Om Pavithra Bonam

US Patent:

20120236120, Sep 20, 2012

Filed:

Feb 13, 2012

Appl. No.:

13/371889

Inventors:

Kurt A. Kramer - Port Richey FL, US
Peter R. Mouton - St. Petersburg FL, US
Lawrence O. Hall - Tampa FL, US
Dmitry Goldgof - Lutz FL, US
Daniel T. Elozory - Tampa FL, US
Om Pavithra Bonam - Wesley Chapel FL, US
Baishali Chaudhury - Tampa FL, US

Assignee:

Stereology Resource Center, Inc. - Chester MD
University of South Florida - Tampa FL

International Classification:

H04N 13/02
G06K 9/00

US Classification:

348 46, 382128, 382133, 348E13074

Abstract:

Systems and methods are provided for automatic determination of slice thickness of an image stack in a computerized stereology system, as well as automatic quantification of biological objects of interest within an identified slice of the image stack. Top and bottom boundaries of a slice can be identified by applying a thresholded focus function to determine just-out-of-focus focal planes. Objects within an identified slice can be quantified by performing a color processing segmentation followed by a gray-level processing segmentation. The two segmentation processes generate unique identifiers for features in an image that can then be used to produce a count of the features.