Robert E Werner

US Patent:

7437813, Oct 21, 2008

Filed:

Feb 7, 2007

Appl. No.:

11/704016

Inventors:

Bahadir Tunaboylu - Chandler AZ, US
John McGlory - Chandler AZ, US
Horst Clauberg - Warminster PA, US
Bruce Griffing - North Wales PA, US
Robert E. Werner - Chalfont PA, US
Edward T. Laurent - Ambler PA, US
Edward L. Malantonio - Conshohocken PA, US
Alan Slopey - Warrington PA, US
Paul Bereznycky - Medford NJ, US

Assignee:

SV Probe Pte Ltd. - Singapore

International Classification:

B23P 6/00
H05K 3/02
G01R 31/02

US Classification:

2940213, 2940201, 2940203, 2940206, 2940208, 29846, 29847, 324754

Abstract:

A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.