Michael J Sharpes

US Patent:

6433570, Aug 13, 2002

Filed:

Oct 31, 2000

Appl. No.:

09/703354

Inventors:

Michael J. Sharpes - Boise ID
Robert L. Totorica - Boise ID

Assignee:

Micron Technology Inc. - Boise ID

International Classification:

G01R 3100

US Classification:

324760, 324765

Abstract:

A compact and modularly designed apparatus for testing and burning-in semiconductor devices comprises first and second power supplies and the use of direct current (DC) to DC converters. The first power supply provides a high voltage low amperage power source to drive the devices under test (DUTs), and the second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage is supplied to slot boards, and the DC to DC converters alter the voltage and current to digital levels. Supplying high voltage and low amperage power through the system to a location electrically near the DUTs, then converting it with DC to DC converters to power the DUTs, allows for much smaller connectors and for a modularly designed burn-in oven.

US Patent:

61408298, Oct 31, 2000

Filed:

Feb 24, 1999

Appl. No.:

9/256635

Inventors:

Michael J. Sharpes - Boise ID
Robert L. Totorica - Boise ID

Assignee:

Micron Technology, Inc. - Boise ID

International Classification:

G01R 3100

US Classification:

324760

Abstract:

A compact and modularly designed apparatus for testing and burning-in semiconductor devices comprises first and second power supplies and the use of direct current (DC) to DC converters. The first power supply provides a high voltage low amperage power source to drive the devices under test (DUTs), and the second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage is supplied to slot boards, and the DC to DC converters alter the voltage and current to digital levels. Supplying high voltage and low amperage power through the system to a location electrically near the DUTs, then converting it with DC to DC converters to power the DUTs, allows for much smaller connectors and for a modularly designed burn-in oven.

US Patent:

58805923, Mar 9, 1999

Filed:

Jul 15, 1993

Appl. No.:

8/091953

Inventors:

Michael J. Sharpes - Boise ID
Robert L. Totorica - Boise ID

Assignee:

Micron Technology, Inc. - Boise ID

International Classification:

G01R 3100

US Classification:

324760

Abstract:

A compact and modularly designed apparatus for testing and burning-in semiconductor devices comprises first and second power supplies and the use of direct current (DC) to DC converters. The first power supply provides high voltage low amperage power to drive the devices under test (DUTs), and the second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage is supplied to slot boards, and the DC to DC converters alter the voltage and current to digital levels. Supplying high voltage and low amperage power through the system to a location electrically near the DUTs, then converting it with DC to DC converters to power the DUTs, allows for much smaller connectors and for a modularly designed burn-in oven.