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Paul J Seger

age ~78

from Tucson, AZ

Also known as:
  • Paul G Seger
Phone and address:
5145 Paseo Del Barranco, Tucson, AZ 85745

Paul Seger Phones & Addresses

  • 5145 Paseo Del Barranco, Tucson, AZ 85745
  • Streamwood, IL
  • Endicott, NY
  • Portland, OR
  • Pima, AZ

Work

  • Company:
    Cooper and associats via aspen technical - Chicago, IL
    Jan 2014
  • Position:
    Instrument and controls engineer

Education

  • School / High School:
    College of DuPage
    2002
  • Specialities:
    Instrumentation and Controls Engineering

Skills

Labview 2010 to 2010 2010 • Word • Excel • Outlook MySql RsLogix 500 MS Access 2010... • Perl • C and Forth

License Records

Paul Andrew Seger

License #:
63 - Expired
Category:
Funeral Directing
Issued Date:
Sep 1, 2008
Effective Date:
Mar 2, 2009
Expiration Date:
Mar 1, 2009
Type:
Apprentice-Split 1

Paul F Seger

License #:
696 - Active
Category:
Funeral Directing
Issued Date:
Jan 1, 1962
Expiration Date:
Feb 1, 2018
Type:
Funeral Director and Embalmer

Us Patents

  • Identifying Systematic Errors In A Data Recording System

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  • US Patent:
    7143318, Nov 28, 2006
  • Filed:
    Aug 21, 2003
  • Appl. No.:
    10/646648
  • Inventors:
    Paul J. Seger - Tucson AZ, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G11B 20/18
  • US Classification:
    714 47, 360 53, 369 53, 714704
  • Abstract:
    The present invention differentiates between systematic and non-systematic conditions by observing a figure of merit over a series of many observation events. In a data storage recording environment, the particular figure of merit used is the number of data segments that must be re-written (due to errors) to a recording medium in order to assure that an entire data set is correctly written. A larger number of re-written segments is indicative of a significant error condition. After each data set is completely and correctly written, the number of re-written segments for the data set is reported as an “event. ” A running history of the classified events (or the events themselves) is maintained. Then, at a predetermined time, the history is analyzed and a decision made as to whether any observed events meets predetermined criteria for a systematic condition.
  • Wireless Security Access Management For A Portable Data Storage Cartridge

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  • US Patent:
    7178031, Feb 13, 2007
  • Filed:
    Nov 8, 1999
  • Appl. No.:
    09/435899
  • Inventors:
    Paul Joseph Seger - Tucson AZ, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H04K 1/00
    G03F 7/00
  • US Classification:
    713182, 707 9, 707100
  • Abstract:
    A portable security system mounted in a portable data storage cartridge for managing access by users to the cartridge. A programmable computer processor mounted in the cartridge is powered by and transfers data to a data storage drive via a wireless RF interface, when mounted in the drive. A user table has a unique user identifier for each authorized user and lists permitted activities of the user for the cartridge. The user identifier comprises a user symbol and a user decrypting sender public key. An authentication message from the authorized user is encrypted by a sender private key and a receiver public key. The cartridge processor decrypts the message employing a receiver private key and the sender public key, whereby the user authentication message is known to have come from the user and grants access to the user for the listed activities for the cartridge.
  • Identifying A State Of A Data Storage Drive Using An Artificial Neural Network Generated Model

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  • US Patent:
    7328197, Feb 5, 2008
  • Filed:
    Sep 23, 2004
  • Appl. No.:
    10/947692
  • Inventors:
    Paul J Seger - Tucson AZ, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G06N 5/00
  • US Classification:
    706 15, 73599, 436172
  • Abstract:
    The state or condition of a data storage drive, or a subsystem within a drive, may be evaluated by comparing a set of selected parameter values, converted into a trial vector, with a number of model or exemplar vectors, each of which was represents a particular state or condition of a sample drive. Examples of such conditions may include “good”, “marginal”, “unacceptable”, “worn”, “defective”, or other general or specific conditions. Sets of parameter values from the drive are converted into input vectors. Unprocessed vectors are then processed against the input vectors in an artificial neural network to generate the exemplar vectors. The exemplar vectors are stored in a memory of an operational drive. During operation of the drive, the trial vector is compared with the exemplar vectors. The exemplar vector which is closest to the trial vector represents a state which most closely represents the current state of the drive.
  • Identifying A State Of A System Using An Artificial Neural Network Generated Model

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  • US Patent:
    7392161, Jun 24, 2008
  • Filed:
    Sep 23, 2004
  • Appl. No.:
    10/947934
  • Inventors:
    Paul J. Seger - Tucson AZ, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G06F 15/00
  • US Classification:
    702189, 702197
  • Abstract:
    The state or condition of a system may be evaluated by comparing a set of selected parameter values, converted into a trial vector, with a number of model or exemplar vectors, each of which was represents a particular state or condition of a sample system. Examples of such conditions may include “good”, “marginal”, “unacceptable”, “worn”, “defective”, or other general or specific conditions. Sets of parameter values from the system are converted into input vectors. Unprocessed vectors are then processed against the input vectors in an artificial neural network to generate the exemplar vectors. The exemplar vectors are stored in a memory of an operational system. During operation of the system, the trial vector is compared with the exemplar vectors. The exemplar vector which is closest to the trial vector represents a state which most closely represents the current state of the system. Thus, a high similarity between the trial vector and an exemplar vector which represent a “good” system is likely to have come from a “good” system.
  • Method And Apparatus For Providing Error Correction Capability To Longitudinal Position Data

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  • US Patent:
    7421640, Sep 2, 2008
  • Filed:
    Aug 17, 2005
  • Appl. No.:
    11/205713
  • Inventors:
    Roy D. Cideciyan - Rueschlikon, CH
    Evangelos S. Eleftheriou - Zurich, CH
    Glen A. Jaquette - Tucson AZ, US
    Paul J. Seger - Tucson AZ, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G11C 29/00
  • US Classification:
    714771, 714785
  • Abstract:
    A method and apparatus for providing error correction capability to longitudinal position data are disclosed. Initially, data are encoded via a set of even LPOS words and a set of odd LPOS words. The encoded data are then decoded by generating a set of syndrome bits for each of the LPOS words. A determination is then made as to whether or not there is an error within one of the LPOS words based on its corresponding syndrome bits.
  • Rll Encoding For Lto-5 Tape

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  • US Patent:
    7432834, Oct 7, 2008
  • Filed:
    Jul 5, 2007
  • Appl. No.:
    11/773821
  • Inventors:
    Roy D. Cideciyan - Rueschlikon, CH
    Paul J. Seger - Tucson AZ, US
    Keisuke Tanaka - Tokyo-to, JP
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H03M 7/00
  • US Classification:
    341 59, 341 50
  • Abstract:
    Method and apparatus are provided for encoding and decoding rate-(s(K+1)/s(K+1)+1) TCMTR(j,k,t,a) codes, where s is the ECC symbol size in bits and K is the number of unencoded symbols that are interleaved with an (s+1)-bit encoded block at the output of a rate-s/(s+1) encoder that encodes the r-th s-bit symbol. K=m/s−1 where m=s(K+1) is the total number of bits to be encoded. Error propagation is reduced, thus allowing the ECC code to correct errors efficiently. Header error-rate is also reduced by eliminating occurrence of likely error events at the detector output. Although initially an RLL code may be designed for an ECC symbol size of s bits, the RLL encoding of the present invention may be used in conjunction with ECC schemes that utilize symbol sizes other than s bits.
  • High-Rate Rll Encoding

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  • US Patent:
    7486208, Feb 3, 2009
  • Filed:
    May 16, 2007
  • Appl. No.:
    11/749711
  • Inventors:
    Roy D. Cideciyan - Rueschlikon, CH
    Evangelos S. Eleftheriou - Zurich, CH
    Thomas Mittelholzer - Zurich, CH
    Paul J. Seger - Tucson AZ, US
    Keisuke Tanaka - Tokyo-to, JP
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H03M 5/00
  • US Classification:
    341 58, 360 48, 341 59
  • Abstract:
    An unencoded m-bit data input sequence is divided into a block of n bits and a block of m−n bits. The block of n bits is divided into a first set of n+1 encoded bits, wherein at least one of P subblocks of the first set satisfies a G, M and I constraints. The first set of n+1 encoded bits is mapped into a second set of n+1 encoded bits wherein at least one of P subblocks of the second set gives rise to at least Q transitions after 1/(1+D) precoding. A second set of n+1 encoded bits is divided into P encoded subblocks and the P encoded subblocks are interleaved among (m−n)/s unencoded symbols so as to form a (m+1)-bit output sequence codeword which is then stored on a data storage medium.
  • Modeling Error Correction Capability With Estimation Of Defect Parameters

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  • US Patent:
    7552376, Jun 23, 2009
  • Filed:
    Oct 28, 2005
  • Appl. No.:
    11/261037
  • Inventors:
    Paul J Seger - Tucson AZ, US
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H03M 13/00
  • US Classification:
    714755, 714762, 714786, 714788, 703 13
  • Abstract:
    A method, system and program product accurately model the error characteristics of a communications system, such as a tape storage system. Input parameters are entered which describe defect rates and sizes, Codeword Data Structure bytes, and any interleaving factor. Bit defects from simulated defect sources are generated, defined by the starting and ending bits of each defect within a codeword. Any codewords which are defect-free are filtered out and not processed further, thereby increasing the processing speed of the model. Within the defect streams, overlapping defects are merged, redefining defect regions by starting and ending bits. Because only the definitions are processed, not the entire length of the codewords or defects, processing efficiency is further enhanced. The number of defects that occur in each codeword is determined and the probability of the occurrence of N bytes in error per processed codeword may be computed. If desired, a histogram may be generated which includes the rate at which errors occurred and subsequently used to estimate the probability of an error event.
Name / Title
Company / Classification
Phones & Addresses
Paul Seger
Branch Manager
Veterans of Foreign Wars of The United States
Civic and Social Associations
320 Patricia Ln, Hanover Park, IL 60103
(630)2132266

Resumes

Paul Seger Photo 1

Paul Seger Batavia, IL

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Work:
Cooper and Associats via Aspen Technical
Chicago, IL
Jan 2014 to Aug 2014
Instrument and Controls Engineer
Ambitech Engineering Corporation
Downers Grove, IL
Apr 2012 to Aug 2013
Senior Engineer
Illinois River Energy
River, IL
2006 to 2012
Instrumentation Automation and Controls Engineer
Gas Technology Institute

1998 to 2006
Principal Engineer
DT Merrill

1994 to 1998
Systems Engineer
BHS Systems

1992 to 1994
Systems Engineer
Pyramid Controls

1986 to 1992
Application Engineer
Auto-Tech

1985 to 1986
Development Engineer
Belden Wire

1981 to 1985
Equipment Development Engineer
AES Technology

1972 to 1981
Electrical Engineer and Department Supervisor
Education:
College of DuPage
2002
Instrumentation and Controls Engineering
Free State College of Engineering MD
BSEE
Skills:
Labview 2010 to 2010 2010, Word, Excel, Outlook MySql RsLogix 500 MS Access 2010 Labview RsLogix 5000 CadSoft Schematic and PCB Design Wonderware Unified Modeling Language (UML) Fisher Specification Manage Formation Programming Languages Working Knowledge of AutoCAD Masoneilan ValSpeQ Java, Perl, C and Forth

Youtube

The Holiness Of God - Paul Seger - 11/27/22

Stand Alone Message - The Holiness Of God Paul Seger Isaiah 55:8-9 11/...

  • Duration:
    1h 25m 45s

Bob Seger- Turn the Page

Bob Seger- Turn the Page PLZ SUBRSCRIBE,that little yellow button by m...

  • Duration:
    5m 4s

Bob Seger & The Silver Bullet Band - Against ...

2019 Hideout Records & Distributors, Inc. Exclusively licensed by Hid...

  • Duration:
    5m 34s

God Uses Unlikely People - Paul Seger - 05/01...

God Uses Unlikely People Paul Seger 1 Corinthians 1:26-31 05/01/22.

  • Duration:
    1h 21m 19s

Missions Conference: Paul Seger

First time to watch the Morningside Live Stream? Let us know of your v...

  • Duration:
    1h 22m 8s

Facebook

Paul Seger Photo 2

Paul Seger

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Paul Seger Photo 3

Paul Seger

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Friends:
Ryan D. Frickel, Kevin Vrooman, Michael Kohle, Breton Shepherd, Sara Hart
Paul Seger Photo 4

Paul Seger

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Classmates

Paul Seger Photo 5

Paul Seger

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Schools:
West Holt High School Atkinson NE 2001-2005
Community:
Jana Seger, Micah Wentworth, Ashly Vogt, Brandy Daugherty, Chris Gentele, Jason Krysl, Meg Miller, Ashley Root, Raquel Embley, Kodey Kerkman, Gina Kilmurry, Neville Cole
Paul Seger Photo 6

Paul Seger

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Schools:
Saint Joseph School Atkinson NE 1952-1956
Community:
Gloria Hood, Patricia Schneider, Terry Greger, Francis Moore
Paul Seger Photo 7

Paul Seger

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Schools:
Atkinson Junior High School Atkinson NE 1997-1999
Community:
Suzan Seger, Nancy Griffin, Mechelle Poessnecker, Tabatha Laner, Rachel Christensen
Paul Seger Photo 8

Lutheran High School, Spr...

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Graduates:
Michelle Clyburn (1994-1995),
John Flanders (1980-1984),
Paul Seger (1979-1983),
Brian Kording (1980-1984),
Jaime Thomas (1995-1999)
Paul Seger Photo 9

West Holt High School, At...

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Graduates:
Jana Seger (1998-2002),
Paul Seger (2001-2005),
Colette Shane (1969-1973),
Stacey Kohle (1999-2003),
Brittany Osborne (2000-2004)
Paul Seger Photo 10

Atkinson Junior High Scho...

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Graduates:
Mechelle Poessnecker (2001-2003),
Paul Seger (1997-1999),
Nancy Griffin (1960-1962),
Suzan Seger (1975-1978)
Paul Seger Photo 11

Saint Joseph School, Atki...

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Graduates:
Terry Greger (1962-1966),
Paul Seger (1952-1956),
Patricia Schneider (1959-1963),
Gloria Pospisil (1966-1972)

Googleplus

Paul Seger Photo 12

Paul Seger

Paul Seger Photo 13

Paul Seger

Paul Seger Photo 14

Paul Seger

Myspace

Paul Seger Photo 15

Paul Seger

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Locality:
LAKE ALFRED, Florida
Birthday:
1925
Paul Seger Photo 16

JohnPaul (Johnpaul seger)...

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25 posts-14 authors-Last post:Mar 13MySpace profile for John-paul seger. Find friends, share photos, keep in touch with classmates, and meet new people on MySpace.

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