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Milind Prabhakar Padhye

age ~57

from Kirkland, WA

Also known as:
  • Milind P Padhye
  • Malind Padhye
  • Aduye P Milind
Phone and address:
13203 NE 129Th Pl, Kirkland, WA 98034

Milind Padhye Phones & Addresses

  • 13203 NE 129Th Pl, Kirkland, WA 98034
  • Redmond, WA
  • 7505 Robert Kleburg Ln, Austin, TX 78749 • (512)2883583 • (512)2883670
  • 3014 William Cannon Dr, Austin, TX 78745 • (512)3589565 • (512)3589545
  • 1775 Milmont Dr, Milpitas, CA 95035
  • 440 Dixon Landing Rd, Milpitas, CA 95035 • (408)9457735 • (408)9578987
  • San Jose, CA
  • Sunnyvale, CA
  • Orem, UT
  • 15850 NE 40Th St APT 110, Redmond, WA 98052 • (512)7516668

Work

  • Position:
    Transportation and Material Moving Occupations

Education

  • Degree:
    High school graduate or higher

Us Patents

  • Flip-Flop Circuit Having Low Power Data Retention

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  • US Patent:
    7138842, Nov 21, 2006
  • Filed:
    Apr 1, 2005
  • Appl. No.:
    11/097659
  • Inventors:
    Milind P. Padhye - Austin TX, US
    Yuan A. Yuan - Austin TX, US
    Mahbub M. Rashed - Austin TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    H03K 3/289
  • US Classification:
    327203, 327208, 327218
  • Abstract:
    A flip-flop () comprises a first latch circuit (), a second latch circuit (), and a third latch circuit (). The first latch circuit () is coupled to receive a clock signal and a first power supply voltage. The second latch circuit () is coupled to the first latch circuit () and receives the clock signal and the first power supply voltage. Preparatory to entering a low power mode, the third latch circuit () receives a second power supply voltage and is coupled to the second latch circuit () in response to a power down signal. During the low power mode, the first power supply voltage is removed from the first and second latch circuits (). When returning to a normal operating mode, the first power supply voltage is provided to the first and second latch circuits (), and the third latch circuit () is coupled to the first latch circuit () in response to a power restore signal.
  • State Retention Within A Data Processing System

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  • US Patent:
    7183825, Feb 27, 2007
  • Filed:
    Apr 6, 2004
  • Appl. No.:
    10/818861
  • Inventors:
    Milind P. Padhye - Austin TX, US
    Yuan Yuan - Austin TX, US
    Sanjay Gupta - Delhi, IN
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    H03K 3/289
  • US Classification:
    327202, 327203, 327204, 327206, 327218
  • Abstract:
    Power consumption may be reduced through the use of power gating in which power is removed from circuit blocks or portions of circuit blocks in order to reduce leakage current. One embodiment uses a modified state retention flip-flop capable of retaining state when power is removed or partially removed from the circuit. Another embodiment uses a modified state retention buffer capable of retaining state when power is removed or partially removed from the circuit. The state retention flip-flop and buffer may be used to allow for state retention while still reducing leakage current. Also disclosed are various methods of reducing power and retaining state using, for example, the state retention flip-flops and buffers. For example, software, hardware, or a combination of software and hardware methods may be used to enter a deep sleep or idle mode while retaining state.
  • Testing Of Data Retention Latches In Circuit Devices

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  • US Patent:
    7346820, Mar 18, 2008
  • Filed:
    Mar 23, 2006
  • Appl. No.:
    11/388154
  • Inventors:
    Milind P. Padhye - Austin TX, US
    Darrell L. Carder - Dripping Springs TX, US
    Bhoodev Kumar - Austin TX, US
    Bart J. Martinec - Austin TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    G01R 31/28
  • US Classification:
    714726
  • Abstract:
    A circuit device having data retention latches utilizes a test interface and system test controller to control one or more components of the circuit device to ensure proper conditions for testing the data retention latches. The data retention latches each include a scan component that is part of a scan chain, a first latching component that is powered in a first voltage domain and a second latching component that is powered in a second voltage domain, where one of the voltage domains can be effectively shut down when the circuit device is placed in a low-voltage mode. The system test controller can control a scan controller used to scan test data in and out of the scan chain. The system test controller further can control a power controller used to manage a power down sequence and a power up sequence so as to ensure that the data retention latches are not placed in spurious states.
  • State Retention Within A Data Processing System

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  • US Patent:
    7365596, Apr 29, 2008
  • Filed:
    Apr 6, 2004
  • Appl. No.:
    10/819383
  • Inventors:
    Milind P. Padhye - Austin TX, US
    Claude Moughanni - Austin TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    G05F 1/10
  • US Classification:
    327544, 327200, 327215, 327219, 327333
  • Abstract:
    Power consumption may be reduced through the use of power gating in which power is removed from circuit blocks or portions of circuit blocks in order to reduce leakage current. One embodiment uses a modified state retention flip-flop capable of retaining state when power is removed or partially removed from the circuit. Another embodiment uses a modified state retention buffer capable of retaining state when power is removed or partially removed from the circuit. The state retention flip-flop and buffer may be used to allow for state retention while still reducing leakage current. Also disclosed are various methods of reducing power and retaining state using, for example, the state retention flip-flops and buffers. For example, software, hardware, or a combination of software and hardware methods may be used to enter a deep sleep or idle mode while retaining state.
  • Speedpath Repair In An Integrated Circuit

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  • US Patent:
    7612577, Nov 3, 2009
  • Filed:
    Jul 27, 2007
  • Appl. No.:
    11/829153
  • Inventors:
    Mahbub M. Rashed - Austin TX, US
    Milind P. Padhye - Austin TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    H03K 19/003
  • US Classification:
    326 10, 326 95
  • Abstract:
    A circuit comprises a first plurality of transistors of a first channel length disposed along a speedpath, the first plurality of transistors providing a first timing performance. The circuit also comprises a second plurality of transistors of a second channel length having an expected equivalent functionality as the first plurality of transistors and disposed in parallel with the first plurality of transistors along the speedpath, wherein the second channel length is different from the first channel length. In addition, the circuit comprises an element configured to selectively replace the first plurality of transistors with the second plurality of transistors in response to a determination that the first timing performance of the first plurality of transistors fails a timing requirement of the speedpath. In one embodiment, the second channel length is a sub-minimal geometry with respect to the first channel length.
  • Techniques For Operating A Processor Subsystem To Service Masked Interrupts During A Power-Down Sequence

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  • US Patent:
    7779284, Aug 17, 2010
  • Filed:
    Feb 23, 2007
  • Appl. No.:
    11/678440
  • Inventors:
    Bhoodev Kumar - Austin TX, US
    Christopher K. Chun - Austin TX, US
    Milind P. Padhye - Austin TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    G06F 1/00
    G06F 1/26
    G06F 1/32
    G06F 13/24
  • US Classification:
    713324, 713300, 713320, 713323, 710262
  • Abstract:
    A technique of operating a processor subsystem masks interrupts to the processor subsystem during a power-down sequence of a processor of the processor subsystem. A boot vector for the processor of the processor subsystem is set. The boot vector provides an address associated with a saved processor state. A current state of the processor is saved to provide the saved processor state. The technique determines whether one or more first masked interrupts occurred during the saving of the current state of the processor. The processor that is to be powered-down is stopped when the one or more first masked interrupts did not occur during the saving of the current state of the processor. The technique also determines whether one or more second masked interrupts occurred following the saving of the current state of the processor. The processor is powered-down when the one or more second masked interrupts did not occur following the saving of the current state of the processor.
  • Management Of Power Domains In An Integrated Circuit

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  • US Patent:
    8020017, Sep 13, 2011
  • Filed:
    Aug 15, 2008
  • Appl. No.:
    12/192683
  • Inventors:
    Milind P. Padhye - Austin TX, US
    Noah W. Bamford - Austin TX, US
    Anuj Singhania - Austin TX, US
  • Assignee:
    Freescale Semiconductor, Inc. - Austin TX
  • International Classification:
    G06F 1/26
  • US Classification:
    713323, 713300
  • Abstract:
    A method of operating a circuit, including operating in a first mode, wherein in the first mode, a first power domain operates in an active power mode and a second power domain operates in an active power mode, wherein in the first mode, a first set of at least one terminal of a first circuit of the first power domain are coupled to a second set of at least one terminal of a second circuit of the second power mode via an isolation circuit for providing signals from the first circuit to the second circuit, is provided. The method further includes operating the circuit in a second mode, wherein in the second mode, the first power domain operates in a power gated mode and a second power domain operates in an active power mode.
  • Flip-Flop Circuit Having Low Power Data Retention

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  • US Patent:
    20060220700, Oct 5, 2006
  • Filed:
    Apr 1, 2005
  • Appl. No.:
    11/097658
  • Inventors:
    Andrew Hoover - Austin TX, US
    Brian Millar - Austin TX, US
    Milind Padhye - Austin TX, US
  • International Classification:
    H03B 1/00
  • US Classification:
    327108000
  • Abstract:
    A flip-flop () has a normal mode and a low power mode to save power. The flip-flop () has a master latch () and a slave latch (). The slave latch () is used to retain the condition of the flip-flop () during the low power mode, where power is withdrawn from the master latch () but maintained on the slave latch (). The slave latch () may use transistors with lower leakage characteristics than the transistors that make up the master latch (). These lower leakage characteristics may be achieved by a higher threshold voltage and/or a thicker gate dielectric. Operating speed of the flip-flop () is maintained by implementing the slave latch () so that no logic gate or switching transistor is in the critical timing path. Instead, the slave latch () has an input/output terminal to tap into the signal path between the master latch and an output circuit ().

Resumes

Milind Padhye Photo 1

Principal Program Manager

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Location:
Redmond, WA
Industry:
Semiconductors
Work:
Microsoft
Principal Program Manager

Freescale Semiconductor May 2009 - Nov 2011
Global Program Manager

Freescale Semiconductor Jan 2007 - Apr 2009
Global Wireless Ip Program Manager

Freescale Semiconductor 2002 - Oct 2008
Low Power Design Manager

Motorola 1999 - 2002
Wireless Design Manager
Education:
Indian Institute of Technology, Kharagpur
Skills:
Soc
Eda
Semiconductors
Asic
Fpga
Integrated Circuit Design
Processors
Ic
Project Management
Low Power Design
Embedded Systems
Semiconductor Industry
Verilog
Digital Signal Processors
Field Programmable Gate Arrays
Silicon
Debugging
Application Specific Integrated Circuits
System on A Chip
Vlsi
Engineering Management
Static Timing Analysis
Perl
Arm
Microprocessors
Milind Padhye Photo 2

Milind Padhye

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Milind Padhye

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Googleplus

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Milind Padhye

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Milind Padhye

Facebook

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Milind Padhye

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Milind Padhye

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Milind Padhye

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Milind Padhye

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Milind Padhye

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Milind Padhye

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Milind Padhye

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Plaxo

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Milind Padhye

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Catura
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Milind Padhye

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Flexi Templates

Myspace

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Milind Padhye

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Locality:
NEWDELHI, Delhi
Gender:
Male
Birthday:
1919
Milind Padhye Photo 16

Milind Padhye

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Locality:
NEWDELHI, Delhi
Gender:
Male
Birthday:
1919

Youtube

21 December 2022

  • Duration:
    10m 44s

Conversation with Milind Padhye

  • Duration:
    44m 40s

MILIND PADHYE skydiving video Queenstown

Skydiving from 15000 feet at Queenstown.

  • Duration:
    5m 3s

Gulam Act 1

S. N. Navare / Milind Padhye.

  • Duration:
    5m 7s

MANJUSHA skydiving video

Skydiving from 15000 feet at Queenstown.

  • Duration:
    3m 52s

Sparrow feeding little chicks

Sparrow nest at our home kitchen window and feeding little chicks.

  • Duration:
    1m 22s

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