Michael Patrick Weber

US Patent:

6341831, Jan 29, 2002

Filed:

Dec 30, 1999

Appl. No.:

09/475641

Inventors:

Paul J. Weber - Ft. Lauderdale FL 33308
Luiz B. Da Silva - Danville CA 94526
Michael R. Weber - Clearwater FL 33762

International Classification:

B41J 2005

US Classification:

347 1, 347 2

Abstract:

The human body is decorated with highly detailed, multicolored, personalized designs using Wirejetâ or electronically controlled ink ejection or similar printing technology. The designs are applied to the epidermal and upper dermal skin layers and last for at least several weeks. The decoration is produced by a print head comprising Wirejetâ nozzles, which spray biocompatible inks or dyes onto the skin. The Wirejetâ may be connected to a scanning mechanism to scan in one, two, or three directions. The decorations can be applied to contoured skin surfaces following flattening against a screen of intersecting wires, by robotic arm, or using z-axis technology. A computer stores the desired design and controls the firing of the Wirejetâ to produce the desired decoration or tattoo.

US Patent:

6562054, May 13, 2003

Filed:

Jul 26, 2000

Appl. No.:

09/625923

Inventors:

Paul J. Weber - Ft. Lauderdale FL 33308
Luiz B. DaSilva - Danville CA 94526
Michael R. Weber - Clearwater FL 33762

International Classification:

A61B 1730

US Classification:

606170

Abstract:

Highly flexible liposuction cannulas are constructed of metal and plastic, with the metal cannulas having diameters of between 2. 0 and 3. 5 mm, and with the plastic cannulas having diameters greater than 3. 5 mm (i. e. , 3. 5 to 9. 0 mm). These long shaft flexible cannulas, when utilized in combination with a reinforced neck, allow the cannula point of entry to act as a fulcrum (with an optional interposed insert) and in concert with the surgeons guiding hand to deflect the cannulas. The cannula tip is preferably highly beveled with an adjacent set of three openings, and the cannula easily penetrates fibrous fat and may reach fast deposits relatively distant from the entrance wounds. The long shaft, highly flexible, reinforced swan neck cannulas move in an easily controllable manner within the subcutaneous tissue below the dermal envelope in an arciform fashion. Benefits include a reduced need to move a patients body position intraoperatively. The swan neck has been reinforced to provide the needed additional stability at handle/shaft junction to help the surgeon increase leverage on the cannula shaft.

US Patent:

6563586, May 13, 2003

Filed:

Jul 10, 2000

Appl. No.:

09/613176

Inventors:

Fred E. Stanke - Cupertino CA
Clinton B. Carlisle - Palo Alto CA
Hung Pham - San Jose CA
Edric Tong - Sunnyvale CA
Douglas E. Ruth - Sunnyvale CA
James M. Cahill - San Jose CA
Michael Weber - Sunnyvale CA
Elliot Burke - Santa Barbara CA

Assignee:

Therma-Wave, Inc. - Fremont CA

International Classification:

G01N 2188

US Classification:

356445, 3562372

Abstract:

This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.

US Patent:

6607500, Aug 19, 2003

Filed:

May 10, 2001

Appl. No.:

09/853440

Inventors:

Luiz B. Da Silva - Danville CA
Michael R. Weber - Tampa FL
David I. Blatt - Margate FL
Jeffrey S. Mannheimer - Newton PA

Assignee:

Cyclotec Advanced Medical Technologies, Inc. - Lauderhill FL

International Classification:

A61F 501

US Classification:

602 2, 607 51, 607115, 607149, 600386, 206438

Abstract:

The present invention is a device that allows electrical stimulation to an anatomical site that is covered by a cast. The electrode is applied to achieve a desired physiological response (e. g. , bone growth), treatment of pain, or the prevention of muscle atrophy.

US Patent:

6690473, Feb 10, 2004

Filed:

Feb 1, 2000

Appl. No.:

09/495821

Inventors:

Fred E. Stanke - Cupertino CA
Talat F. Hasan - Saratoga CA
Michael Weber - Sunnyvale CA

Assignee:

Sensys Instruments Corporation - Santa Clara CA

International Classification:

G01B 1124

US Classification:

356601, 356369, 356511

Abstract:

This invention is an instrument adaptable for integration into a process tool the combines a number of instruments for surface characterization. As an integrated process monitor, the invention is capable of monitoring surface dishing, surface erosion and thickness of residue layers on work-pieces with little time delay. The invention is adaptable to making measurements while a wafer or work-piece is either wet or dry. A preferred embodiment includes an integrated optical profiler adapted to surface profiling in the presence of optical interference arising from retro-reflections from underlying optical non-uniformities. Alternate embodiments include an integrated stylus profiler with vibration isolation.

US Patent:

6829054, Dec 7, 2004

Filed:

Sep 3, 2003

Appl. No.:

10/654073

Inventors:

Fred E. Stanke - Cupertino CA
Talat F. Hasan - Saratoga CA
Michael Weber - Sunnyvale CA

Assignee:

Sensys Instruments Corporation - Santa Clara CA

International Classification:

G01B 1124

US Classification:

356601, 356511, 356369

Abstract:

This invention is an instrument adaptable for integration into a process tool the combines a number of instruments for surface characterization. As an integrated process monitor, the invention is capable of monitoring surface dishing, surface erosion and thickness of residue layers on work-pieces with little time delay. The invention is adaptable to making measurements while a wafer or work-piece is either wet or dry. A preferred embodiment includes an integrated optical profiler adapted to surface profiling in the presence of optical interference arising from retro-reflections from underlying optical non-uniformities Alternate embodiments include an integrated stylus profiler with vibration isolation.

US Patent:

7042580, May 9, 2006

Filed:

Mar 22, 2000

Appl. No.:

09/533613

Inventors:

Fred E. Stanke - Cupertino CA, US
Clinton B. Carlisle - Palo Alto CA, US
Hung Pham - San Jose CA, US
Edric Tong - Sunnyvale CA, US
Douglas E. Ruth - Sunnyvale CA, US
James M. Cahill - San Jose CA, US
Michael Weber - Sunnyvale CA, US
Elliot Burke - Santa Barbara CA, US

Assignee:

Tokyo Electron Limited - Tokyo

International Classification:

G01B 11/24

US Classification:

356601, 3562372, 356455, 356630

Abstract:

This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.

US Patent:

7177019, Feb 13, 2007

Filed:

Feb 1, 2005

Appl. No.:

11/048552

Inventors:

Fred E. Stanke - Cupertino CA, US
Douglas E. Ruth - Sunnyvale CA, US
James M. Cahill - San Jose CA, US
Michael Weber - Sunnyvale CA, US
Clinton B. Carlisle - Palo Alto CA, US
Hung Pham - San Jose CA, US
Edric Tong - Sunnyvale CA, US
Elliot Burke - Santa Barbara CA, US

Assignee:

Tokyo Electron Limited - Tokyo

International Classification:

G01B 11/24

US Classification:

3562372, 356601, 356630

Abstract:

This invention is an apparatus for imaging metrology, which in particular embodiments may be integrated with a processor station such that a metrology station is apart from but coupled to a process station. The metrology station is provided with a first imaging camera with a first field of view containing the measurement region. Alternate embodiments include a second imaging camera with a second field of view. Preferred embodiments comprise a broadband ultraviolet light source, although other embodiments may have a visible or near infrared light source of broad or narrow optical bandwidth. Embodiments including a broad bandwidth source typically include a spectrograph, or an imaging spectrograph. Particular embodiments may include curved, reflective optics or a measurement region wetted by a liquid. In a typical embodiment, the metrology station and the measurement region are configured to have 4 degrees of freedom of movement relative to each other.