly.

  • Duration:
    2m 17s

Earth2Class Workshop Mar 6 2021 Part 1 SD 4...

Introduction by Dr. Michael J. Passow Part 1 Dr. Chris Zappa.

  • Duration:
    23m 56s

Googleplus

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Michael Passow

Facebook

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Michael Passow

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Friends:
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