Michael P Van

US Patent:

20070268162, Nov 22, 2007

Filed:

May 17, 2006

Appl. No.:

11/435476

Inventors:

Martin Viss - Santa Rosa CA, US
Michael G. Van Grouw - Windsor CA, US

International Classification:

H03M 7/34

US Classification:

341 51

Abstract:

An equivalent-time sampling system accommodates quasi-repeating bit patterns by identifying a predetermined sequence of bits within the quasi-repeating bit pattern of a data signal, acquiring a series of samples of the data signal according to the clock signal associated with the data signal, independent of the timing of occurrences of the predetermined sequence of bits within the data signal. The equivalent-time sampling system counts cycles of the clock signal, wherein counting is started at an occurrence of the predetermined sequence of bits within the quasi-repeating bit pattern. The equivalent-time sampling system also synchronizes count values of the counted cycles of the clock signal to samples within the acquired series of samples.

US Patent:

20140072203, Mar 13, 2014

Filed:

Sep 11, 2012

Appl. No.:

13/610658

Inventors:

Kenong Wu - Davis CA, US
Chris W. Lee - Fremont CA, US
Michael J. Van Riet - Sunnyvale CA, US
Yi Liu - Milpitas CA, US

Assignee:

KLA-Tencor Corporation - Milpitas CA

International Classification:

G06K 9/62

US Classification:

382149

Abstract:

Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for a defect detection method are provided. One method includes selecting one or more parameters of a defect detection method using an optimization function and information for a set of classified defects, which includes defects of interest and nuisance defects, such that the one or more parameters satisfy an objective for the defect detection method.