Kevin A. Batson - Williston VT Robert E. Busch - Essex Junction VT Garrett S. Koch - Jeffersonville VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1500
US Classification:
365 49, 365149
Abstract:
A Dynamic Content Addressable Memory (DCAM) cell topology that contains fewer that can perform a âhiddenâ refresh of stored data that does not delay nor interrupt the CAM search cycle, thereby providing SCAM-like performance. A non-destructive read operation, is performed such that the stored-data does not have to be written back because of a refresh-read operation. A reliable CAM search can be performed after a read operation and before or even while the refresh-data is being written back. Soft-error detection processes can be performed on each CAM entry during the pendency of the refresh cycle. The DCAM cell can be used in a digital system such as a digital computer and a Network Router.
System And Method For Conserving Power In A Content Addressable Memory By Providing An Independent Search Line Voltage
Robert E. Busch - Essex Junction VT Kevin A. Batson - Williston VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1500
US Classification:
365 49, 36518907
Abstract:
A system and method is disclosed for operating a content addressable memory (CAM) within an integrated circuit using search signals at search input voltages which are substantially independent from an operating voltage of the CAM. A method is disclosed in which search signals are input to CAM cells of the CAM at search input voltages which are substantially independent of an operating voltage of storage elements within the CAM cells. A match signal is output upon detecting a matching condition between the search signals and data stored in the storage elements. The search input voltage can be within about 0. 2V above a threshold voltage of a search input device of the CAM memory cell. Search input devices can be selected to have a lower threshold voltage than other devices included within the CAM cell.
Use Of Search Lines As Global Bitlines In A Cam Design
Jonathan B. Ashbrook - Huntington VT Robert E. Busch - Essex Junction VT Albert M. Chu - Essex Junction VT Daryl M. Seitzer - Richmond VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1500
US Classification:
365 49
Abstract:
A method and structure for a content addressable memory (CAM) array having a plurality of memory cells. Each of the memory cells has capacitive storage devices, transistors connected to the storage devices, a wordline connected to and controlling the transistors, bitlines connected to the storage devices through the transistors, combined search and global bitlines connected to the capacitive storage devices. These cells are further arranged into columns, each containing multiplexers connected to the combined search and global bitlines, data-in lines connected to the multiplexers, and search-data lines connected to the multiplexers. Further, the multiplexers select between the data-in lines and the search-data lines to allow the combined search and global bitlines to be alternatively used as data lines and search lines. Also, in the invention each of the columns further has drivers between the multiplexers and the combined search and global bitlines. The drivers drive signals between the multiplexers and the combined search and global bitlines during search and write operations.
Alternating Reference Wordline Scheme For Fast Dram
Harold Pilo - Underhill VT Robert E. Busch - Essex Junction VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1124
US Classification:
365149, 365190
Abstract:
A fast DRAM memory uses ground-sensing as opposed to traditional Vdd/2 sensing. A selected DRAM cell connects to a bit-line true (BLT) or a bit-line complement (BLC). At the start of each cycle the BLT and BLC are restored to ground potential. A pair of alternating reference cells are provided for each bit-line. When a selected DRAM cell is connected either BLT or BLC the first reference cell in the pair is connected to the other bitline to provide a reference voltage to the other bitline which can be compared to the voltage provided by the selected DRAM cell. On a subsequent cycle using the same bitline the second reference cell in the pair is used. Thus it is not necessary to wait for the first reference cell to recharge prior to beginning the next cycle. Switching between the first and second reference cells in the pair alternates in this manner resulting in faster cycle time. The write-back of the reference cells can be hidden since an alternate cell is available for next cycles reference bitline generation.
High Reliability Content-Addressable Memory Using Shadow Content-Addressable Memory
Kevin A. Batson - Williston VT Geordie M. Braceras - Essex Junction VT Robert E. Busch - Essex Junction VT Gary S. Koch - Jeffersonville VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1500
US Classification:
365 49
Abstract:
A high-reliability content-addressable memory using a shadow content-addressable memory (CAM) array in parallel with a primary CAM array to increase the reliability of CAM searches. The reliability of CAM searches has been less than desired because of random environmental influences that corrupt data. The shadow CAM is written, read, and searched in parallel with the primary CAM. The search results from the parallel searches are compared and, if identical, are declared valid. If the search results are not equal, corrective action is initiated. The high-reliability content-addressable memory may be used with or without priority encoders.
High Reliability Content-Addressable Memory Using Shadow Content-Addressable Memory
Kevin A. Batson - Williston VT Geordie M Braceras - Essex Junction VT Robert E. Busch - Essex Junction VT Gary S. Koch - Jeffersonville VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1500
US Classification:
365 49, 365154
Abstract:
A high-reliability content addressable memory using a shadow content-addressable memory (CAM) array in parallel with a primary CAM array to increase the reliability of CAM searches. The reliability of CAM searches has been less than desired because of random environmental influences that corrupt data. The shadow CAM is written, read, and searched in parallel with the primary CAM. The search results from the parallel searches are compared and, if identical, are declared valid. If the search results are not equal, corrective action is initiated. The high-reliability content-addressable memory may be used with or without priority encoders.
Redundant Array Architecture For Word Replacement In Cam
Kevin A. Batson - Williston VT Robert E. Busch - Essex Junction VT Gary S. Koch - Jeffersonville CT Fred J. Towler - Essex Junction VT Reid A. Wistort - Westford VT
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1502
US Classification:
365 49, 365200
Abstract:
The present invention provides a memory architecture that allows memory checking and replacement of defective words by spare elements already provided on the chip that do not increase the chip size. The method of the invention uses a separate redundant array architecture to provide address translation, so that the redundant entries are represented as the correct entry index that they are replacing.
Robert E. Busch - Essex Junction VT Albert M. Chu - Essex Junction VT Ezra D. B. Hall - Richmond VT Paul C. Parries - Wapingers Falls NY
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 1500
US Classification:
365 49, 36518907, 365 63
Abstract:
A method and structure for an array of content addressable memory (CAM) cells is disclosed. Each of the CAM cells has a search line and a bitline parallel to the search line. Across the array, search lines and bit lines of the CAM cells are interdigitated so that the search lines and bitlines alternate across the array. CAM cell macros are inverted with respect to adjacent macros to balance parasitic capacitances across the array.
The Endocrine GroupAlbany Medical Center Community Division/The Endocrine Group 1365 Washington Ave STE 300, Albany, NY 12206 (518)4894704 (phone), (518)4890512 (fax)
Education:
Medical School University of Pennsylvania School of Medicine Graduated: 1978
Dr. Busch graduated from the University of Pennsylvania School of Medicine in 1978. He works in Albany, NY and specializes in Endocrinology, Diabetes & Metabolism and Diabetes. Dr. Busch is affiliated with Albany Medical Center and Albany Memorial Hospital.
Urology Medical 4601 W Us Hwy 90, Lake City, FL 32055 (386)7524189 (phone), (386)7524213 (fax)
Education:
Medical School UMDNJ School of Osteopathic Medicine Graduated: 1987
Procedures:
Circumcision Cystoscopy Cystourethroscopy Kidney Stone Lithotripsy Prostate Biopsy Transurethral Resection of Prostate Hernia Repair Urinary Flow Tests Vaginal Repair Vasectomy
Conditions:
Abdominal Hernia Appendicitis Benign Prostatic Hypertrophy Bladder Cancer Breast Disorders
Languages:
English
Description:
Dr. Busch graduated from the UMDNJ School of Osteopathic Medicine in 1987. He works in Lake City, FL and specializes in General Surgery and Urology. Dr. Busch is affiliated with Lake City Medical Center, Shands Live Oak Regional Medical Center and Shands Starke Regional Medical Center.
Alamo Maxillofacial Surgical Associates PA 4499 Medical Dr STE 190, San Antonio, TX 78229 (210)6143915 (phone), (210)6143918 (fax)
Education:
Medical School University of Texas Southwestern Medical Center at Dallas Graduated: 2007
Conditions:
Gingival and Periodontal Diseases Tempromandibular Joint Disorders (TMJ)
Languages:
English Spanish
Description:
Dr. Busch graduated from the University of Texas Southwestern Medical Center at Dallas in 2007. He works in San Antonio, TX and specializes in Oral & Maxillofacial Surgery. Dr. Busch is affiliated with Methodist Hospital.
Lehigh University 1978 - 1982
BS, Electrical Engineering
Ridge High School 1974 - 1978
Skills:
Unix Semiconductors Perl Program Management Go To Market Strategy Asic Testing Embedded Systems Soc Linux Ic Software Development Product Management Integration