Payal S Shah

US Patent:

20080114567, May 15, 2008

Filed:

Nov 5, 2007

Appl. No.:

11/982818

Inventors:

Daniel Jeske - Riverside CA, US
Pengyue Lin - Riverside CA, US
Robert Luck - Riverside CA, US
Arunava Chakravartty - Indianapolis IN, US
Payal Shah - Corona CA, US
Carlos Rendon - Riverside CA, US

International Classification:

G06F 17/18

US Classification:

702179000

Abstract:

A sequential sampling tool that executes advanced sequential protocols on a portable platform. The system includes a computer and software code compiled with well-known statistical and graphical user interface packages. The sampling and testing tool supports SPRT, 2-SPRT, and sequential Bayes sampling protocols for a variety of statistical distributions, including Bernoulli, binomial, Poisson, negative binomial, and normal distributions. The user has easy access to properties of the statistical design, such as average sample size curve, the operating characteristic curve, and the Type-1 and Type-2 error rates. The system also displays two boundary lines for the design, and allows the user to plot and visualize each observation point one-at-a-time as each sample unit is taken and counted.