Owen Hugh Roberts - Landisville PA Peter Michael Ritt - East Petersburg PA Peter David Southgate - Monmouth Jcn NJ Robert Anthony Duschl - Lititz PA
Assignee:
Thomson Consumer Electronics, Inc. - Indianapolis IN
International Classification:
G03B 2900 H04N 718 G01B 1102
US Classification:
396546
Abstract:
In accordance with the present invention, a method for manufacturing a color CRT (10) having a faceplate panel (12) is disclosed. The method includes the steps of forming a photoreceptor (36) on an interior surface of a viewing faceplate (17); establishing a substantially uniform electrostatic charge on the photoreceptor (36); and exposing selected areas of the photoreceptor (36) to visible light to form a latent charge image. The process further includes the steps of developing the latent charge image on the photoreceptor (36) by depositing (212, 213, 214) thereon charged phosphor particles; monitoring the width (218) of the deposition of the charged phosphor particles; and terminating the deposition (226, 227, 228) of the charged phosphor particles when predetermined process parameters (222, 224) are satisfied. A phosphor deposition monitor (PDM) apparatus (90) for monitoring the deposition of the charged phosphor particles on the latent charge image, formed on the photoreceptor (36), also is described. The PDM apparatus (90) includes monitoring means (96, 99, 123) external to the viewing faceplate (17) for measuring the width (218) of the deposition of the charged phosphor particles.
Method For Detecting Blemishes Near The Perimeter Of A Ccd Image
Edward Cohen - Lancaster PA Clarence M. Weaver - Reamstown PA Robert A. Duschl - Lancaster PA
Assignee:
RCA Corporation - Princeton NJ
International Classification:
H04N 718
US Classification:
358106
Abstract:
In a method of detecting blemishes in the proximity of the perimeter of a CCD image, pairs of adjacent pixels in the proximity of the perimeter are sequentially considered. For each pair of adjacent pixels, a plurality of pixels, in a blemish detection pixel pattern extending toward the center of the image are considered. The sum of the four outer pixels in the pixel pattern are compared to the sum of the inner pixels and the variance is compared to selected minimum and maximum differences. When the variance is outside either the minimum or the maximum differences a blemish has been detected. When the difference is within the two differences no blemish has been found. The blemish pattern is moved one pixel toward the center of the image and the process repeated. The difference comparison is repeated for a selected plurality of times and if desired the differences can be changed for some of the comparisons.
Charge Coupled Device Based Blemish Detection System And Method
A system for detecting blemishes on an illuminted object, such as the screen of a kinescope, includes a charge coupled device (CCD). The signal from each CCD pixel is compared with the average of the signals of all pixels immediately adjacent to the pixel being investigated to provide a difference signal. The difference signal is compared to a threshold level and a blemish signal generated when the difference signal exceeds the threshold.
Method And Subsystem For Plotting The Perimeter Of An Object
The perimeter of an object is detected using a CCD. When a pixel is dark a right detection turn is taken and when a pixel is light a left detection turn is taken. When a transition from light to dark or from dark to light occurs the address of the light pixel is recorded to identify the light pixel as a perimeter pixel.
Charge Coupled Device Based System And Method For Inspecting And Modifying Images
A system for inspecting images projected onto a charge coupled device (CCD) compares the image cast onto the CCD by an object to be inspected with an optimum reference image to identify and locate faults in the object being inspected, or to modify the image to match the reference.
Method And Apparatus For Determining Thickness Of An Opc Layer On A Crt Faceplate Panel
George M. Ehemann - Lancaster PA Edward R. Garrity - Lancaster PA Robert A. Duschl - Lititz PA Istvan Gorog - Lancaster PA
Assignee:
Thomson Consumer Electronics, Inc. - Indianapolis IN
International Classification:
G01B 1106
US Classification:
356382
Abstract:
The invention relates to a method for determining the thickness of an OPC layer 24 that is strongly absorptive to light at a first wavelength and substantially transmissive to light at a second wavelength. According to the method, the OPC layer is illuminated with light from an array 34 of fluorescent lamps 36 and the light transmitted through the layer is incident on a first filter 42 that is transmissive to light of the first wavelength. A first light intensity pattern transmitted through the first filter is sensed and stored in a first memory frame. Then OPC layer is illuminated again with light and the light transmitted through the layer is incident on a second filter 44 transmissive to light of the second wavelength. A second light intensity pattern transmitted through the second filter is sensed and stored in a second memory frame. The ratio of the first light intensity pattern and the second light intensity pattern is determined and utilized to calculate the thickness of the layer.
Charge Coupled Device Based Inspection System And Method
An inspection system utilizing a CCD includes a CCD data transfer generator which allows the changing of the CCD without redesigning the system. The numbers of horizontal rows and vertical columns of pixels of the CCD are set into a digital memory and into a waveform generator. The waveform generator provides horizontal scanning and vertical scanning waveforms in accordance with the row and column settings whereby the CCD can be replaced with a different size CCD and new numbers set into the memory and waveform generator.
Electron Beam Intensity Profile Measuring System And Method
A system for measuring the intensity profiles of the electron beams of color kinescopes includes a camera having a CCD. A color field is placed on the kinescope screen and a pixel in the center of one of the colored stripes is selected. The color field is turned off and the beam is scanned in short lines in one direction and incrementally stepped across the selected pixel in the perpendicular direction. The charge level on the selected pixel is representative of the beam intensity and is recorded. The entire beam is stepped across the pixel to measure the intensity profile in one direction. The directions of scanning and stepping are then interchanged to measure the beam intensity profile in the normal direction. The process is then repeated for the other electron beams in the kinescope.
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