Rebecca M Schultz

US Patent:

20160103197, Apr 14, 2016

Filed:

Oct 12, 2015

Appl. No.:

14/880589

Inventors:

John Weber Schultz - Alpharetta GA, US
Rebecca Schultz - Alpharetta GA, US
James Maloney - Marietta GA, US
Kathleen Maloney - Marietta GA, US

International Classification:

G01R 35/00
G01N 22/00

Abstract:

Various examples of methods and systems are disclosed for correction of phase and amplitude errors that occur in transmission lines connecting transmitter/receiver devices to measurement fixtures. In one example, a method is described that includes using time domain processing to determine a phase shift from the measurement fixture that can occur between calibration measurements and measurements of the specimen under test. In another example, a method is described that includes frequency-domain processing of the signals to obtain both phase and amplitude corrections. Including these phase and amplitude corrections in the calibration procedure can reduce or minimize the errors induced in the measurements when the transmission line(s) experience either temperature changes or physical deflections, among other things.

US Patent:

20150285621, Oct 8, 2015

Filed:

Apr 7, 2015

Appl. No.:

14/680477

Inventors:

John Weber Schultz - Alpharetta GA, US
Rebecca Brockway Schultz - Alpharetta GA, US
James Geoffrey Maloney - Marietta GA, US
Kathleen Cummings Maloney - Marietta GA, US

International Classification:

G01B 11/06

Abstract:

Various examples of methods and systems are disclosed for non-contact determination of coating thickness. In one example, among others, a method includes illuminating a surface having a layer of a coating material with electromagnetic (EM) energy transmitted at two or more frequencies, obtaining measured reflection data from reflected EM energy, and matching the measured reflection data to modeled reflection data of a reflection model based upon minimization of an error between the measured reflection data and the modeled reflection data to determine a measured thickness of the layer. In another example, a system includes a probe configured to illuminate an area of the surface including a layer of a coating material with EM energy and receive reflected EM energy, and a processing device configured to determine a measured thickness of the layer based upon minimization of an error between measured reflection data and modeled reflection data.

US Patent:

20140259639, Sep 18, 2014

Filed:

Jun 29, 2012

Appl. No.:

13/539066

Inventors:

Kathleen C. Maloney - Marietta GA, US
James G. Maloney - Marietta GA, US
Rebecca B. Schultz - Alpharetta GA, US
John W. Schultz - Alpharetta GA, US

International Classification:

H05K 9/00

US Classification:

296021

Abstract:

An electromagnetic chamber absorber provided improved absorption across a wideband and both lower diffuse and specular scatter and a method for constructing the same. An exemplary device can compromise a periodic arrangement of disconnected electromagnetically lossy elements where the periodicity of the lattice is adjusted to suppress all or most grating lobe scattering. Because the electromagnetically lossy elements are disconnected, scalable manufacturing approaches are enabled. The lossy elements can be easily fabricated via shaping, which includes rolling, folding and cutting resistive and/or magnetic sheet materials. The lossy elements can be repeatably placed in a periodic lattice using low density scaffolding approaches and/or other alignment mechanisms. The absorption at the lower frequency part of the electromagnetic bands (below 1-2 GHz) can be improved via the addition of parallel lossy sheets into the low-density scaffolding.