Search

Nina A Boiadjieva

age ~53

from Belmont, CA

Also known as:
  • Boiadjieva N Alexandrova

Nina Boiadjieva Phones & Addresses

  • Belmont, CA
  • San Leandro, CA

Work

  • Company:
    Slac national accelerator laboratory
    May 2014
  • Position:
    Mechanical engineer

Education

  • Degree:
    Master of Science, Masters
  • School / High School:
    San Jose State University
    1997 to 2000
  • Specialities:
    Mechanical Engineering

Skills

Solidworks • R&D • Mechanical Engineering • Design For Manufacturing • Product Development • Pro Engineer • Engineering • Finite Element Analysis • Manufacturing • Simulations • Design Thinking

Ranks

  • Certificate:
    Creativity Bootcamp

Industries

Research

Resumes

Nina Boiadjieva Photo 1

Mechanical Engineer

view source
Location:
1600 Chula Vista Dr, Belmont, CA 94002
Industry:
Research
Work:
Slac National Accelerator Laboratory
Mechanical Engineer

Nikon Research Corporation of America May 2012 - May 2014
Senior Mechanical Engineer

Nvidia Sep 2010 - Mar 2012
Mechanical Engineering Consultant

Thoratec Sep 2009 - Aug 2010
R and D Engineer Iii

Ltx-Credence Aug 2005 - Aug 2009
Senior Mechanical Engineer, Staff
Education:
San Jose State University 1997 - 2000
Master of Science, Masters, Mechanical Engineering
Skills:
Solidworks
R&D
Mechanical Engineering
Design For Manufacturing
Product Development
Pro Engineer
Engineering
Finite Element Analysis
Manufacturing
Simulations
Design Thinking
Certifications:
Creativity Bootcamp

Us Patents

  • Apparatus And Method For Probing Integrated Circuits Using Polarization Difference Probing

    view source
  • US Patent:
    7659981, Feb 9, 2010
  • Filed:
    Oct 27, 2005
  • Appl. No.:
    11/261996
  • Inventors:
    William Lo - San Jose CA, US
    Kenneth Wilsher - Palo Alto CA, US
    Nagamani Nataraj - Cupertino CA, US
    Nina Boiadjieva - Belmont CA, US
  • Assignee:
    DCG Systems, Inc. - Fremont CA
  • International Classification:
    G01B 11/00
  • US Classification:
    356369
  • Abstract:
    A system for probing a DUT is disclosed, the system having a pulsed laser source, a CW laser source, beam optics designed to point a reference beam and a probing beam at the same location on the DUT, optical detectors for detecting the reflected reference and probing beams, and a collection electronics. The beam optics is a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the incident laser beam into two beams of orthogonal polarization—one beam simulating a reference beam while the other simulating a probing beam. Both reference and probing beams are pointed to the same location on the DUT. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the reference and probing beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.
  • Laser Probing System For Integrated Circuits

    view source
  • US Patent:
    20070002329, Jan 4, 2007
  • Filed:
    Jun 29, 2005
  • Appl. No.:
    11/169423
  • Inventors:
    Steven Kasapi - San Francisco CA, US
    Kenneth Wilsher - Palo Alto CA, US
    Gary Woods - Sunnyvale CA, US
    William Lo - San Jose CA, US
    Radu Ispasoiu - Los Gatos CA, US
    Nagamani Nataraj - Cupertino CA, US
    Nina Boiadjieva - Belmont CA, US
  • International Classification:
    G01B 9/02
  • US Classification:
    356495000, 356489000
  • Abstract:
    An apparatus and method for laser probing of a DUT at very high temporal resolution is disclosed. The system includes a CW laser source, a beam optics designed to point two orthogonally polarized beams at the same location on the DUT, optical detectors for detecting the reflected beams, collection electronics, and an oscilloscope. The beam optics defines a common-path polarization differential probing (PDP) optics. The common-path PDP optics divides the laser beam into two beams of orthogonal polarization. Due to the intrinsic asymmetry of a CMOS transistor, the interaction of the beams with the DUT result in different phase modulation in each beam. This difference can be investigated to study the response of the DUT to the stimulus signal.
  • Coupling System, Applicator Tool, Attachment Ring And Method For Connecting A Conduit To Biological Tissue

    view source
  • US Patent:
    20180110514, Apr 26, 2018
  • Filed:
    Dec 21, 2017
  • Appl. No.:
    15/851485
  • Inventors:
    - Pleasanton CA, US
    Steven H. Reichenbach - Pleasanton CA, US
    J. Donald Hill - San Francisco CA, US
    George Hsu - San Ramon CA, US
    Andrew R. Miller - The Woodlands TX, US
    James Badia - Redwood City CA, US
    Nina Boiadjieva - Belmont CA, US
    Shuo-Hsiu Chang - Fremont CA, US
    Philip Haarstad - Chanhassen MN, US
    Olga M. Stanescu - San Jose CA, US
    Stephen Kenneth Sundquist - Minnetonka MN, US
  • Assignee:
    Thoratec Corporation - Pleasanton CA
  • International Classification:
    A61B 17/064
    A61B 17/115
    A61M 1/10
    A61B 17/072
    A61B 17/10
    A61M 1/12
    A61B 17/00
    A61B 17/04
    A61B 17/11
  • Abstract:
    A coupling system includes an applicator tool and an attachment ring mounted on the applicator tool. Clips are contained within the applicator tool and are deployed through the attachment ring in order to anchor the attachment ring to biological tissue. When deployed, tips of the clips follow a curved trajectory through an annular cuff of the attachment ring and through the underlying tissue. The tips loop back out of the tissue and to a location where they are later trapped or clamped by the attachment ring. While the tips are trapped or clamped, the applicator tool cinches the clips by pulling rear segments of the clips. Thereafter, the applicator tool disconnects from the attachment ring which remains anchored to the tissue and serves as a coupling for a cannula. The cannula can have movable lock members that secure it to the attachment ring.
  • Coupling System, Applicator Tool, Attachment Ring And Method For Connecting A Conduit To Biological Tissue

    view source
  • US Patent:
    20150343124, Dec 3, 2015
  • Filed:
    Jul 24, 2015
  • Appl. No.:
    14/808350
  • Inventors:
    Carine Hoarau - Lafayette CA, US
    Steven H. Reichenbach - Pleasanton CA, US
    J. Donald Hill - San Francisco CA, US
    George Hsu - San Ramon CA, US
    Andrew R. Miller - The Woodlands TX, US
    James Badia - Redwood City CA, US
    Nina Boiadjieva - Belmont CA, US
    Shuo-Hsiu Chang - Fremont CA, US
    Philip Haarstad - Chanhassen MN, US
    Olga M. Stanescu - San Jose CA, US
    Stephen Kenneth Sundquist - Minnetonka MN, US
  • International Classification:
    A61M 1/10
    A61B 17/10
    A61M 1/12
    A61B 17/064
    A61B 17/072
  • Abstract:
    A coupling system includes an applicator tool and an attachment ring mounted on the applicator tool. Clips are contained within the applicator tool and are deployed through the attachment ring in order to anchor the attachment ring to biological tissue. When deployed, tips of the clips follow a curved trajectory through an annular cuff of the attachment ring and through the underlying tissue. The tips loop back out of the tissue and to a location where they are later trapped or clamped by the attachment ring. While the tips are trapped or clamped, the applicator tool cinches the clips by pulling rear segments of the clips. Thereafter, the applicator tool disconnects from the attachment ring which remains anchored to the tissue and serves as a coupling for a cannula. The cannula can have movable lock members that secure it to the attachment ring.
Name / Title
Company / Classification
Phones & Addresses
Nina Boiadjieva
Quality Assurance Director
Rdn Solutions, Corporation
Custom Computer Programing
336 Los Coches St, Milpitas, CA 95035
22003 Rae Ln, Cupertino, CA 95014
(408)5868200

Get Report for Nina A Boiadjieva from Belmont, CA, age ~53
Control profile