Robert G Walsh

US Patent:

6636301, Oct 21, 2003

Filed:

Aug 10, 2000

Appl. No.:

09/636129

Inventors:

Damon F. Kvamme - San Jose CA
Robert W. Walsh - Cupertino CA

Assignee:

KLA-Tencor Corporation - San Jose CA

International Classification:

G01N 2100

US Classification:

3562372, 3562375

Abstract:

Disclosed is an optical inspection system for inspecting the surface of a substrate. The inspection system includes a light source for emitting a light beam along an optical axis and a first set of optical elements arranged for separating the light beam into a plurality of light beams, directing the plurality of light beams to intersection with the surface of the substrate, and focusing the plurality of light beams to a plurality of scanning spots on the surface of the substrate. The inspection system also includes a second set of optical elements adapted for collecting a plurality of transmitted light beams caused by the intersection of the plurality of light beams with the surface of the substrate and a light detector arrangement including individual light detectors that each receive individual ones of the plurality of transmitted light beams. The light detectors are arranged for sensing the light intensity of the transmitted light beams.

US Patent:

6879390, Apr 12, 2005

Filed:

Aug 10, 2000

Appl. No.:

09/636124

Inventors:

Damon F. Kvamme - San Jose CA, US
Robert W. Walsh - Cupertino CA, US

Assignee:

KLA-Tencor Technologies Corporation - Milpitas CA

International Classification:

G01N021/00

US Classification:

3562372, 3562375

Abstract:

Disclosed in an optical inspection system for inspecting the surface of a substrate. The optical inspection system includes a light source for emitting an incident light beam along an optical axis and a first set of optical elements arranged for separating the incident light beam into a plurality of light beams, directing the plurality of light beams to intersect with the surface of the substrate, and focusing the plurality of light beams to a plurality of scanning spots on the surface of the substrate. The inspection system further includes a light detector arrangement including individual light detectors that correspond to individual ones of a plurality of reflected or transmitted light beams caused by the intersection of the plurality of light beams with the surface of the substrate. The light detectors are arranged for sensing the light intensity of either the reflected or transmitted light.

US Patent:

7035780, Apr 25, 2006

Filed:

Dec 21, 2001

Appl. No.:

10/027876

Inventors:

Kristian Miller - Palo Alto CA, US
Joseph Ferguson - Palo Alto CA, US
Robert Walsh - Palo Alto CA, US
Olivia Wu - Palo Alto CA, US

Assignee:

Sun Microsystems, Inc. - Santa Clara CA

International Classification:

G06F 17/50

US Classification:

703 13, 701 18

Abstract:

A method for routing conductors in an integrated circuit design is disclosed, including the steps of determining the number of sensitive conductors requiring placement into quiet track locations, wherein a quiet track location is defined as any track location immediately adjacent to a stable conductor, determining the number of quiet track locations available in said integrated circuit design, and routing one or more sensitive conductors into one or more quiet track locations.

US Patent:

7075638, Jul 11, 2006

Filed:

Mar 8, 2005

Appl. No.:

11/075634

Inventors:

Damon F. Kvamme - San Jose CA, US
Robert W. Walsh - Cupertino CA, US

Assignee:

KLA-Tenor Technologies Corporation - Milpitas CA

International Classification:

G01N 21/00

US Classification:

3562372, 3562375

Abstract:

Disclosed is an optical inspection system for inspecting the surface of a substrate. The optical inspection system includes a light source for emitting an incident light beam along an optical axis and a first set of optical elements arranged for separating the incident light beam into a plurality of light beams, directing the plurality of light beams to intersect with the surface of the substrate, and focusing the plurality of light beams to a plurality of scanning spots on the surface of the substrate. The inspection system further includes a light detector arrangement including individual light detectors that correspond to individual ones of a plurality of reflected or transmitted light beams caused by the intersection of the plurality of light beams with the surface of the substrate. The light detectors are arranged for sensing the light intensity of either the reflected or transmitted light.

US Patent:

7143025, Nov 28, 2006

Filed:

Dec 13, 2002

Appl. No.:

10/319062

Inventors:

Robert E. Walsh - Foster City CA, US
Michael P. Shea - Nashua NH, US

Assignee:

Sun Microsystems, Inc. - Santa Clara CA

International Classification:

G06F 9/44
G06F 13/10
G06F 13/12

US Classification:

703 21

Abstract:

A simulator running on a single computer may be configured to appear as one or more users simultaneously initiating Internet requests from separate user environments using a plurality of different authentication methods. An engine of the simulator may communicate with a browser to appear as one or more users each having access to a local defined user account and initiating Internet requests using the plurality of different authentication methods. The simulator may be configured to maintain different user profile data for each user appearing to operate within a separate user environment. The simulator may be configured to appear as one or more separate users initiating Internet requests using a plurality of different authentication methods from multiple, different user environments.

US Patent:

7231410, Jun 12, 2007

Filed:

Mar 10, 2004

Appl. No.:

10/797977

Inventors:

Robert Walsh - Sunnyvale CA, US
Bryan O'Sullivan - Burlingame CA, US

Assignee:

Qlogic, Corporation - Aliso Viejo CA

International Classification:

G06F 17/30

US Classification:

707203, 707200

Abstract:

A repository manager facilitates robust revision control of components of a large scale system. The repository manager stores system components under revision control in a repository, according to internal names. The repository manager also stores binding information between internal names of system components and associated external names, as well as component attribute information. The repository manager provides users with working areas, from which they are able to access system components according to their external names, via the repository manager. As users perform operations affecting system components, the repository manager keeps track of the performed operations. Responsive to a user committing a set of changes, the repository manager updates the master repository according to the performed operations, associates a new version number with the resulting state of the repository and synchronizes the user's working area with the updated repository.

US Patent:

7352457, Apr 1, 2008

Filed:

May 23, 2006

Appl. No.:

11/439621

Inventors:

Damon F. Kvamme - San Jose CA, US
Robert W. Walsh - Cupertino CA, US

Assignee:

KLA-Tencor Corporation - San Jose CA

International Classification:

G01N 21/00

US Classification:

3562372, 3562375

Abstract:

Disclosed is an optical inspection system for inspecting the surface of a substrate. The optical inspection system includes a light source for emitting an incident light beam along an optical axis and a first set of optical elements arranged for separating the incident light beam into a plurality of light beams, directing the plurality of light beams to intersect with the surface of the substrate, and focusing the plurality of light beams to a plurality of scanning spots on the surface of the substrate. The inspection system further includes a light detector arrangement including individual light detectors that correspond to individual ones of a plurality of reflected or transmitted light beams caused by the intersection of the plurality of light beams with the surface of the substrate. The light detectors are arranged for sensing the light intensity of either the reflected or transmitted light.

US Patent:

7486393, Feb 3, 2009

Filed:

Jul 30, 2007

Appl. No.:

11/830790

Inventors:

Damon F. Kvamme - San Jose CA, US
Robert W. Walsh - Cupertino CA, US

Assignee:

KLA-Tencor - San Jose CA

International Classification:

G01N 21/00

US Classification:

3562372, 3562375

Abstract:

Disclosed is an optical inspection system for inspecting the surface of a substrate. The optical inspection system includes a light source for emitting an incident light beam along an optical axis and a first set of optical elements arranged for separating the incident light beam into a plurality of light beams, directing the plurality of light beams to intersect with the surface of the substrate, and focusing the plurality of light beams to a plurality of scanning spots on the surface of the substrate. The inspection system further includes a light detector arrangement including individual light detectors that correspond to individual ones of a plurality of reflected or transmitted light beams caused by the intersection of the plurality of light beams with the surface of the substrate. The light detectors are arranged for sensing the light intensity of either the reflected or transmitted light.

Address:

20739 S 4076, Claremore, OK 74019

Phone:

(918)7705529

VIN:

2GNALDEK2C1204635

Make:

CHEVROLET

Model:

EQUINOX

Year:

2012