Patrick E Perkins

US Patent:

6545271, Apr 8, 2003

Filed:

Sep 6, 2000

Appl. No.:

09/655758

Inventors:

Jeffrey T. Kernan - Santa Cruz CA
Patrick D. Perkins - Sunnyvale CA

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

B01D 5944

US Classification:

250292, 250281

Abstract:

An apparatus and method for removing neutral noise from a quadrupole mass filter ion beam. A mask plate has a lobed aperture centered on a longitudinal axis and positioned between a quadrupole mass filter exit end and an ion detector. The mask plate operates to remove neutral atoms from the ion beam that may interfere with instrument sensitivities. The lobed aperture passes the ion beam with little loss of the ion beam intensity. The invention substantially maintains signal intensity and removes unwanted noise from a mass spectrometer.

US Patent:

6608318, Aug 19, 2003

Filed:

Jul 31, 2000

Appl. No.:

09/629467

Inventors:

Patrick D. Perkins - Sunnyvale CA
Jeffrey T. Kernan - Santa Cruz CA

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

G21F 502

US Classification:

2504961, 250423 R, 250281, 250288, 427 77, 42725536, 427255394

Abstract:

The present invention relates to a mass spectrometer that includes an ionization source having a chamber for ionizing a fluid sample. The ionization chamber has surfaces to reduce the overall interaction with reactive samples. The inner surface walls of the ionization chamber may be formed from an inorganic conductive nitride or disulfide material or may be applied to a substrate as a coating. The invention also includes a method for reducing the interaction of a reactive analyte with the inner wall of the chamber by application or coating the inner wall of the chamber with an inert conductive material.

US Patent:

6717138, Apr 6, 2004

Filed:

Nov 13, 2002

Appl. No.:

10/293118

Inventors:

Jeffrey T. Kernan - Santa Cruz CA
Patrick D. Perkins - Sunnyvale CA

Assignee:

Agilent, Technologies, Inc. - Palo Alto CA

International Classification:

H01J 4942

US Classification:

250292, 250281, 250283

Abstract:

An apparatus and method for removing neutral noise from a quadrupole mass filter ion beam. A mask plate has a lobed aperture centered on a longitudinal axis and positioned between a quadrupole mass filter exit end and an ion detector. The mask plate operates to remove neutral atoms from the ion beam that may interfere with instrument sensitivities. The lobed aperture passes the ion beam with little loss of the ion beam intensity. The invention substantially maintains signal intensity and removes unwanted noise from a mass spectrometer.

US Patent:

6765215, Jul 20, 2004

Filed:

Jun 28, 2001

Appl. No.:

09/894204

Inventors:

Patrick D. Perkins - Sunnyvale CA

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

H01J 2700

US Classification:

250423R, 250288, 250282

Abstract:

The present invention relates to an ionization source having a chamber for ionizing a sample. The ionization chamber has surfaces to reduce the overall interaction with reactive samples. The inner surface walls of the ionization chamber or the ionization chamber may be formed from an inert super alloy. For instance, Inconelâ 625, Inconelâ 601 or HastelloyÂ) may comprise the ionization chamber or the surface walls of the ionization chamber. The invention also includes a method for reducing the interaction of a reactive analyte with an ion source.

US Patent:

6947621, Sep 20, 2005

Filed:

Jan 22, 2002

Appl. No.:

10/051122

Inventors:

Patrick Elliott Perkins - Sunnyvale CA, US
Lawrence Lowell Ames - San Jose CA, US
William Walter Anderson - Half Moon Bay CA, US

Assignee:

Lockheed Martin Corporation - Bethesda MD

International Classification:

G02B006/00
G02B006/26
G02B006/36

US Classification:

385 15, 385147

Abstract:

A method for performing optical signal and beam distribution in a heterodyne interferometer. A planar lightwave circuit is provided including a plurality of waveguide optical transmission elements and an input coupler and an output coupler arranged along the optical transmission elements. Optical pathlengths of the transmission elements are matched between the input coupler and the output coupler to compensate for thermal effects. Reference and measurement optical phases are determined employing the input coupler and the output coupler.

US Patent:

6974956, Dec 13, 2005

Filed:

Mar 25, 2004

Appl. No.:

10/810396

Inventors:

Patrick D. Perkins - Sunnyvale CA, US

Assignee:

Agilent Technologies, Inc. - Palo Alto CA

International Classification:

H01J027/00

US Classification:

250423R, 250288

Abstract:

The present invention relates to an ionization source having a chamber for ionizing a sample. The ionization chamber has surfaces to reduce the overall interaction with reactive samples. The inner surface walls of the ionization chamber or the ionization chamber may be formed from an inert super alloy. For instance, Inconel™ 625, Inconel™ 601 or Hastelloy may comprise the ionization chamber or the surface walls of the ionization chamber. The invention also includes a method for reducing the interaction of a reactive analyte with an ion source.

US Patent:

7003186, Feb 21, 2006

Filed:

Oct 6, 2003

Appl. No.:

10/680720

Inventors:

Patrick Elliott Perkins - Sunnyvale CA, US
Lawrence Lowell Ames - San Jose CA, US
William Walter Anderson - Half Moon Bay CA, US

Assignee:

Lockheed Martin Corporation - Bethesda MD

International Classification:

C02B 6/26
G01B 9/02

US Classification:

385 15, 356482

Abstract:

Techniques for measuring spatial locations. An apparatus for measuring spatial locations includes a first object at a first location, a second object at a second location, and a waveguide-based interferometer coupled between the first object and the second object. The waveguide-based interferometer includes a waveguide material. The waveguide material is adapted to carry at least a reference beam and a measurement beam. The reference beam traverses a first path defined within the waveguide material. The measurement beam traverses a second path defined within the waveguide material and a third path defined outside of the waveguide material. The third path is related to at least one of the first location and the second location.

US Patent:

7148491, Dec 12, 2006

Filed:

Aug 31, 2005

Appl. No.:

11/217263

Inventors:

Patrick D. Perkins - Sunnyvale CA, US

Assignee:

Agilent Technologies, Inc. - Santa Clara CA

International Classification:

H01J 27/00

US Classification:

250423R, 250288

Abstract:

The present invention relates to an ionization source having a chamber for ionizing a sample. The ionization chamber has surfaces to reduce the overall interaction with reactive samples. The inner surface walls of the ionization chamber or the ionization chamber may be formed from an inert super alloy. For instance, Inconel™ 625, Inconel™ 601 or Hastelloy may comprise the ionization chamber or the surface walls of the ionization chamber. The invention also includes a method for reducing the interaction of a reactive analyte with an ion source.