- Charlotte NC, US Moin SHAFAI - Plano TX, US Chen FENG - Mount Laurel NJ, US Jennifer BURNETT - Houston TX, US Giorgio Carlo ISELLA - Torrance CA, US Robert Timothy KESTER - Friendswood TX, US Benjamin P. HEPPNER - Fridley MN, US James A. LOPAC - Roseville MN, US Lisa M. LUST - Plymouth MN, US Mary Katherine SALIT - Plymouth MN, US Matthew Wade PUCKETT - Phoenix AZ, US William MCGRAW - Flower Mound TX, US
International Classification:
G01N 21/45 G02B 6/42
Abstract:
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.