Richard Eugene Engel

US Patent:

8131529, Mar 6, 2012

Filed:

Sep 1, 2006

Appl. No.:

11/514717

Inventors:

Robert Spinner - East Northport NY, US
Eli Levi - Dix Hills NY, US
William Harold Leippe - Coram NY, US
Emery Korpi - Syosset NY, US
Michael Lai - Smithtown NY, US
James Kuveikis - Bohemia NY, US
Richard E. Chalmers - Northport NY, US
Richard Engel - Ridge NY, US
Peter F. Britch - Miller Place NY, US
William Biagiotti - St. James NY, US
David Howell - Smithfield VA, US

Assignee:

Advanced Testing Technologies Inc. - Hauppauge NY

International Classification:

G06F 9/44
G06F 13/10
G06F 13/12

US Classification:

703 20, 702121

Abstract:

Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i. e. , a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.

US Patent:

8269529, Sep 18, 2012

Filed:

Jul 13, 2011

Appl. No.:

13/182063

Inventors:

Shahen Minassian - Dix Hills NY, US
Eli Levi - Dix Hills NY, US
Richard Engel - Ridge NY, US

Assignee:

Advanced Testing Technologies, Inc. - Hauppauge NY

International Classification:

H03B 19/06
G06G 7/16

US Classification:

327113, 327105, 327356

Abstract:

Very low phase noise radio frequency (RF) source having multiple discrete frequency outputs used, for example, to calibrate phase noise measurement systems. The calibrator output frequencies can be tailored for a particular application using a scalable architecture.

US Patent:

8359504, Jan 22, 2013

Filed:

May 18, 2010

Appl. No.:

12/781888

Inventors:

Marc Pogosky - North Babylon NY, US
Richard Engel - Ridge NY, US
Eli Levi - Dix Hills NY, US

Assignee:

Advanced Testing Technologies, Inc. - Hauppauge NY

International Classification:

G01R 31/28

US Classification:

714731

Abstract:

A digital functional test system incorporating both digital stimulus and digital response/compare capability for digital electronic circuitry. The system includes a chassis and a single width VME eXtensions for Instrumentation (VXI) module arranged in or on the chassis. The single width VXI module includes a timing sub-module that generates a stimulus clock signal and a response clock signal, eight pattern sub-modules, and a master oscillator sub-module that provides a clock signal. Each pattern sub-module receives the stimulus and response clock signals, and the clock signal from the master oscillator sub-module, and includes a pattern generating module, a stimulus memory component that stores stimulus data outgoing from the pattern generating module, a response memory component that records response data incoming to the pattern generating module, and a compare reference memory component that provides a reference for a compare function of the recorded response data in the response memory component.

US Patent:

8489381, Jul 16, 2013

Filed:

Mar 5, 2012

Appl. No.:

13/411697

Inventors:

Robert Spinner - East Northport NY, US
Eli Levi - Dix Hills NY, US
William Harold Leippe - Coram NY, US
Emery Korpi - Syosset NY, US
Michael Lai - Smithtown NY, US
James Kuveikis - Bohemia NY, US
Richard E. Chalmers - Northport NY, US
Richard Engel - Ridge NY, US
Peter F. Britch - Miller Place NY, US
William Biagiotti - St. James NY, US
David Howell - Smithfield VA, US

Assignee:

Advanced Testing Technologies, Inc. - Hauppauge NY

International Classification:

G06F 9/44
G06F 13/10
G06F 13/12

US Classification:

703 20, 702121

Abstract:

Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i. e. , a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.