managing tenants • inspected apartments as well as cleaning • painting • repairs • appointments for showings • paperwork • and general maintenance • Training new Employees • Shippment • Restocking • Inventory control • Handling money in Safe • Customer service • Promoting sales • Cleaning • Forklift • Roof work • Loss Prevention • Auditing • Lifting 75+ LBS
Us Patents
3D Target For Monitoring Multiple Patterning Process
- Milpitas CA, US Nicholas James Keller - New York NY, US
International Classification:
G03F 7/20 G01B 11/27
Abstract:
A metrology target is designed for monitoring variations in a multiple patterning process, such as a self-aligned doubled patterning (SADP) or self-aligned quadruple patterning (SAQP) process. The metrology target may include a plurality of sub-patterns. For example, the metrology target may be a three-dimensional (3D) target rather than a conventional two-dimensional line-space target design. The 3D target design includes multiple sub-patterns arranged with a pitch in a direction that is different than the pitch of the lines and trenches. The pitch of the sub-patterns is sufficient so that multiple sub-patterns are simultaneously within the field of measurement.
Dec 2013 to 2000 Small Business Owner/OperatorBrown Shoe CO. Walnut Park, CA Nov 2012 to Dec 2013 Famous Footwear Assistant Store ManagerADP Real Estate Investments LLC Whitewater, WI Mar 2007 to Oct 2012 Property Manager/Maintenance
Education:
Belle Venture Acadamy Racine, WI 2001 to 2005 Diploma in High School
Skills:
managing tenants, inspected apartments as well as cleaning, painting, repairs, appointments for showings, paperwork, and general maintenance,Training new Employees, Shippment, Restocking, Inventory control, Handling money in Safe, Customer service, Promoting sales, Cleaning, Forklift, Roof work, Loss Prevention, Auditing, Lifting 75+ LBS