Paul J Whipple

US Patent:

7633307, Dec 15, 2009

Filed:

Dec 16, 2005

Appl. No.:

11/303234

Inventors:

Paul J. Whipple - Austin TX, US
Vincent V. Vu - Austin TX, US

Assignee:

Freescale Semiconductor, Inc. - Austin TX

International Classification:

G01R 31/02

US Classification:

324760

Abstract:

A method is provided for testing semiconductor devices. In accordance with the method, a first usage temperature Tis obtained which represents the maximum or minimum temperature to which a semiconductor device will be exposed during its first use by a customer. The semiconductor device is then tested for defects while ramping the temperature to which the device is exposed from a first temperature Tto the temperature T.

US Patent:

6433568, Aug 13, 2002

Filed:

Jun 8, 2000

Appl. No.:

09/588918

Inventors:

Paul James Whipple - Austin TX
Judy A. Lanoux - Austin TX
Jayme W. Richard - Austin TX
Vincent V. Vu - Pflugerville TX

Assignee:

Motorola, Inc. - Schaumburg IL

International Classification:

G01R 3102

US Classification:

324760, 3241581, 365201

Abstract:

A method of testing a plurality of integrated circuits each having a processing unit and an electrically programmable memory portion. The method includes providing a temperature cycling unit; inserting the plurality of integrated circuits in the temperature cycling unit; cycling the temperature in the temperature cycling unit through substantially room temperature, a first hot temperature, and a first cold temperature; performing a memory test protocol on the plurality of integrated circuits during the temperature cycling; removing the plurality of integrated circuits from the temperature cycling unit; providing an integrated circuit testing system which includes one or more testers; inserting a first relatively small number of the plurality of integrated circuits into one of the one or more testers; and performing a processor test protocol on the first relatively small number of integrated circuits at a temperature selected from substantially room temperature, a second hot temperature, and a second cold temperature.