Paul Wayne Ingram

US Patent:

8515716, Aug 20, 2013

Filed:

Aug 6, 2010

Appl. No.:

12/851844

Inventors:

Paul M. Ingram - Dallas TX, US
Joseph C. Landry - Dallas TX, US
John J. Coogan - Bedford TX, US
Paul D. Shocklee - Plano TX, US

Assignee:

Raytheon Company - Waltham MA

International Classification:

G06G 7/48
G06F 7/60
G06F 17/10

US Classification:

703 6, 703 2

Abstract:

In accordance with the present disclosure, a computer implemented system and method predicts the performance for a remote material identification process under real conditions and uncertainties. The method and system transforms data representing measured reflectance values for candidate materials based on environmental conditions, and uncertainties regarding the environmental conditions and/or calibration of sensors measuring radiance values into the performance predictions for a material identification process operating under those conditions and uncertainties. The performance predictions can be communicated to a designer of, for example, a multi-angle material identification system for use in selecting and setting up the system, or communicated to a consumer of images captured by the material identification system for use in interpreting results of application of the material identification process to real imagery acquired with remote sensors.

US Patent:

8532958, Sep 10, 2013

Filed:

Aug 6, 2010

Appl. No.:

12/851991

Inventors:

Paul M. Ingram - Dallas TX, US
Joseph C. Landry - Dallas TX, US
John J. Coogan - Bedford TX, US
Paul D. Shocklee - Plano TX, US

Assignee:

Raytheon Company - Waltham MA

International Classification:

G06F 17/18

US Classification:

702181, 252582

Abstract:

In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.

US Patent:

20020035454, Mar 21, 2002

Filed:

Jul 26, 2001

Appl. No.:

09/917388

Inventors:

Paul Ingram - Mesquite TX, US
Archie Muse - Dallas TX, US

Assignee:

Raytheon Company

International Classification:

G06F017/10

US Classification:

703/002000

Abstract:

A method for estimating the error statistic for retrieved temperature and emissivity of a surface material includes determining the second order analytical error propagation from a measured radiance that differs from the true radiance by additive gaussian noise, which is independent in each band. The radiance error is translated into a diagonal covariance matrix and an analytical estimate results in a determination of the standard deviation and bias of surface temperature. Further, the method for estimating the error statistic utilizes Monte Carlo simulation from a sufficiently large ensemble of radiance spectra for the retrieved surface temperature and emissivity. Temperature and emissivity of the surface material were retrieved using ISSTES algorithm.

US Patent:

55816380, Dec 3, 1996

Filed:

Feb 28, 1995

Appl. No.:

8/395633

Inventors:

Fenton L. Givens - Dallas TX
Thomas J. Skinner - Richardson TX
Paul M. Ingram - Mesquite TX

Assignee:

E-Systems, Inc. - Dallas TX

International Classification:

G06K 932
G06F 15336

US Classification:

382294

Abstract:

A method for automatically registering an image pair having a common coverage area, wherein a pair of image data sets, each representing an image of an image pair, are processed to generate initial dewarping coefficients for the image data sets. The translational offset between the images is estimated using a phase correlation process. Next, the common coverage area of the data image sets is determined by finding the vertices defining the limits of the common coverage area. Conjugate point pairs are extracted from the common coverage area by defining a series of block and subblock grids and defining the center point of the grid as a conjugate point location. The determined conjugate point sets are used to generate geometrically corrected registered dewarping coefficients and the image data sets are resampled using the registered dewarping coefficients to generate a registered image pair.

US Patent:

53241134, Jun 28, 1994

Filed:

Dec 10, 1992

Appl. No.:

7/988791

Inventors:

Paul M. Ingram - Mesquite TX
James R. Johnson - Plano TX
Fenton L. Givens - Dallas TX

Assignee:

E-Systems, Inc. - Dallas TX

International Classification:

G01J 502
G01W 110

US Classification:

374124

Abstract:

A method of estimating both atmospheric conditions and surface temperatures of an object from either a single set of multispectral images or multiple simultaneously-acquired single-band images of the object. Estimates of atmospheric conditions are generated by determining and radiometrically correcting radiance values measured from the image of the object. Expected radiance values are then determined and compared with the measured radiance values. The best fit of the radiance values measured from the image of the object to the expected radiance values corresponds to the best estimate of the atmospheric conditions associated with the object. The present method estimates atmospheric conditions for the object regardless of the availability of atmospheric conditions associated with the image.

US Patent:

54623570, Oct 31, 1995

Filed:

Oct 28, 1993

Appl. No.:

8/141948

Inventors:

Paul M. Ingram - Mesquite TX
James R. Johnson - Plano TX
Fenton L. Givens - Dallas TX

Assignee:

E-Systems, Inc. - Dallas TX

International Classification:

G01J 502
G01W 110

US Classification:

374124

Abstract:

A method of estimating both atmospheric conditions and surface temperatures of an object from either a single set of multispectral images or multiple simultaneously-acquired single-band images of the object. Estimates of atmospheric conditions are generated by determining and radiometrically correcting radiance values measured from the image of the object. Expected radiance values are then determined and compared with the measured radiance values. The best fit of the radiance values measured from the image of the object to the expected radiance values corresponds to the best estimate of the atmospheric conditions associated with the object. The present method estimates atmospheric conditions for the object regardless of the availability of atmospheric conditions associated with the image.