Donald L. Chubb - Olmsted Falls OH Phillip Jenkins - Cleveland Heights OH
Assignee:
The United States of America as represented by the Admistrator of NASA - Washington DC
International Classification:
G01K 1100
US Classification:
374161, 374131
Abstract:
A rare earth optical temperature sensor is disclosed for measuring high temperatures. Optical temperature sensors exist that channel emissions from a sensor to a detector using a light pipe. The invention uses a rare earth emitter to transform the sensed thermal energy into a narrow band width optical signal that travels to a detector using a light pipe. An optical bandpass filter at the detector removes any noise signal outside of the band width of the signal from the emitter.
Ryne P. Raffaelle - Honeoye Falls NY, US Phillip Jenkins - Cleveland Heights OH, US David Wilt - Bay Village OH, US David Scheiman - Cleveland OH, US Donald Chubb - Olmsted Falls OH, US Stephanie Castro - Westlake OH, US
Assignee:
Rochester Institute of Technology - Rochester NY Glenn Research Center - Cleveland OH Ohio Aerospace Institute - Brook Park OH
International Classification:
H01M 14/00
US Classification:
429 5
Abstract:
An alpha voltaic battery includes at least one layer of a semiconductor material comprising at least one p/n junction, at least one absorption and conversion layer on the at least one layer of semiconductor layer, and at least one alpha particle emitter. The absorption and conversion layer prevents at least a portion of alpha particles from the alpha particle emitter from damaging the p/n junction in the layer of semiconductor material. The absorption and conversion layer also converts at least a portion of energy from the alpha particles into electron-hole pairs for collection by the one p/n junction in the layer of semiconductor material.
Ryne P. Raffaelle - Honeoye Falls NY, US Phillip Jenkins - Cleveland Heights OH, US David Wilt - Bay Village OH, US David Scheiman - Cleveland OH, US Donald Chubb - Olmsted Falls OH, US Stephanie Castro - Westlake OH, US
Assignee:
Rochester Institute of Technology - Rochester NY The United States of America as represented by the Administrator of National Aeronautics and Space Administration - Washington DC
International Classification:
H01M 14/00
US Classification:
429 5
Abstract:
An alpha voltaic battery includes at least one layer of a semiconductor material comprising at least one p/n junction, at least one absorption and conversion layer on the at least one layer of semiconductor layer, and at least one alpha particle emitter. The absorption and conversion layer prevents at least a portion of alpha particles from the alpha particle emitter from damaging the p/n junction in the layer of semiconductor material. The absorption and conversion layer also converts at least a portion of energy from the alpha particles into electron-hole pairs for collection by the one p/n junction in the layer of semiconductor material.
Ryne P. Raffaelle - Honeoye Falls NY, US Phillip Jenkins - Cleveland Heights OH, US David Wilt - Bay Village OH, US David Scheiman - Cleveland OH, US Donald Chubb - Olmsted Falls OH, US Stephanie Castro - Westlake OH, US
Assignee:
Rochester Institute of Technology - Rochester NY The United States of America as represented by the Administrator of the National Aeronautics and Space Administration - Washington DC
International Classification:
H01M 14/00
US Classification:
429 5
Abstract:
An alpha voltaic battery includes at least one layer of a semiconductor material comprising at least one p/n junction, at least one absorption and conversion layer on the at least one layer of semiconductor layer, and at least one alpha particle emitter. The absorption and conversion layer prevents at least a portion of alpha particles from the alpha particle emitter from damaging the p/n junction in the layer of semiconductor material. The absorption and conversion layer also converts at least a portion of energy from the alpha particles into electron-hole pairs for collection by the one p/n junction in the layer of semiconductor material.
Chemical Vapor Deposition From Single Organometallic Precursors
Andrew R. Barron - Cambridge MA Michael B. Power - Quincy MA Andrew N. MacInnes - Dorchester MA Aloysius F. Hepp - Bay Village OH Phillip P. Jenkins - Cleveland Heights OH
Assignee:
President and Fellows of Harvard College - Cambridge MA
International Classification:
C23C 1600
US Classification:
427249
Abstract:
A method is disclosed for forming a passivating/buffer film on a substrate. The method includes heating the substrate to a temperature which is sufficient to cause a volatilized organometallic precursor to pyrolyze and thereby form a passivating/buffer film on a substrate. The organometallic precursor is volatilized at a precursor source. A carrier gas is directed from a carrier gas source across the precursor source to conduct the volatilized precursor from the precursor source to the substrate. The volatilized precursor pyrolyzes and is deposited onto the substrate, thereby forming the passivating/buffer film on the substrate. The passivating/buffer film can be a cubic-phase passivating/buffer film. An oxide layer can also be formed on the passivating/buffer film to thereby form a composite of the substrate, the passivating/buffer film and the oxide layer. Cubic-phase passivating/buffer films formed by the method of the invention can be lattice-matched with the substrate.
Andrew R. Barron - Cambridge MA Phillip P. Jenkins - Cleveland Heights OH Andrew N. MacInnes - Quincy MA Aloysius F. Hepp - Bay Village OH
Assignee:
President and Fellows of Harvard College - Cambridge MA TriQuint Semiconductor, Inc. - Beaverton OR
International Classification:
H01L 2358 H01L 2978
US Classification:
257629
Abstract:
A majority carrier device includes a bulk active region and a thin-film passivating layer on the bulk active region. The thin-film passivating layer includes a Group 13 element and a chalcogenide component. In one embodiment, the majority carrier device is a metal, passivating layer, semiconductor, field-effect transistor. The transistor includes an active layer and thin-film passivating layer on the active layer. The thin-film passivating layer includes a Group 13 element and a chalcogenide component. Source and drain contacts are disposed on the active layer or the passivating layer. A gate contact is disposed on the passivating layer between the source contact and the drain contact.
Minority Carrier Device Comprising A Passivating Layer Including A Group 13 Element And A Chalcogenide Component
Andrew R. Barron - Cambridge MA Aloysius F. Hepp - Bay Village OH Phillip P. Jenkins - Cleveland Heights OH Andrew N. MacInnes - Quincy MA
Assignee:
President and Fellows of Harvard College - Cambridge MA TriQuint Semiconductor, Inc. - Hillsboro OR The United States of America as represented by the Administrator of the National Aeronautics and Space Administration - Washington DC
International Classification:
H01L 2358 H01L 2978
US Classification:
257629
Abstract:
A minority carrier device includes at least one junction of at least two dissimilar materials, at least one of which is a semiconductor, and a passivating layer on at least one surface of the device. The passivating layer includes a Group 13 element and a chalcogenide component. Embodiments of the minority carrier device include, for example, laser diodes, light emitting diodes, heterojunction bipolar transistors, and solar cells.
Optoelectronic And Photovoltaic Devices With Low-Reflectance Surfaces
Geoffrey A. Landis - Brook Park OH Phillip P. Jenkins - Cleveland Heights OH
Assignee:
Sverdrup Technology, Inc. - Tullohoma TN
International Classification:
H01L 310236 H01L 3118
US Classification:
136259
Abstract:
Low angle V-grooves are provided in the target surfaces of optoelectronic or photovoltaic devices such as solar cells and photodetectors. The low angle V-grooves increase the efficiency of the devices by promoting total internal reflection of light reflected from the target surface at the interface of the coverglass and the external environment.
Belcan Staffing Cincinnati, OH Oct 2009 to Oct 2013 Warehouse AssociateSodexho Veterans Memorial Columbus, OH Jul 2008 to Jul 2009 Cashier/Banquet SetupSodexho Veterans Memorial Columbus, OH Jul 2008 to May 2009 Food Service AssociateGulf South Gahanna, OH Nov 2007 to May 2008 Warehouse Associate
Education:
Columbus State Community College Columbus, OH Business ManagementNorthland High School Columbus, OH 1997
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