Ramesh Vaidhyanathan

age ~59

from Vienna, VA

Get Report

Also known as:

Connected to:

Ramesh Vaidhyanathan Phones & Addresses

Integrated Expert System For Identifying Abnormal Events In An Industrial Plant
view source
US Patent:

20110276165, Nov 10, 2011
Filed:

May 5, 2011
Appl. No.:

13/101497
Inventors:

Ramesh Vaidhyanathan - Vienna VA, US
Jeffrey Richter - Chantilly VA, US
Thomas F. O'Connor - Washington DC, US
Assignee:

EXXONMOBIL RESEARCH AND ENGINEERING COMPANY - Annandale NJ
International Classification:

G06F 19/00
US Classification:

700104
Abstract:

A computer-implemented integrated expert system for the identification of abnormal events in an industrial plant. The expert system integrates a model-based expert system with a rule-based expert system. The model-based expert system receives data on the operating conditions of a process unit in the industrial plant and calculates one or more results that determine whether the process unit is operating abnormally. The rule-based expert system also receives data on the operating conditions of the process unit and applies its rules to the process data. The rule-based expert system also applies its rules to the one or more results generated by the model-based expert system. The integrated system may also suppress any redundant messages generated by the model-based expert system.