Paul J Mcclure

US Patent:

6666075, Dec 23, 2003

Filed:

Jun 13, 2001

Appl. No.:

09/881650

Inventors:

Vladimir Mancevski - Austin TX
Davor Juricic - Austin TX
Paul F. McClure - Austin TX

Assignee:

Xidex Corporation - Austin TX

International Classification:

G01B 528

US Classification:

73105

Abstract:

A scanning probe microscopy tool is provided with a force sensor that simultaneously measures more than one component of a surface force. The tool is comprised of an oscillator, a tip, a mechanical actuator, a sensing system, and a feedback control system. The oscillator has a selected shape, dimensions ratio, and /or material composition such that the oscillator comprises a first resonant mode for a first direction, wherein a first resonance of the first resonance mode can be altered by a surface force interaction between the tip and the sample in the first direction; and a second resonant mode for a second direction, wherein a second resonance of the second resonant mode can be altered by the surface force interaction between the tip and the sample in the second direction. The sensing system is adapted to sense the alterations in the first and second resonances, is adapted to provide a first output based on the alterations in the first resonance, and is adapted to provide a second output based on alterations in the second resonance. The feedback control system is adapted to control the actuator based on the first and second outputs.

US Patent:

6955078, Oct 18, 2005

Filed:

Apr 1, 2002

Appl. No.:

10/115274

Inventors:

Vladimir Mancevski - Austin TX, US
Paul McClure - Austin TX, US

Assignee:

Xidex Corporation - Austin TX

International Classification:

G01B021/30
G01B011/30

US Classification:

73105

Abstract:

A caliper atomic force microscope (AFM) comprises two AFM probes (each comprised of an oscillator and an attached tip) that operate on a sample in a coordinated manner. The coordinated operation of the AFM probes may be spatially or temporally coordinated. The result of the coordinated operation may be an image of the sample or a dimensional measurement of an unknown sample. The probes of the caliper AFM may be tilted, or the tips may be tilted at a non-orthogonal angle with respect to the probes, so as to enable the tips to access vertical sample surfaces or to enable the tips to touch each other. The tip shapes may include conical, boot-shaped, cylindrical, or spherical and materials from which the tips are fabricated may include silicon or carbon nanotubes. The oscillators may be beveled to allow the tips to operate in close proximity or in contact without interference of the oscillators. The disclosure of the present invention is discussed in terms of an atomic force (van der Waalls) interaction.

US Patent:

7493794, Feb 24, 2009

Filed:

Aug 6, 2007

Appl. No.:

11/890405

Inventors:

Vladimir Mancevski - Austin TX, US
Paul McClure - Austin TX, US

Assignee:

Xidex Corporation - Austin TX

International Classification:

G01N 13/16
G01B 21/30

US Classification:

73 179, 73 189

Abstract:

A caliper atomic force microscope (AFM) comprises two AFM probes (each comprised of an oscillator and an attached tip) that operate on a sample in a coordinated manner. The coordinated operation of the AFM probes may be spatially or temporally coordinated. The result of the coordinated operation may be an image of the sample or a dimensional measurement of an unknown sample. The probes of the caliper AFM may be tilted, or the tips may be tilted at a non-orthogonal angle with respect to the probes, so as to enable the tips to access vertical sample surfaces or to enable the tips to touch each other. The tip shapes may include conical, boot-shaped, cylindrical, or spherical and materials from which the tips are fabricated may include silicon or carbon nanotubes. The oscillators may be beveled to allow the tips to operate in close proximity or in contact without interference of the oscillators. The disclosure of the present invention is discussed in terms of an atomic force (van der Waalls) interaction.

US Patent:

20060037379, Feb 23, 2006

Filed:

Mar 18, 2005

Appl. No.:

11/084336

Inventors:

Vladimar Mancevski - Austin TX, US
Paul McClure - Austin TX, US

International Classification:

G01B 21/30

US Classification:

073001890

Abstract:

A caliper atomic force microscope (AFM) comprises two AFM probes (each comprised of an oscillator and an attached tip) that operate on a sample in a coordinated manner. The coordinated operation of the AFM probes may be spatially or temporally coordinated. The result of the coordinated operation may be an image of the sample or a dimensional measurement of an unknown sample. The probes of the caliper AFM may be tilted, or the tips may be tilted at a non-orthogonal angle with respect to the probes, so as to enable the tips to access vertical sample surfaces or to enable the tips to touch each other. The tip shapes may include conical, boot-shaped, cylindrical, or spherical and materials from which the tips are fabricated may include silicon or carbon nanotubes. The oscillators may be beveled to allow the tips to operate in close proximity or in contact without interference of the oscillators. The disclosure of the present invention is discussed in terms of an atomic force (van der Waalls) interaction. Other interaction forces are contemplated, such as electrostatic force, magnetic force, and tunneling current. The caliper AFM may be calibrated with the help of a sample with known dimensions or by touching the probe tips. The tip-to-tip calibration enables absolute measurements without the need for a reference artifact, and it enables in-line calibration that may be performed during the measurement process.

US Patent:

48267856, May 2, 1989

Filed:

Jan 27, 1987

Appl. No.:

7/007065

Inventors:

Paul J. McClure - Colorado Springs CO
Robert E. Jones - Colorado Springs CO

Assignee:

INMOS Corporation - Colorado Springs CO

International Classification:

H01L 2182

US Classification:

437174

Abstract:

A metallic interconnect includes a fuse portion that is readily vaporized upon exposure to the radiant energy of a laser. A layer of optically absorptive material is formed on top of an aluminum based metallic interconnect and together they are formed by a photolithographic and etch technique into a fuse portion. A low energy laser having a Gaussian energy distribution focused on the absorptive layer produces heat in the absorptive layer. The heat is transferred to the underlying aluminum based interconnect. The concentration of energy made possible by the absorptive layer allows the low energy laser to blow the fuse thereby producing an electrical open in the interconnect without damaging surrounding silicon substrate and/or polysilicon structures below or nearby the metal fuse.

US Patent:

49358014, Jun 19, 1990

Filed:

Jan 30, 1989

Appl. No.:

7/304361

Inventors:

Paul J. McClure - Colorado Springs CO
Robert E. Jones - Colorado Springs CO

Assignee:

Inmos Corporation - Colorado Springs CO

International Classification:

H01L 2702
H01L 2348

US Classification:

357 51

Abstract:

A metallic interconnect includes a fuse portion that is readily vaporized upon exposure to the radiant energy of a laser. A layer of optically absorptive material is formed on top of an aluminum based metallic interconnect and together they are formed by a photolithographic and etch technique into a fuse portion. A low energy laser having a Gaussian energy distribuution focused on the absorptive layer produces heat in the absorptive layer. The heat is transferred to the underlying aluminum based interconnect. The concentration of energy made possible by the absorptive layer allows the low energy laser to blow the fuse thereby producing an electrical open in the interconnect without damaging surrounding silicon substrate and/or polysilicon structures below or nearby the metal fuse.

US Patent:

47849738, Nov 15, 1988

Filed:

Aug 24, 1987

Appl. No.:

7/088681

Inventors:

E. Henry Stevens - Colorado Springs CO
Paul J. McClure - Colorado Springs CO
Christopher W. Hill - Colorado Springs CO

Assignee:

INMOS Corporation - Colorado Springs CO

International Classification:

H01L 21283

US Classification:

437200

Abstract:

A titanium silicide/titanium nitride process is disclosed wherein the thickness of the titanium nitride can be regulated with respect to the titanium silicide. In particular, a control layer is formed in the contact opening during a reactive cycle to form a relatively thin (20 to 50 angstrom) control layer. Titanium is thereafter deposited and in another thermal reaction the control layer retards the development of titanium silicide without retarding the development of titanium nitride so that the thickness of titanium silicide is kept small. A double titanium process can also be used.

US Patent:

20180374103, Dec 27, 2018

Filed:

Feb 19, 2018

Appl. No.:

15/899330

Inventors:

- Austin TX, US
Paul Frederick McClure - Austin TX, US
Frank Nicholas Bruno - Austin TX, US

Assignee:

Authenticate, LLC - Austin TX

International Classification:

G06Q 30/00
H04L 9/08
G06K 19/06
G06K 19/10
G06K 19/077
G06Q 10/08

Abstract:

In some embodiments, an apparatus includes a tag that may include an encapsulant and a plurality of three-dimensional objects randomly oriented within the encapsulant. Each three-dimensional object may include a plurality of characteristics defining at least one statistically unique signature. At least one of the characteristics may be dependent on the orientation of the object. In some instances, the plurality of three-dimensional objects may also be randomly distributed within the encapsulant, and at least one of the characteristics defining at least one statistically unique signature may be dependent on the distribution of the objects.